Abstract:
A decision-feedback equalizer (DFE) samples an analog input signal against M references during the same symbol time to produce M speculative samples. Select logic in the DFE then decodes N bits resolved previously for previous symbol times to select one of the M speculative samples as the present resolved bit. The present resolved bit is then stored as the most recent previously resolved bit in preparation for the next symbol time. The select logic can be can be programmable to accommodate process, environmental, and systematic variations.
Abstract:
Switched capacitor circuits and charge transfer methods include a sampling phase and a transfer phase. Circuits and methods are implemented via a plurality of switches, a set of at least two capacitors, at least one buffer amplifier, and an operational amplifier. In one example, during the sampling phase at least one input voltage is sampled, and during the transfer phase at least a first reference voltage provided by the at least one buffer amplifier is subtracted from the at least one input voltage using the operational amplifier. The same set of at least two capacitors may be used in both the sampling phase and the transfer phase.
Abstract:
In a latch circuit having a bistable pair of cross connected transistors of a first polarity and a third transistor of a second polarity, a current signal greater than a bias current is received at a latch circuit port, amplified with the third transistor, and applied to the latch circuit port. This decreases the time in which the latch circuit port receiving the current signal greater than the bias current reaches a steady state voltage.
Abstract:
A decision-feedback equalizer (DFE) samples an analog input signal against M references during the same symbol time to produce M speculative samples. Select logic in the DFE then decodes N bits resolved previously for previous symbol times to select one of the M speculative samples as the present resolved bit. The present resolved bit is then stored as the most recent previously resolved bit in preparation for the next symbol time. The select logic can be can be programmable to accommodate process, environmental, and systematic variations.
Abstract:
The invention relates to fast, high resolution, analog digital converters, and more particularly those which possess at least one conversion stage of “flash” type. The converter according to the invention uses N differential amplifiers with four inputs. The amplifier of rank j receives the input voltage to be converted Vep−Ven on two first inputs, and a reference potential difference on two other inputs. The reference potential difference is obtained between two taps of networks of resistors that are identical operating in parallel and supplied between a high voltage source and a low current source; the taps for an amplifier are respectively a tap Pj of rank j of a first network and a tap P′N−j+1 of rank N−j+1 of a second network. This reduces the first and second order non-linearity effects due to the fact that the differential amplifiers consume an input current tapped off from the networks of resistors.
Abstract:
In a latch circuit having a bistable pair of cross connected transistors of a first polarity and a third transistor of a second polarity, a current signal greater than a bias current is received at a latch circuit port, amplified with the third transistor, and applied to the latch circuit port. This decreases the time in which the latch circuit port receiving the current signal greater than the bias current reaches a steady state voltage.
Abstract:
An analog-to-digital converter (ADC) is provided. The ADC includes a reference voltage generator configured to generate reference voltages, an analog to digital converter core configured to receive an input signal and the reference voltages and to generate a digital signal representative of the input signal, the digital signal having a number of bits, and a controller configured to determine a quality of the input signal, and, based on a quality of the input signal, to control the number of bits of the digital signal and values of the reference voltages.
Abstract:
A data readout system with non-uniform resolution has a pick up head for reading data stored in an optical disc and generating an analog signal, a reference voltage unit for producing a plurality of reference voltage levels, wherein voltage differences between two adjacent reference voltage levels are not all the same, a plurality of comparators for comparing the reference voltage levels with the analog signal and generating comparison results, and an encoder for encoding the comparison results into a digital signal.
Abstract:
An analog-to-digital converter includes a first preamplifier receiving a first reference voltage and an input signal, a second preamplifier receiving a second reference voltage and the input signal, a first preamplifier calibrator placed for the first preamplifier and adjusting an input offset of the first preamplifier, a second preamplifier calibrator placed for the second preamplifier and adjusting an input offset of the second preamplifier, an interpolator placed between output terminals of the first and second preamplifiers and generating an interpolation signal having a voltage value between a first output signal from the first preamplifier and a second output signal from the second preamplifier, comparators receiving the first output signal, the second output signal or the interpolation signal and outputting a digital value based on the received signal, and comparator calibrators placed for at least comparators receiving the interpolation signal among the comparators and adjusting input offsets of the corresponding comparators.
Abstract:
An offset correction circuit examines a residue signal of a stage of a pipeline analog to digital converter (ADC) to determine whether a parameter which could cause offset error, needs to be adjusted. In an embodiment, the parameter is adjusted until a maximum range of the residue signal equals an expected range. In the described examples, the adjusted parameters include timing offset error (when components of an ADC sample the input signal at different time instances) and a voltage offset error (the threshold voltage at which a sub-ADC in a stage the generated sub-code changes to a next value).