-
公开(公告)号:US20170110341A1
公开(公告)日:2017-04-20
申请号:US15128127
申请日:2015-03-23
Applicant: DENSO CORPORATION
Inventor: Kenji ONODA , Eiji NOMURA , Tooru OOTANI , Akinori ODA
CPC classification number: H01L21/4882 , H01L21/56 , H01L21/565 , H01L23/051 , H01L23/3107 , H01L24/33 , H01L25/07 , H01L25/18 , H01L2021/60015 , H01L2021/603 , H01L2924/13055 , H01L2924/13091 , H01L2924/181 , H01L2924/00 , H01L2924/00012
Abstract: A pressing unit including a pressing pin is attached to a mold, a semiconductor chip, first and second heat sinks, and solders are disposed in a cavity of the mold, a mold closing state is made, and a reflow is carried out in a state where the first and second heat sinks are pressed against first and second wall surfaces by the pressing pin to form a laminated body. After the laminated body is formed, the pressing pin is pulled out from the cavity, and a resin molded body is formed by injecting a resin.
-
公开(公告)号:US20140015120A1
公开(公告)日:2014-01-16
申请号:US14024917
申请日:2013-09-12
Applicant: DENSO CORPORATION
Inventor: Kuniaki MAMITSU , Takahisa KANEKO , Masaya TONOMOTO , Masayoshi NISHIHATA , Hiroyuki WADO , Chikage NORITAKE , Eiji NOMURA , Toshiki ITOH
IPC: H01L23/473
CPC classification number: H01L23/473 , H01L23/3672 , H01L23/3736 , H01L23/427 , H01L23/4334 , H01L23/46 , H01L24/06 , H01L24/29 , H01L24/32 , H01L24/33 , H01L24/48 , H01L24/73 , H01L2224/06181 , H01L2224/29111 , H01L2224/2929 , H01L2224/29299 , H01L2224/29339 , H01L2224/29347 , H01L2224/32225 , H01L2224/32245 , H01L2224/33181 , H01L2224/48227 , H01L2224/73215 , H01L2224/73265 , H01L2924/00013 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01029 , H01L2924/01033 , H01L2924/01047 , H01L2924/0105 , H01L2924/01082 , H01L2924/0132 , H01L2924/014 , H01L2924/06 , H01L2924/1301 , H01L2924/1305 , H01L2924/13055 , H01L2924/1517 , H01L2924/1579 , H01L2924/181 , H01L2924/1815 , H01L2924/00012 , H01L2924/00 , H01L2224/29099 , H01L2224/29199 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
Abstract: A semiconductor device includes a package and a cooler. The semiconductor package includes a semiconductor element, a metal member, and a molding member for encapsulating the semiconductor element and the metal member. The metal member has a metal portion thermally connected to the semiconductor element, an insulating layer on the metal portion, and a conducting layer on the insulating layer. The conducting layer is at least partially exposed outside the molding member and serves as a radiation surface for radiating heat of the semiconductor element. The cooler has a coolant passage through which a coolant circulates to cool the conducting layer. The conducting layer and the cooler are electrically connected together.
Abstract translation: 半导体器件包括封装和冷却器。 半导体封装包括半导体元件,金属构件和用于封装半导体元件和金属构件的模制构件。 金属构件具有热连接到半导体元件的金属部分,金属部分上的绝缘层和绝缘层上的导电层。 导电层至少部分地暴露在模制构件的外部,并且用作用于辐射半导体元件的热的辐射表面。 冷却器具有冷却剂通道,冷却剂通过该通道冷却导电层。 导电层和冷却器电连接在一起。
-
公开(公告)号:US20140203426A1
公开(公告)日:2014-07-24
申请号:US14220277
申请日:2014-03-20
Applicant: DENSO CORPORATION
Inventor: Kuniaki MAMITSU , Takahisa KANEKO , Masaya TONOMOTO , Masayoshi NISHIHATA , Hiroyuki WADO , Chikage NORITAKE , Eiji NOMURA , Toshiki ITOH
IPC: H01L23/473
CPC classification number: H01L23/473 , H01L23/3672 , H01L23/3736 , H01L23/427 , H01L23/4334 , H01L23/46 , H01L24/06 , H01L24/29 , H01L24/32 , H01L24/33 , H01L24/48 , H01L24/73 , H01L2224/06181 , H01L2224/29111 , H01L2224/2929 , H01L2224/29299 , H01L2224/29339 , H01L2224/29347 , H01L2224/32225 , H01L2224/32245 , H01L2224/33181 , H01L2224/48227 , H01L2224/73215 , H01L2224/73265 , H01L2924/00013 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01029 , H01L2924/01033 , H01L2924/01047 , H01L2924/0105 , H01L2924/01082 , H01L2924/0132 , H01L2924/014 , H01L2924/06 , H01L2924/1301 , H01L2924/1305 , H01L2924/13055 , H01L2924/1517 , H01L2924/1579 , H01L2924/181 , H01L2924/1815 , H01L2924/00012 , H01L2924/00 , H01L2224/29099 , H01L2224/29199 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
Abstract: A semiconductor device includes a package and a cooler. The semiconductor package includes a semiconductor element, a metal member, and a molding member for encapsulating the semiconductor element and the metal member. The metal member has a metal portion thermally connected to the semiconductor element, an insulating layer on the metal portion, and a conducting layer on the insulating layer. The conducting layer is at least partially exposed outside the molding member and serves as a radiation surface for radiating heat of the semiconductor element. The cooler has a coolant passage through which a coolant circulates to cool the conducting layer. The conducting layer and the cooler are electrically connected together.
-
公开(公告)号:US20170278774A1
公开(公告)日:2017-09-28
申请号:US15508506
申请日:2015-12-04
Applicant: DENSO CORPORATION
Inventor: Eiji HAYASHI , Wataru KOBAYASHI , Eiji NOMURA , Kazuki KOUDA
IPC: H01L23/495 , H01L23/31 , H01L25/00 , H01L21/56 , H01L25/065 , H01L23/29 , H01L21/48
CPC classification number: H01L23/4952 , H01L21/4825 , H01L21/565 , H01L23/293 , H01L23/3107 , H01L23/3142 , H01L23/4334 , H01L23/488 , H01L23/49527 , H01L23/49562 , H01L23/49575 , H01L25/0655 , H01L25/50 , H01L2224/33 , H01L2924/181 , H01L2924/00012
Abstract: A semiconductor device includes: a semiconductor chip having an electrode on one surface; a first conductive member disposed on one surface side of the semiconductor chip; a metal member having a base member and a membrane and disposed between the semiconductor chip and the first conductive member; a first solder disposed between the electrode of the semiconductor chip and the metal member; and a second solder disposed between the metal member and the first conductive member. The membrane has a metal thin film arranged on the surface of the base member and an uneven oxide film. The uneven oxide film is arranged on the metal thin film in at least a part of a connection region of a surface of the metal member, the connection region connecting a first connection region to which the first solder is connected and a second connection region to which the second solder is connected.
-
公开(公告)号:US20140361425A1
公开(公告)日:2014-12-11
申请号:US14469698
申请日:2014-08-27
Applicant: DENSO CORPORATION
Inventor: Kuniaki MAMITSU , Takahisa KANEKO , Masaya TONOMOTO , Masayoshi NISHIHATA , Hiroyuki WADO , Chikage NORITAKE , Eiji NOMURA , Toshiki ITOH
IPC: H01L23/427 , H01L23/367
CPC classification number: H01L23/473 , H01L23/3672 , H01L23/3736 , H01L23/427 , H01L23/4334 , H01L23/46 , H01L24/06 , H01L24/29 , H01L24/32 , H01L24/33 , H01L24/48 , H01L24/73 , H01L2224/06181 , H01L2224/29111 , H01L2224/2929 , H01L2224/29299 , H01L2224/29339 , H01L2224/29347 , H01L2224/32225 , H01L2224/32245 , H01L2224/33181 , H01L2224/48227 , H01L2224/73215 , H01L2224/73265 , H01L2924/00013 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01029 , H01L2924/01033 , H01L2924/01047 , H01L2924/0105 , H01L2924/01082 , H01L2924/0132 , H01L2924/014 , H01L2924/06 , H01L2924/1301 , H01L2924/1305 , H01L2924/13055 , H01L2924/1517 , H01L2924/1579 , H01L2924/181 , H01L2924/1815 , H01L2924/00012 , H01L2924/00 , H01L2224/29099 , H01L2224/29199 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
Abstract: A semiconductor device includes a package and a cooler. The semiconductor package includes a semiconductor element, a metal member, and a molding member for encapsulating the semiconductor element and the metal member. The metal member has a metal portion thermally connected to the semiconductor element, an insulating layer on the metal portion, and a conducting layer on the insulating layer. The conducting layer is at least partially exposed outside the molding member and serves as a radiation surface for radiating heat of the semiconductor element. The cooler has a coolant passage through which a coolant circulates to cool the conducting layer. The conducting layer and the cooler are electrically connected together.
-
-
-
-