摘要:
A differential amplifier has an in-phase input terminal to which an input signal is applied through a first switching unit, an anti-phase input terminal to which a reference signal is applied through a second switching unit, and a third switching unit between the in-phase and anti-phase input terminals. The potential difference between the in-phase and anti-phase input terminals is differentially amplified by setting the first and second switching units to be on and the third switching unit to be off. Also, the in-phase and anti-phase input terminals are short-circuited to have a high impedance by setting the first and second switching units to be off and the third switching unit to be on.
摘要:
Disclosed is a series-parallel type analog-to-digital converter having an analog signal first digitized through coarse quantization to thereby obtain a high-order converted code, and then, the quantization error of the high-order converted code digitized to thereby obtain a low-order converted code, in which it is adapted such that low-order converted codes are sequentially classified into three groups, and when a specific group is output as a redundancy code, a correction code for correcting the high-order converted code is output from the low-order encoder providing the converted code of that group.
摘要:
The present disclosure provides a signal conversion circuit and fingerprint identification system. The signal conversion circuit is configured to generate a first digital signal according to a first analog signal, and includes a comparator and counter. The comparator includes a first input terminal configured to receive the first analog signal, a second input terminal connected to a reference voltage generator and configured to receive a reference voltage, and an output terminal configured to output a second digital signal. The counter is connected to the output terminal, and is configured to generate a first digital signal. The signal conversion circuit according to the present disclosure has the advantages of simple circuit structure, small circuit area, low cost and low power consumption.
摘要:
A serial-to-parallel type A/D converter includes a resistance array, a plurality of comparators for upper bits, a plurality of comparators for lower bits, an encoder for upper bits, an encoder for lower bits and an adder. The resistance array divides a predetermined reference voltage to generate upper reference voltages, and by dividing the step width of the upper reference voltage, generates lower reference voltages. The plurality of comparators for the upper bits compare the analog input signal with the upper reference voltages, and applies the result of comparison to the encoder for the upper bits. The encoder for the upper bits calculates an estimated value of the upper bits based on the result of comparison, and select second reference voltages in the range provided by adding .+-.1/2 LSB to 1LSB corresponding to the estimated value of the upper bits. The plurality of comparators for the lower bits calculate the lower bits and a correcting bit based on the selected second reference voltages. The adder adds the correcting bit to the estimated value of the upper bits to correct the estimated value.
摘要:
In an A/D converter, a resistive network for producing 2.sup.n different voltage steps. The resistive network includes a coarse relatively high impedance resistive string which is subdivided into 2.sup.x coarse segments. The resistive network also includes a fine relatively high impedance resistive network comprised of a fine resistive element per coarse segment. Each fine resistive element is then subdivided into 2.sup.(n-x) fine sub-segments. In determining the value of an input voltage being sensed, all the coarse segments are used to sense which coarse segments brackets the input voltage. However, only the fine segment in parallel with the "bracketing" coarse resistor is then coupled to comparator means to sense which fine sub-segment brackets the input voltage.
摘要:
A semiconductor device includes an AD conversion unit that performs AD conversion on an input signal based on a reference voltage to be supplied, a reference voltage detection unit that detects the reference voltage supplied to the AD conversion unit, and a control unit that corrects a result of the AD conversion by the AD conversion unit in accordance with the reference voltage detected by the reference voltage detection unit. Thereby, AD conversion can be performed accurately even when a reference voltage varies.
摘要:
The present invention provides a serial/parallel A/D converter which is capable of performing a high-speed and high-accuracy operation even in the case where an analog input voltage Vin greatly varies in a period between a previous sampling period in which the analog input voltage is held and the next sampling period, when converting the analog input voltage Vin input into a digital value. This serial/parallel A/D converter includes a lower-order reference voltage initializing circuit 8 for initializing a lower-order reference voltage to an initialization voltage Vrc 23. The initialization voltage Vrc 23 is generated as the lower-order reference voltage in an arbitrary period from the start of sampling of the analog input voltage until the start of a comparison operation for the lower-order reference voltage, the value of the lower-order reference voltage is changed from the value of the initialization voltage to a voltage value which is decided on the basis of higher-order code selection signals P0C-P3C from a higher-order code selecting circuit 14, and the value of the lower-order reference voltage which is decided on the basis of the higher-order code selection signals P0C-P3C is compared with the value of the analog input voltage.
摘要:
When an upper reference voltage is erroneously reduced below a normal value in a subranging A-D converter, a resistance block of a ladder resistance having a voltage lower than a proper one is selected and a lower reference voltage is necessarily reduced below an analog input voltage, so that all outputs of lower bits go high. Namely, a region (B1) where a current flowing to a comparator becomes constant without depending on the value of an analog input voltage (Vin) appears. Presence of abnormality can be determined by detecting this. Thus, a functional test or a static linearity test of an A-D converter cell is made while remarkably reducing the number of external test terminals.
摘要:
The disclosure is an analog-to-digital converter of half-flash type providing for the multiplexing of two analog input signals and therefore requiring only one converter module. It includes a coarse comparator block used to determine the most significant bits of the converted signals and also determining the voltage range for two fine comparator blocks that determine the least significant bits of the converted signals, wherein each of the input signals is connected to a fine comparator block and said coarse comparator block compares alternatively the first and second input signals with a reference voltage. The analog-to-digital converter can be advantageously used for processing television signals.
摘要:
A series-parallel A/D converter having a plurality of reference resistors, a first comparator section, a second comparator section, groups of switches, and lower-reference voltage lines. The reference resistors divide a full-scale voltage, generating different reference voltages. They are connected in series, forming blocks of resistors. The first comparator section compares an input voltage with upper reference voltages and selects one of the blocks of resistors in accordance with the result of comparison. The groups of switches applies the voltages at the nodes of the reference resistors of the selected block, to the lower-reference voltage lines. When the block BL0 is selected, voltages Vr0 and Vr8 are applied to the lower-reference voltage lines L0 and L8, respectively. When the block BL1 is selected, voltages Vr16 and Vr8 are applied to the lines L0 and L8, respectively. That is, the voltage applied through the line L8 remains unchanged, whichever block of resistors is selected.