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    Process for single and multiple level metal-insulator-metal integration with a single mask
    1.
    发明授权
    Process for single and multiple level metal-insulator-metal integration with a single mask 有权
    单层和多层金属绝缘体金属与单一掩模集成的工艺

    公开(公告)号：US08435864B2

    公开(公告)日：2013-05-07

    申请号：US13432440

    申请日：2012-03-28

    申请人： Anil K. Chinthakindi ,  Douglas D. Coolbaugh ,  Keith E. Downes ,  Ebenezer E. Eshun ,  Zhong-Xiang He ,  Robert M. Rassel ,  Anthony K. Stamper

    发明人： Anil K. Chinthakindi ,  Douglas D. Coolbaugh ,  Keith E. Downes ,  Ebenezer E. Eshun ,  Zhong-Xiang He ,  Robert M. Rassel ,  Anthony K. Stamper

    IPC分类号： H01L21/28

    CPC分类号： H01L21/32139 ,  H01L21/32136 ,  H01L28/75

    摘要： A method of fabricating a MIM capacitor is provided. The method includes providing a substrate including a dielectric layer formed on a first conductive layer and a second conductive layer formed over the dielectric layer, and patterning a mask on the second conductive layer. Exposed portions of the second conductive layer are removed to form an upper plate of a MIM capacitor having edges substantially aligned with respective edges of the mask. The upper plate is undercut so that edges of the upper plate are located under the mask. Exposed portions of the dielectric layer and the first conductive layer are removed using the mask to form a capacitor dielectric layer and a lower plate of the MIM capacitor having edges substantially aligned with respective edges of the mask.

    摘要翻译： 提供一种制造MIM电容器的方法。 该方法包括提供包括形成在第一导电层上的电介质层和形成在电介质层上的第二导电层的衬底，以及在第二导电层上构图掩模。 去除第二导电层的暴露部分以形成具有与掩模的相应边缘基本对齐的边缘的MIM电容器的上板。 上板被切下，使得上板的边缘位于掩模下方。 使用掩模去除电介质层和第一导电层的暴露部分，以形成MIM电容器的电容器电介质层和具有基本上与掩模的各个边缘对准的边缘的MIM电容器的下板。

    INTERCONNECT STRUCTURES AND DESIGN STRUCTURES FOR A RADIOFREQUENCY INTEGRATED CIRCUIT
    2.
    发明申请
    INTERCONNECT STRUCTURES AND DESIGN STRUCTURES FOR A RADIOFREQUENCY INTEGRATED CIRCUIT 有权
    无线电集成电路的互连结构和设计结构

    公开(公告)号：US20120292741A1

    公开(公告)日：2012-11-22

    申请号：US13560446

    申请日：2012-07-27

    申请人： Timothy Dalton ,  Ebenezer E. Eshun ,  Sarah L. Grunow ,  Zhong-Xiang He ,  Anthony K. Stamper

    发明人： Timothy Dalton ,  Ebenezer E. Eshun ,  Sarah L. Grunow ,  Zhong-Xiang He ,  Anthony K. Stamper

    IPC分类号： H01L23/522 ,  G06F17/50

    CPC分类号： H01L21/76885 ,  H01L21/76816 ,  H01L21/76832 ,  H01L21/76834 ,  H01L27/016 ,  H01L28/20 ,  H01L28/40

    摘要： Interconnect structures that include a passive element, such as a thin film resistor or a metal-insulator-metal (MIM) capacitor, methods for fabricating an interconnect structure that includes a passive element, and design structures embodied in a machine readable medium for designing, manufacturing, or testing an integrated circuit, such as a radiofrequency integrated circuit. A top surface of a dielectric layer is recessed relative to a top surface of a conductive feature in the dielectric layer. The passive element is formed on the recessed top surface of the dielectric layer and includes a layer of a conductive material that is coplanar with, or below, the top surface of the conductive feature.

    摘要翻译： 包括诸如薄膜电阻器或金属 - 绝缘体 - 金属（MIM）电容器的无源元件的互连结构，用于制造包括无源元件的互连结构的方法，以及体现在机器可读介质中的设计结构，用于设计， 制造或测试诸如射频集成电路的集成电路。 电介质层的顶表面相对于电介质层中导电特征的顶表面凹陷。 无源元件形成在介电层的凹入的顶表面上，并且包括与导电特征的顶表面共面或低于导电特征的顶表面的导电材料层。

    METHODS OF FABRICATING PASSIVE ELEMENT WITHOUT PLANARIZING AND RELATED SEMICONDUCTOR DEVICE
    3.
    发明申请
    METHODS OF FABRICATING PASSIVE ELEMENT WITHOUT PLANARIZING AND RELATED SEMICONDUCTOR DEVICE 有权
    无平面化和相关半导体器件制造被动元件的方法

    公开(公告)号：US20120133022A1

    公开(公告)日：2012-05-31

    申请号：US13359634

    申请日：2012-01-27

    申请人： Anil K. Chinthakindi ,  Timothy J. Dalton ,  Ebenezer E. Eshun ,  Jeffrey P. Gambino ,  Anthony K. Stamper ,  Kunal Vaed

    发明人： Anil K. Chinthakindi ,  Timothy J. Dalton ,  Ebenezer E. Eshun ,  Jeffrey P. Gambino ,  Anthony K. Stamper ,  Kunal Vaed

    IPC分类号： H01L29/92 ,  H01L29/8605

    CPC分类号： H01L21/76819 ,  H01L23/522 ,  H01L28/40 ,  H01L2924/0002 ,  H01L2924/00

    摘要： Methods of fabricating a passive element and a semiconductor device including the passive element are disclosed including the use of a dummy passive element. A dummy passive element is a passive element or wire which is added to the chip layout to aid in planarization but is not used in the active circuit. One embodiment of the method includes forming the passive element and a dummy passive element adjacent to the passive element; forming a dielectric layer over the passive element and the dummy passive element, wherein the dielectric layer is substantially planar between the passive element and the dummy passive element; and forming in the dielectric layer an interconnect to the passive element through the dielectric layer and a dummy interconnect portion overlapping at least a portion of the dummy passive element. The methods eliminate the need for planarizing.

    摘要翻译： 公开了制造无源元件的方法和包括无源元件的半导体器件，其包括使用虚拟无源元件。 虚拟无源元件是被添加到芯片布局以帮助平坦化但在有源电路中不使用的无源元件或线。 该方法的一个实施例包括形成无源元件和邻近无源元件的虚拟无源元件; 在无源元件和虚拟无源元件上形成电介质层，其中介电层在无源元件和虚拟无源元件之间基本上是平面的; 并且在电介质层中形成通过电介质层与无源元件的互连以及与虚拟无源元件的至少一部分重叠的虚拟互连部分。 该方法消除了平面化的需要。

    Method of forming bipolar transistor integrated with metal gate CMOS devices
    5.
    发明授权
    Method of forming bipolar transistor integrated with metal gate CMOS devices 失效
    与金属栅极CMOS器件集成的双极晶体管的形成方法

    公开(公告)号：US08129234B2

    公开(公告)日：2012-03-06

    申请号：US12556205

    申请日：2009-09-09

    申请人： Thomas A. Wallner ,  Ebenezer E. Eshun ,  Daniel J. Jaeger ,  Phung T. Nguyen

    发明人： Thomas A. Wallner ,  Ebenezer E. Eshun ,  Daniel J. Jaeger ,  Phung T. Nguyen

    IPC分类号： H01L21/8249

    CPC分类号： H01L21/8249 ,  H01L27/0623

    摘要： A high-k gate dielectric layer and a metal gate layer are formed and patterned to expose semiconductor surfaces in a bipolar junction transistor region, while covering a CMOS region. A disposable material portion is formed on a portion of the exposed semiconductor surfaces in the bipolar junction transistor area. A semiconductor layer and a dielectric layer are deposited and patterned to form gate stacks including a semiconductor portion and a dielectric gate cap in the CMOS region and a cavity containing mesa over the disposable material portion in the bipolar junction transistor region. The disposable material portion is selectively removed and a base layer including an epitaxial portion and a polycrystalline portion fills the cavity formed by removal of the disposable material portion. The emitter formed by selective epitaxy fills the cavity in the mesa.

    摘要翻译： 形成高k栅极电介质层和金属栅极层，并图案化以暴露双极结型晶体管区域中的半导体表面，同时覆盖CMOS区域。 一次性材料部分形成在双极结型晶体管区域中暴露的半导体表面的一部分上。 沉积半导体层和电介质层，以形成包括CMOS区域中的半导体部分和介电栅极盖的栅极堆叠，以及在双极结型晶体管区域中的一次性材料部分上的包含台面的空腔。 选择性地去除一次性材料部分，并且包括外延部分和多晶部分的基层填充通过去除一次性材料部分而形成的空腔。 通过选择性外延形成的发射体填充台面中的空腔。

    Integrated BEOL thin film resistor
    7.
    发明授权
    Integrated BEOL thin film resistor 有权
    集成BEOL薄膜电阻

    公开(公告)号：US08093679B2

    公开(公告)日：2012-01-10

    申请号：US13023579

    申请日：2011-02-09

    申请人： Anil K. Chinthakindi ,  Douglas D. Coolbaugh ,  John M. Cotte ,  Ebenezer E. Eshun ,  Zhong-Xiang He ,  Anthony K. Stamper ,  Eric J. White

    发明人： Anil K. Chinthakindi ,  Douglas D. Coolbaugh ,  John M. Cotte ,  Ebenezer E. Eshun ,  Zhong-Xiang He ,  Anthony K. Stamper ,  Eric J. White

    IPC分类号： H01L29/00 ,  H01L27/10 ,  H01L29/74 ,  H01L23/48 ,  H01L23/52 ,  H01L29/40

    CPC分类号： H01L23/5228 ,  H01L2924/0002 ,  H01L2924/00

    摘要： In the course of forming a resistor in the back end of an integrated circuit, an intermediate dielectric layer is deposited and a trench etched through it and into a lower dielectric layer by a controllable amount, so that the top of a resistor layer deposited in the trench is close in height to the top of the lower dielectric layer; the trench is filled and the resistor layer outside the trench is removed, after which a second dielectric layer is deposited. Vias passing through the second dielectric layer to contact the resistor then have the same depth as vias contacting metal interconnects in the lower dielectric layer. A tri-layer resistor structure is employed in which the resistive film is sandwiched between two protective layers that block diffusion between the resistor and BEOL ILD layers.

    摘要翻译： 在集成电路的后端形成电阻器的过程中，沉积中间介电层，并通过可蚀刻的量蚀刻通过该介质层并将其沉积到下介电层中，使得沉积在电介质层中的电阻层的顶部 沟槽的高度接近于下介电层的顶部; 沟槽被填充，沟槽外的电阻层被去除，然后沉积第二介电层。 通过第二电介质层以与电阻器接触的通孔的深度与下电介质层中的金属互连接触孔的深度相同。 使用三层电阻器结构，其中电阻膜夹在两个阻挡电阻器和BEOL ILD层之间的扩散的保护层之间。

    Integrated BEOL thin film resistor
    9.
    发明授权
    Integrated BEOL thin film resistor 有权
    集成BEOL薄膜电阻

    公开(公告)号：US07902629B2

    公开(公告)日：2011-03-08

    申请号：US12271942

    申请日：2008-11-17

    申请人： Anil K. Chinthakindi ,  Douglas D. Coolbaugh ,  John M. Cotte ,  Ebenezer E. Eshun ,  Zhong-Xiang He ,  Anthony K. Stamper ,  Eric J. White

    发明人： Anil K. Chinthakindi ,  Douglas D. Coolbaugh ,  John M. Cotte ,  Ebenezer E. Eshun ,  Zhong-Xiang He ,  Anthony K. Stamper ,  Eric J. White

    IPC分类号： H01L29/00 ,  H01L27/10 ,  H01L29/74 ,  H01L23/48 ,  H01L23/52 ,  H01L29/40

    CPC分类号： H01L23/5228 ,  H01L2924/0002 ,  H01L2924/00

    摘要： In the course of forming a resistor in the back end of an integrated circuit, an intermediate dielectric layer is deposited and a trench etched through it and into a lower dielectric layer by a controllable amount, so that the top of a resistor layer deposited in the trench is close in height to the top of the lower dielectric layer; the trench is filled and the resistor layer outside the trench is removed, after which a second dielectric layer is deposited. Vias passing through the second dielectric layer to contact the resistor then have the same depth as vias contacting metal interconnects in the lower dielectric layer. A tri-layer resistor structure is employed in which the resistive film is sandwiched between two protective layers that block diffusion between the resistor and BEOL ILD layers.

    摘要翻译： 在集成电路的后端形成电阻器的过程中，沉积中间介电层，并通过可蚀刻的量蚀刻通过该介质层并将其沉积到下介电层中，使得沉积在电介质层中的电阻层的顶部 沟槽的高度接近于下介电层的顶部; 沟槽被填充，沟槽外的电阻层被去除，然后沉积第二介电层。 通过第二电介质层以与电阻器接触的通孔的深度与下电介质层中的金属互连接触孔的深度相同。 使用三层电阻器结构，其中电阻膜夹在两个阻挡电阻器和BEOL ILD层之间的扩散的保护层之间。