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公开(公告)号：US4809314A
公开(公告)日：1989-02-28
申请号：US832973
申请日：1986-02-25
Applicant: Douglas S. Steele , John P. Keaveney , David W. Oliver
Inventor： Douglas S. Steele , John P. Keaveney , David W. Oliver
Abstract: An X-ray inspection system includes an X-ray source for generating a directed X-ray beam and a linear array detector for measuring the intensity of the received radiation and generating electrical signals representative thereof. A method for aligning the detector with the directed X-ray beam includes removing any part between the X-ray source and the detector, opening an X-ray beam limiter, positioning the linear array detector for maximum signal from each detector element, reducing the X-ray beam limiter opening, detecting whether any signal from a detector element is reduced, moving the limiter for producing a maximum signal on each signal, securing the X-ray beam limiter, and positioning the detector array for maximum signal.
Abstract translation: X射线检查系统包括用于产生定向X射线束的X射线源和用于测量接收到的辐射的强度并产生代表它的电信号的线性阵列检测器。 用于将检测器与定向X射线束对准的方法包括去除X射线源和检测器之间的任何部分，打开X射线束限制器，将线性阵列检测器定位成来自每个检测器元件的最大信号， X射线束限制器开路，检测来自检测器元件的任何信号是否减少，移动限幅器以产生每个信号上的最大信号，固定X射线束限制器，并将检测器阵列定位成最大信号。
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公开(公告)号：US4405878A
公开(公告)日：1983-09-20
申请号：US307404
申请日：1981-10-01
Applicant: David W. Oliver
Inventor： David W. Oliver
Abstract: A variety of technologies have been applied in the development of a bondedrid cathode. Erosion lithography is used for making the fine-detail grid structure, combining air erosion and lithographic techniques. To obtain openings of the order of 0.001 inch (one mil) or smaller, a nozzle with a high aspect ratio exit opening is used, and the cathode grid structure is scanned. A photo resist in which the grid pattern is developed is used over the molybdenum or tungsten grid film. The metal film is removed from the grid openings by chemical etching. The photo resist over the metal grid is used as a composite mask for removing the BN insulation in the openings by erosion with Al.sub.2 O.sub.3 powder from the special nozzle on the air blast gun.
Abstract translation: 多种技术已被应用于栅格阴极的开发中。 侵蚀光刻用于制作精细细网格结构，结合风蚀和光刻技术。 为了获得0.001英寸（1密耳）以下的开口，使用具有高纵横比的出口的喷嘴，并扫描阴极栅格结构。 在钼或钨网格膜上使用其中开发网格图案的光致抗蚀剂。 通过化学蚀刻从网格开口去除金属膜。 金属格栅上的光刻胶用作复合掩模，用于通过喷气枪上的特殊喷嘴用Al2O3粉末侵蚀而去除开口中的BN绝缘体。
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公开(公告)号：US4760304A
公开(公告)日：1988-07-26
申请号：US934520
申请日：1986-11-24
Applicant: David W. Oliver
Inventor： David W. Oliver
CPC classification number: G01N29/2487 , G01N29/041 , G01N29/07 , G01N29/11 , G01N29/221 , G01N29/2437 , G10K11/32 , G01N2291/0422 , G01N2291/0423 , G01N2291/0428 , G01N2291/044 , G01N2291/056
Abstract: A dark field ultrasonic transducer is constructed with an outer annular spherical or conical transducer element and an inner spherical element. The outer annular element is excited and insonifies a small portion of a part surface near a discontinuity or crack with longitudinal waves or with surface waves. The inner dark field element is not focused to be sensitive to either reflected sound or waves reradiated from the surface waves, but detects sound scattered from surface discontinuities such as a crack edge. When surface waves strike a crack edge and restrike it after reflection from the bottom of the crack, two pulses are received and the time delay between them is a measure of crack depth. The crack shape and crack depth profile are determined as the part is scanned.
Abstract translation: 暗场超声换能器由外环形球形或锥形换能器元件和内球面元件构成。 外部环形元件被激发，并使用纵波或表面波在部分表面的一小部分附近不连续或裂纹附近。 内部暗场元素不被聚焦以对从表面波再次辐射的反射声或波敏感，而是检测从表面不连续性（例如裂纹边缘）散射的声音。 当表面波从裂纹底部反射出裂纹边缘并重新起弧时，接收到两个脉冲，并且它们之间的时间延迟是裂纹深度的度量。 当扫描部分时，确定裂纹形状和裂纹深度分布。
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4.发明授权High intensity microfocus X-ray source for industrial computerized tomography and digital fluoroscopy 失效用于工业计算机断层扫描和数字荧光透视的高强度微焦点X射线源
公开(公告)号：US4607380A
公开(公告)日：1986-08-19
申请号：US623903
申请日：1984-06-25
Applicant: David W. Oliver
Inventor： David W. Oliver
Abstract: A high intensity microfocus x-ray source for the inspection of superalloy objects and the like operates at a voltage of the order of 400-500 kV with an electron beam focal spot size of the order of 2-10 mils and at power levels of tens to hundreds of kilowatts and affords a brightness improvement of at least three thousand over conventional x-ray sources.
Abstract translation: 用于检测超合金物体等的高强度微焦点x射线源以400-500kV级的电压工作，电子束焦点尺寸为2-10密耳数量级，功率级为数十 达到数百千瓦，比传统的x射线源提供至少三千度的亮度改善。
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5.发明授权Bonded cathode and electrode structure with layered insulation, and method of manufacture 失效具有分层绝缘的粘结阴极和电极结构及其制造方法
公开(公告)号：US4250428A
公开(公告)日：1981-02-10
申请号：US37257
申请日：1979-05-09
Applicant: David W. Oliver , Casmir R. Trzaskos
Inventor： David W. Oliver , Casmir R. Trzaskos
CPC classification number: H01J19/42
Abstract: The variety of technologies that have been applied in the development of aonded grid cathode are described. These include chemical vapor deposition of tungsten, molybdenum, iridium, BM, and Si.sub.3 N.sub.4 on both sides of a sintered tungsten cathode disk. Zirconium and titanium getters have been used to eliminate nitrogen evolution problems. Films of Si.sub.3 N.sub.4 have been added to the insulation to prevent calcium and barium diffusion into the layer and maintain adequate resistivity and breakdown strength. Plasma etching was introduced as a method of removing Si.sub.3 N.sub.4 from the cathode pores.
Abstract translation: 描述了已经应用于开发粘合栅极阴极的各种技术。 这些包括在烧结的钨阴极盘的两侧上的钨，钼，铱，BM和Si 3 N 4的化学气相沉积。 已经使用锆和钛吸气剂来消除氮的进化问题。 已经将Si3N4薄膜添加到绝缘层中，以防止钙和钡扩散到层中并保持足够的电阻率和击穿强度。 引入等离子体蚀刻作为从阴极孔除去Si 3 N 4的方法。
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Patent Agency Ranking
公开(公告)号：US4787126A
公开(公告)日：1988-11-29
申请号：US126325
申请日：1987-11-30
Applicant: David W. Oliver
Inventor： David W. Oliver
CPC classification number: G01N29/2437 , G01N29/041 , G01N29/07 , G01N29/11 , G01N29/221 , G10K11/32 , G01N2291/0422 , G01N2291/0423 , G01N2291/0428 , G01N2291/044 , G01N2291/056 , Y10S310/80 , Y10T29/42
Abstract: A dark field ultrasonic transducer is constructed with an outer annular spherical or conical transducer element and an inner spherical element. The outer annular element is excited and insonifies a small portion of a part surface near a discontinuity or crack with longitudinal waves or with surface waves. The inner dark field element is not focused to be sensitive to either reflected sound or waves reradiated from the surface waves, but detects sound scattered from surface discontinuities such as a crack edge. When surface waves strike a crack edge and restrike it after reflection from the bottom of the crack, two pulses are received and the time delay between them is a measure of crack depth. The crack shape and crack depth profile are determined as the part is scanned. A sphere-cone transducer, the preferred embodiment, is fabricated by stretching thin piezoelectric polymer film over a tool having a ball embedded in a conical surface.
Abstract translation: 暗场超声换能器由外环形球形或锥形换能器元件和内球面元件构成。 外部环形元件被激发，并使用纵波或表面波在部分表面的一小部分附近不连续或裂纹附近。 内部暗场元素不被聚焦以对从表面波再次辐射的反射声或波敏感，而是检测从表面不连续性（例如裂纹边缘）散射的声音。 当表面波从裂纹底部反射出裂纹边缘并重新起弧时，接收到两个脉冲，并且它们之间的时间延迟是裂纹深度的度量。 当扫描部分时，确定裂纹形状和裂纹深度分布。 球形锥形换能器，优选实施例是通过在具有嵌入锥形表面的球的工具上拉伸薄压电聚合物膜来制造的。
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7.发明授权High resolution X-ray collimator/detector system having reduced sensitivity to leakage radiation 失效高分辨率X射线准直仪/检测器系统对泄漏辐射敏感性降低
公开(公告)号：US4751391A
公开(公告)日：1988-06-14
申请号：US944483
申请日：1986-12-19
Applicant: Jeffrey W. Eberhard , David W. Oliver
Inventor： Jeffrey W. Eberhard , David W. Oliver
Abstract: An ionization chamber X-ray detector which minimizes the effects of leakage X-rays in systems where a collimator is employed to define resolution. The active collection volume of each detector element is reduced to the actual volume occupied by the negative ion cloud resulting from an incident X-ray beam for optimum response to desired radiation while minimizing response to leakage radiation by a combination of reducing the width of the collector electrodes with wider spaces in between the collector electrodes, and providing metallized guard electrodes between the collector electrodes. The guard electrodes serve to collect electrons freed by ionization between the collector electrodes resulting from "noise" X-rays, preventing these particular electrons from building up a space charge, or from reaching the actual collector electrodes. In addition, electric field distortions are minimized, with a consequent avoidance of adverse effects on detector response characteristics.
Abstract translation: 一种电离室X射线检测器，其使用准直仪来定义分辨率的系统中泄漏X射线的影响最小化。 每个检测器元件的主动收集体积被减少到由入射的X射线束产生的负离子云所占据的实际体积，以对期望的辐射进行最佳响应，同时通过减少收集器的宽度的组合来最小化对泄漏辐射的响应 在集电极之间具有较宽空间的电极，以及在集电极之间提供金属化的保护电极。 保护电极用于收集由“噪声”X射线产生的集电极之间的离子释放的电子，防止这些特定的电子建立空间电荷，或者到达实际的集电极。 此外，电场失真最小化，从而避免了对检测器响应特性的不利影响。
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公开(公告)号：US4272612A
公开(公告)日：1981-06-09
申请号：US149205
申请日：1980-05-12
Applicant: David W. Oliver
Inventor： David W. Oliver
Abstract: A variety of technologies have been applied in the development of a bondedrid cathode. Erosion lithography is used for making the fine-detail grid structure, combining air erosion and lithographic techniques. To obtain openings of the order of 0.001 inch (one mil) or smaller, a nozzle with a high aspect ratio exit opening is used, and the cathode grid structure is scanned. A photo resist in which the grid pattern is developed is used over the molybdenum or tungsten grid film. The metal film is removed from the grid openings by chemical etching. The photo resist over the metal grid is used as a composite mask for removing the BN insulation in the openings by erosion with Al.sub.2 O.sub.3 powder from the special nozzle on the air blast gun.
Abstract translation: 多种技术已被应用于栅格阴极的开发中。 侵蚀光刻用于制作精细细网格结构，结合风蚀和光刻技术。 为了获得0.001英寸（1密耳）以下的开口，使用具有高纵横比的出口的喷嘴，并扫描阴极栅格结构。 在钼或钨网格膜上使用其中开发网格图案的光致抗蚀剂。 通过化学蚀刻从网格开口去除金属膜。 金属格栅上的光刻胶用作复合掩模，用于通过喷气枪上的特殊喷嘴用Al2O3粉末侵蚀而去除开口中的BN绝缘体。
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公开(公告)号：US5017869A
公开(公告)日：1991-05-21
申请号：US450752
申请日：1989-12-14
Applicant: David W. Oliver
Inventor： David W. Oliver
CPC classification number: G01B7/105
Abstract: An apparatus for measuring the thickness of a coating on a substrate has a bridge circuit including four coils. One coil is placed near the coated substrate and another placed near an uncoated substrate of the same material. An oscillator is connected to the bridge circuit and frequency sweeps, e.g. from 10 KHz to 10 MHz. Phase differences between the voltages induced in the coils are detected to determine conductivity changes with frequency. A method for measuring coating thickness comprises generating variable frequency eddy current in coated and uncoated substrates of the same material and comparing the generated eddy current.
Abstract translation: 用于测量衬底上的涂层厚度的装置具有包括四个线圈的桥接电路。 一个线圈放置在涂覆的基底附近，另一个线圈放置在相同材料的未涂覆的基底附近。 振荡器连接到桥接电路，频率扫描，例如， 从10KHz到10MHz。 检测在线圈中感应的电压之间的相位差，以确定具有频率的电导率变化。 用于测量涂层厚度的方法包括在相同材料的涂覆和未涂覆的基底中产生可变频率涡流，并比较产生的涡流。
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公开(公告)号：US4803639A
公开(公告)日：1989-02-07
申请号：US832511
申请日：1986-02-25
Applicant: Douglas S. Steele , Larry C. Howington , James W. Schuler , Joseph J. Sostarich , Charles R. Wojciechowski , Theodore W. Sippel , Joseph M. Portaz , Ralph G. Isaacs , Henry J. Scudder, III , Thomas G. Kincaid , Kristina H. V. Hedengren , Rudolph A. A. Koegl , John P. Keaveney , Joseph Czechowski, III , John R. Brehm , James M. Brown, Jr. , David W. Oliver , George E. Williams , Richard D. Miller
Inventor： Douglas S. Steele , Larry C. Howington , James W. Schuler , Joseph J. Sostarich , Charles R. Wojciechowski , Theodore W. Sippel , Joseph M. Portaz , Ralph G. Isaacs , Henry J. Scudder, III , Thomas G. Kincaid , Kristina H. V. Hedengren , Rudolph A. A. Koegl , John P. Keaveney , Joseph Czechowski, III , John R. Brehm , James M. Brown, Jr. , David W. Oliver , George E. Williams , Richard D. Miller
CPC classification number: G06T7/0004 , G01N23/18 , G06T2207/10121 , G06T2207/30164
Abstract: An X-ray inspection system for manually or automatically performing digital fluoroscopy inspections and/or computed tomography inspections by X-ray examination of manufactured parts incorporates a computer system which automatically analyzes the inspected parts for flaws. The system includes apparatus for automatically positioning the parts in an X-ray machine for obtaining fluoroscopy and tomography views of the part and for acquiring data from the inspections at production rates. The system automatically identifies the location of rejectable flaws in the parts during the fluoroscopy scanning and subsequently identifies those locations for obtaining tomography scans, if the identified flaw location is questionable. The system can automatically reject parts containing flaws identified during the fluoroscopy inspections. This system operates in a real-time environment by providing analysis of one part while a subsequent part is being subjected to X-ray examination. The data obtained during each examination is archived and stored for tracking the part in further manufacturing processes.
Abstract translation: 用于手动或自动执行数字荧光透视检查和/或通过对制造部件进行X射线检查的计算机断层摄影检查的X射线检查系统包括自动分析被检查部分的缺陷的计算机系统。 该系统包括用于在X射线机中自动定位部件以获得该部件的透视和断层摄影视图并用于以生产率从检查中获取数据的装置。 如果识别出的缺陷位置是有问题的，系统将自动识别在荧光透视扫描期间部件中可排除缺陷的位置，并随后识别用于获取层析成像扫描的位置。 该系统可以自动排除在荧光检查检查期间识别的缺陷的部件。 该系统通过对后续部分进行X射线检查的一部分进行分析，在实时环境中运行。 在每次检查期间获得的数据被存档和存储，用于在进一步的制造过程中跟踪部件。
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