摘要:
In a charge redistribution type A/D converter, an input-side capacitor terminal and a comparator-side capacitor terminal are connected through first and second analog switches to a fixed-voltage supply circuit, and the input-side capacitor terminal is connected through a third analog switch to the outside. Immediately before sampling an analog signal, the first and second analog switches are closed while the third analog switch is opened, according to a RESET signal. Thereby, fixed voltages are supplied to the input-side capacitor terminal and the comparator-side capacitor terminal, respectively, and charge stored in a weighting capacitor unit is initialized to a predetermined value.
摘要:
A semiconductor integrated circuit has a plurality of capacitor cells, and each capacitor cell has an upper electrode and a lower electrode. These electrodes are respectively connected to an upper electrode wiring and a lower electrode. When, for example, the upper electrode is connected to the upper electrode wiring and the electrode wiring is located at a side of the lower electrode of another capacitor cell or a side of the lower electrode wiring connecting these electrodes, a shield wiring is provided between the upper electrode wiring and the adjacently-located lower electrode of the other capacitor cell or between the upper electrode wiring and the adjacently-located lower electrode wiring. Thus, with this shield wiring, the capacitance coupling between each wiring of the capacitor cells and each upper electrode or each lower electrode of the capacitor cells are effectively suppressed.
摘要:
A semiconductor integrated circuit has a plurality of capacitor cells, and each capacitor cell has an upper electrode and a lower electrode. These electrodes are respectively connected to an upper electrode wiring and a lower electrode. When, for example, the upper electrode is connected to the upper electrode wiring and the electrode wiring is located at a side of the lower electrode of another capacitor cell or a side of the lower electrode wiring connecting these electrodes, a shield wiring is provided between the upper electrode wiring and the adjacently-located lower electrode of the other capacitor cell or between the upper electrode wiring and the adjacently-located lower electrode wiring. Thus, with this shield wiring, the capacitance coupling between each wiring of the capacitor cells and each upper electrode or each lower electrode of the capacitor cells are effectively suppressed.
摘要:
A semiconductor integrated circuit has a plurality of capacitor cells, and each capacitor cell has an upper electrode and a lower electrode. These electrodes are respectively connected to an upper electrode wiring and a lower electrode. When, for example, the upper electrode is connected to the upper electrode wiring and the electrode wiring is located at a side of the lower electrode of another capacitor cell or a side of the lower electrode wiring connecting these electrodes, a shield wiring is provided between the upper electrode wiring and the adjacently-located lower electrode of the other capacitor cell or between the upper electrode wiring and the adjacently-located lower electrode wiring. Thus, with this shield wiring, the capacitance coupling between each wiring of the capacitor cells and each upper electrode or each lower electrode of the capacitor cells are effectively suppressed.
摘要:
The present invention provides a serial/parallel A/D converter which is capable of performing a high-speed and high-accuracy operation even in the case where an analog input voltage Vin greatly varies in a period between a previous sampling period in which the analog input voltage is held and the next sampling period, when converting the analog input voltage Vin input into a digital value. This serial/parallel A/D converter includes a lower-order reference voltage initializing circuit 8 for initializing a lower-order reference voltage to an initialization voltage Vrc 23. The initialization voltage Vrc 23 is generated as the lower-order reference voltage in an arbitrary period from the start of sampling of the analog input voltage until the start of a comparison operation for the lower-order reference voltage, the value of the lower-order reference voltage is changed from the value of the initialization voltage to a voltage value which is decided on the basis of higher-order code selection signals P0C-P3C from a higher-order code selecting circuit 14, and the value of the lower-order reference voltage which is decided on the basis of the higher-order code selection signals P0C-P3C is compared with the value of the analog input voltage.
摘要:
In an A/D converter provided with an A/D converter circuit 101 for operationally amplifying an input signal and outputting an amplified signal, the A/D converter circuit 101 includes an initial value setting circuit 4a in addition to an amplifier 1a, a sub-A/D converter 2a, a sub-D/A converter 3a and capacitors C11 and C12. To ensure that the initial value of the output voltage of the amplifier 1a is a given voltage value close to the target value of operational amplification at the start of the operational amplification by the amplifier 1a, the initial value setting circuit 4a applies a given bias value equal to the given voltage value close to the target value to a next-stage capacitor C13 to be connected to the output side of the amplifier 1a. Such an A/D converter circuit 101 that can perform speedy convergence to the target value of operational amplification is used at each stage of a pipeline A/D converter.
摘要:
In an A/D converter provided with an A/D converter circuit 101 for operationally amplifying an input signal and outputting an amplified signal, the A/D converter circuit 101 includes an initial value setting circuit 4a in addition to an amplifier 1a, a sub-A/D converter 2a, a sub-D/A converter 3a and capacitors C11 and C12. To ensure that the initial value of the output voltage of the amplifier 1a is a given voltage value close to the target value of operational amplification at the start of the operational amplification by the amplifier 1a, the initial value setting circuit 4a applies a given bias value equal to the given voltage value close to the target value to a next-stage capacitor C13 to be connected to the output side of the amplifier 1a. Such an A/D converter circuit 101 that can perform speedy convergence to the target value of operational amplification is used at each stage of a pipeline A/D converter.
摘要:
A semiconductor integrated circuit according to the present invention is equipped with a plurality of analog macros having comb capacitors (10), each comb capacitor (10) has a comb-shaped first electrode (11) and a comb-shaped second electrode (12), comb tooth portions (13) of the electrode (11) and comb tooth portions (14) of the electrode (12) are engaged so that the comb tooth portions (13) and the comb tooth portions (14) are arranged alternately and parallel to one another, and a comb tooth interval S of the comb capacitor is varied according to an absolute accuracy indicating an error between an actual capacitance value and an ideal capacitance value, or a relative accuracy indicating a difference in capacitance values between adjacent comb capacitors. Thereby, it is possible to provide a semiconductor integrated circuit which is equipped with highly-accurate analog macros and highly-integrated analog macros having comb capacitors which ensure high capacitance accuracies.
摘要:
When the performance of an A/D converter required by a system changes, power consumption of the overall system can be reduced. The resolution of an A/D converter is made variable by changing a current flowing through an amplifier by an external control signal that specifies the resolution. Thus, when the performance required by a system changes, it is possible to change the performance of the A/D converter and to prevent a performance overhead of the A/D converter. Consequently, power consumption of the A/D converter is reduced, and power consumption of the system as a whole is also reduced.
摘要:
A differential voltage interconnect (W101a) electrically connects the gate electrode of a transistor to be used among differential transistors (T101a, T101a, . . . ) to an input node receiving an input voltage (Vinn), and a differential voltage interconnect (W101b) electrically connects the gate electrode of a transistor to be used among differential transistors (T101b, T101b, . . . ) to an input node receiving an input voltage (Vinp). A bias voltage interconnect (W102) electrically connects the gate electrode of a transistor to be used among current source transistors (T102, T102, . . . ) to a bias node receiving a bias voltage (VBN), and a bias voltage interconnect (W103) electrically connects the gate electrodes of transistors to be used among load transistors (T103a, T103a, T103b, T103b, . . . ) to a bias node receiving a bias voltage (VBP).