摘要:
A dual-tunable direct digital synthesizer is provided with a programmable frequency multiplier that multiplies a relatively low frequency fixed clock signal F.sub.clk so that the output frequency F.sub.o of the waveform is:F.sub.o =(F.sub.n /2.sup.N).times.(M.times.F.sub.clk)where N is the resolution of the digital control word, the tuning word F.sub.n is the value of the N-bit control word, M is the multiplication factor and M*F.sub.clk is the DDS clock frequency. The multiplication factor and, hence, the DDS clock can be reduced to track changes in the output frequency thereby lowering the average power consumption. Because the synthesizer can generate the same output frequency using different tuning word-to-DDS clock ratios, it can be tuned for optimum SFDR over a narrow band around the desired output frequency. In other words, an "enhanced dynamic range band" in the harmonic and spurious performance can be mapped out for each frequency in the bandwidth.
摘要:
An overvoltage protection circuit protects against saturation and damage of sensitive circuitry elements. The protection circuit includes an out-of-range detector which compares an input signal to reference levels to determine if it is within a predetermined range of acceptable inputs. If the input is determined not to be within this range, a control circuit substitutes a supplemental signal within the range for the input signal. Digital correction can be provided to correct the output of the sensitive circuit element while the supplemental signal is being substituted. Numerous circuit designs may be used to implement the protection scheme.
摘要:
A protection circuit inhibits saturation and damage of sensitive circuit elements when an input signal goes out of a nominal input range. The protection circuit includes an out-of-range detector which compares the input signal to reference levels to determine if it is within the range. If it is not, a control circuit substitutes a supplemental signal that is slightly out of range, but not so far out of range as to cause any substantial saturation. Supplemental signal sources that produce supplemental signals slightly outside the high and low ends of the range with error margins, not more than about 750 mV, that lie just outside the range; an out-of-range input is replaced by the supplemental signal with the closest value. The invention is particularly applicable to multistep/subranging analog-to-digital/converters.
摘要:
Open-loop differential amplifiers (120, 140) are disclosed which have accurate and stable gain. The gain of these amplifiers is substantially insensitive to the effects of small-signal emitter resistance r.sub.e, current gain .beta. and Early voltage V.sub.A. Thus, their gain can be accurately set by resistance ratios which makes them particularly useful in integrated circuits. These advantages are obtained with an output differential pair (67) that has cross-coupled base and collector terminals. In addition, resistors (141, 143, 148, 150) and a current source (146) associated with this differential pair are related to like elements (27, 28, 24, 25 and 26) that are associated with an input differential pair (21) by disclosed numerical ratios, e.g., the nominal gain G of the amplifier. Versions of the amplifiers can be adapted for use as a residue amplifier (162) in a subranging A/D converter (160).
摘要:
Feedback control loop systems are provided that enhance output-signal switching times without degrading other loop performance parameters. The systems reduce “kick-back” voltages that are generated in a loop filter by drive currents which rapidly drive a control loop oscillator to a loop acquisition range. This reduction reduces a frequency step in the oscillator output signal which would otherwise have to be driven to eliminate the frequency step with a consequent increase in the output-signal switching time. Structures are provided that reduce the kick-back voltage to thereby enhance output-signal switching times.
摘要:
Feedback methods and systems are provided to achieve rapid switching of oscillator frequencies without compromising operational feedback loop bandwidths that filter out spurious tones and phase noise to thereby enhance loop spectral and noise performance. The methods respond to frequency changes in a reference signal by providing an open-loop drive current to drive a feedback signal towards the reference signal. The drive current is terminated and the feedback control loop closed when the feedback signal is within a predetermined acquisition range of the reference signal. This is determined by successively comparing a feedback frequency of the feedback signal to a destination frequency of the reference signal over a comparison window of time. The invention also provides a feedback control system that practices the invention's methods.
摘要:
Disclosed is a system that determines whether input and output pins of semiconductor components are present and properly soldered to a printed circuit board. The system uses an oscillator which supplies a signal, typically ten kilohertz (10 kHz) at 0.2 volts, to the pin under test. A conductive electrode is placed on top of the component package. The electrode is connected to a current measuring device. Another pin of the component is connected to the common signal return. Typically the other pin is chosen to be a power or ground pin of the component.
摘要:
One aspect provides a system including a sensor adjustment component comprising: a memory device having adjustment information stored therein; signal source capable of producing a signal detectable by a sensor to be adjusted; and one or more processors; wherein the one or more processors are configured to execute program instructions to operate the signal source to produce a predetermined signal pattern detectable by a measurement component of the sensor to be adjusted; and wherein the predetermined signal pattern comprises the adjustment information. Other aspects are disclosed.
摘要:
The present invention is an improved printed circuit board test system in which test probes are positioned to electronically engage a selected device or printed circuit board section on a printed circuit board for testing the printed circuit board for manufacturing defects. The printed circuit board test system uses a bed-of-nails test fixture to ground and excite predetermined sites on a first side of the printed circuit board and a robot to mechanically position test probe(s) at selected test sites on a second side of the printed circuit board. A controller is used to control the movement of the robotic tester and the selection of spring probes in the bed-of-nails fixture to be exited, grounded or measured.
摘要:
The present invention relates to the field of circuit assembly testing systems and provides improved systems and methods for debugging circuit test systems and diagnosing faults in circuit assemblies. An expert system derives possible root causes of test failures, predicts test results based on these possible root causes and uses factual observations to refute inconsistent hypothetical root causes. Tests useful in refuting inconsistent hypothetical root causes are devised and run automatically by the system.