摘要:
A pixel 10 includes a photodiode PD which is provided between a first barrier region 21 forming a first potential barrier B1 and a second barrier region 27 forming a second potential barrier B2, a first floating diffusion region F1 which is provided adjacent to the first barrier region 21, and to which a first electric charge generated in the photodiode PD is transferred, and a second floating diffusion region F2 which is provided adjacent to the second barrier region 27, and into which a second electric charge generated in the photoelectric conversion region PD flows, and in which a part of the flowing-in second electric charge is accumulated. The second potential barrier B2 is lower than the first potential barrier B1.
摘要:
According to this A/D converter, a first A/D conversion operation for performing integral A/D conversion and a second A/D conversion operation for performing cyclic A/D conversion are realized based on control of operational procedures in a same circuit configuration. Moreover, in the first A/D conversion operation, since a capacity of a capacitor used in the integration of an output signal is greater than a capacity of a capacitor used for storing an input analog signal and a standard reference voltage, the analog signal that is input in the integral A/D conversion is attenuated according to the capacity ratio and subject to sampling and integration. Consequently, the voltage range of the analog signal that is output in the integral A/D conversion also decreases according to the capacity ratio of the capacitors, and the A/D converter can be therefore constructed with a single-ended configuration.
摘要:
A pipelined A/D converter circuit includes a sample hold circuit configured to sample and hold an analog input signal, and output a sample hold signal, and an A/D converter circuit including A/D converter circuit parts connected to each other in cascade, and performs A/D conversion in a pipelined form. The pipelined A/D converter circuit part of each stage includes a sub-A/D converter circuit, a multiplier D/A converter circuit, and a precharge circuit. The sub-A/D converter circuit includes comparators, and A/D convert the input signal into a digital signal of predetermined bits, a multiplier D/A converter circuit for D/A converting the digital signal from the sub-A/D converter circuit into an analog control signal generated with a reference voltage served as a reference value, sample, hold and amplify the input signal by sampling capacitors based on the analog control signal.
摘要:
The present invention provides a high-speed charge-transfer photodiode encompassing a first conductivity type semiconductor layer (20) serving as a charge-generation region; and a second conductivity type surface-buried region (21a) serving as a charge-transfer region of charges generated by the charge-generation region, wherein a specified direction in the surface-buried region (21a) provided along a plane parallel to a surface of the semiconductor layer (20) is assigned as a charge-transfer direction of the charges, and at least one of a variation of widths of the surface-buried region (21a) measured in an orthogonal direction to the charge-transfer direction and a variation of impurity concentration distributions of the surface-buried region (21a), which are measured along the charge-transfer direction, is determined such that an electric field distribution in the charge-transfer direction is constant.
摘要:
A semiconductor element includes a base-body region of p-type; a charge-generation buried region of a n-type, implementing a photodiode together with the base-body region, configured to create a first potential valley in the base-body region; an accumulation region of n-type, being buried in a part of the upper portion of the base-body region, configured to create a second potential valley deeper than the first potential valley; a transfer-gate insulation film provided on a surface of the base-body region; a transfer-gate electrode provided on the transfer-gate insulation film, configured to control a potential of a transfer channel formed in the base-body region between the charge-generation buried region and the accumulation region; and a recessed-potential creation mechanism configured to create a stair-like-shaped potential barrier for electronic shuttering.
摘要:
A pipelined A/D converter circuit includes a sample hold circuit configured to sample and hold an analog input signal, and output a sample hold signal, and an A/D converter circuit including A/D converter circuit parts connected to each other in cascade, and performs A/D conversion in a pipelined form. The pipelined A/D converter circuit part of each stage includes a sub-A/D converter circuit, a multiplier D/A converter circuit, and a precharge circuit. The sub-A/D converter circuit includes comparators, and A/D convert the input signal into a digital signal of predetermined bits, a multiplier D/A converter circuit for D/A converting the digital signal from the sub-A/D converter circuit into an analog control signal generated with a reference voltage served as a reference value, sample, hold and amplify the input signal by sampling capacitors based on the analog control signal.
摘要:
A semiconductor range-finding element encompasses a semiconductor region (1), a light receiving surface-buried region (11a), a first charge-accumulation region (12a), a first charge read-out region (13), a first potential control means (31), a second potential control means (32), a first exhausting-drain region (14) and a third potential control means (33). The signal charges dependent on a delay time of the reflected light are repeatedly transferred from the light receiving surface-buried region (11a) to the first charge-accumulation region (12a) so as to be accumulated as a first signal charge in the first charge-accumulation region (12a) in a first repetition period, all of the signal charges generated by the reflected light are repeatedly transferred from the light receiving surface-buried region (11a) to the first charge-accumulation region (12a) so as to be accumulated as a second signal charge in the first charge-accumulation region (12a) in a second repetition period. A ratio between total quantities of the accumulated first and second signal charges is calculated so as to measure a range to a target sample.
摘要:
A magnetic array sensor circuit to process an output from a magnetic sensor array including a plurality of magnetic sensor elements arranged in an array. The circuit includes a regulating circuit to reduce an offset variation of the output from the magnetic sensor elements arranged in the array. The regulating circuit includes a control circuit to operate the magnetic sensor element in a linear region. The control circuit includes a reference sensor element in the form of the magnetic sensor element short-circuited between two output terminals, a storage element to store a reference offset value read out from the reference sensor element, and a subtraction circuit to subtract the stored reference offset value from an output of the other magnetic sensor elements.
摘要:
A solid-state imaging device includes a semiconductor region of p-type; a buried region of n-type, configured to serve as a photodiode together with the semiconductor region; a extraction region of n-type, configured to extract charges generated by the photodiode from the buried region, having higher impurity concentration than the buried region; a read-out region of n-type, configured to accumulate charges, which are transferred from the buried region having higher impurity concentration than the buried region; and a potential gradient changing mechanism, configured to control a potential of the channel, and to change a potential gradient of a potential profile from the buried region to the read-out region and a potential gradient of a potential profile from the buried region to the extraction region, so as to control the transferring/extraction of charges.
摘要:
An A/D conversion integrated circuit including a plurality of A/D converters which can inhibit noises from being propagated by capacitive coupling from a conductor which transmits a digital signal is provided. In an A/D converter 13, an input 15 receives an analog signal to be A/D converted. An output 17 provides at least a part of a digital signal SD having a predetermined number of bits representing the analog signal SA. In response to an analog signal SA, a sub-A/D conversion circuit 19 generates a signal SDP representing one or a plurality of bit values of the digital signal SD and feeds the signal SDP to the output 17. An input 21 a of a control circuit 21 is connected to an output 19a of the sub-A/D conversion circuit 19 and provides a control signal SCONT corresponding to the signal SDP. The control signal SCONT has a waveform including a transition from a voltage level L1 to a voltage level L2 and a transition from the voltage level L2 to the voltage level L1.