摘要:
A DMA module is described which, in order to read or write a memory location within a DMA process, accesses by a reading operation a memory location of an addressable memory (5) identified by a first address (46) in order to read there at least one second address (52); which advances the second address (52) to an adjacent memory location, and implements a write access or read access at a memory location identified by the second address (52); and which finally stores the second address at the memory location identified by the first address (46).
摘要:
In this protective arrangement, a resistor between a pad (p) and a transistor to be protected is implemented with an expansion region (e) which lies completely below the pad (p) and extends beyond the latter along the entire circumference of the pad. An elongate region (z) extends along the circumference of the expansion region (e) and is connected to circuit ground via an interconnection track (b). The connection between the elongate region (z) and the interconnection track (b) has a low resistance.
摘要:
The circuit merely comprises three transistors, namely one transfer transistor (t) arranged between the input (e) and the output (a), a load transistor (l) connected as a resistor, and a clamping transistor (k), with both of the latter connecting the output (a) to the source of operating voltage (U). The interconnected gates of both the clamping and the transfer transistor (k, t) are connected to a source of reference voltage (Ur). If these two transistors (k, t) are of the depletion type, the two gates thereof may be connected to the zero point of the circuit. The circuit is particularly quick and simple.
摘要:
A MOS driver circuit has a first output transistor and a second output transistor which are driven in push-pull into a conducting state by a first driver stage having first high impedance and first low impedance elements and a second driver stage having second high impedance and second low impedance elements, respectively. The high impedance driver elements drive the output transistors into a conducting or nonconducting state and the low impedance driver elements hold the output transistors in the nonconducting state. The junction of the output transistors can be connected to a load. A holding stage for each driver stage is cross coupled to a high impedance driver element of one output transistor and the low impedance driver element of the other output transistor, so as to drive one output transistor in the conducting state while holding the other output transistor in a nonconducting state. As a result, shunt currents between the output transistors are avoided even in the presence of output noise.
摘要:
An electrically programmable memory includes a test circuit usable for detection of interaction between adjacent memory cells by easily permitting a checkerboard-pattern to be programmed into the memory.
摘要:
Circuit arrangement for checking memory cells of programmable MOS-integrated semiconductor memories, especially non-volatile semiconductor memories of the floating-gate type, has an active programming and read mode of operation wherein all word lines of the semiconductor memory with the exception of one selected word line are at a low level. The circuit arrangement also has an inactive power-down mode of operation, wherein all word lines at a high level. Both of the modes of operation are represented by a signal having a first level for the active mode of operation and a second level for the inactive mode of operation. The circuit arrangement further includes a single circuit in the semiconductor memory switchable via a first signal indicating the operating mode for the memory cell test, wherein all of the word lines are addressed by a voltage corresponding to the programming voltage, as a function of a single second signal fed into the semiconductor memory from the outside, from the level indicating the active mode of operation to the level indicating the inactive mode of operation, so that all the word lines can be switched simultaneously to the level required for programming.
摘要:
Circuit having MOS-transistors for the rapid evaluation of the logic state of a sampling node, including a circuit input connected to the sampling node, a circuit output, a supply voltage source, an inverter being connected to the circuit input and having an output, a first transistor being connected between the circuit input and the circuit output and having a gate connected to the output of the inverter, a second transistor being connected between the supply voltage source and the circuit output and having a gate connected to the output of the inverter, and a third transistor shunted across the second transistor as a load resistor.
摘要:
The invention relates to integrated circuits comprising a monolithically integrated logic IC and a monolithically integrated interface circuit that is conductively connected to the logic IC. The electrical properties of said interface circuit are programmable. The interface circuit also has a lower integration density than the logic IC, and comprises monitoring modules for monitoring the logic ICs.
摘要:
Spurious-emission-reducing terminal configuration for an integrated circuit, particularly a monolithic integrated circuit, operable within an unshielded board network, the integrated circuit being divided into a first subcircuit, which has essentially radio-frequency current components, and a second subcircuit, which has essentially low-frequency current components, the separation also extending to the internal supply lines and supply contact pads. The second subcircuit includes driver circuits which are connected to I/O lines on the board network. On the grounded side, the first and second supply current paths are interconnected within the integrated circuit by a low-resistance and low-inductance connection to establish a ground point.
摘要:
The invention is a method and circuit for improving the settability of the output current (i1) of at least one pad driver (D: D1, D2, . . . Dn) to reduce interfering voltage dips on the supply lines. The pulselike current peaks caused by rapid charging/discharging of high load capacitances (c) are particularly avoided. To this end, the respective output transistor (t1, t1') is operated as a current-controlled element in a first range (b1) of the output voltage (OUR) and as a voltage-controlled element in a second range (b2).