Method for producing a semiconductor structure
    4.
    发明申请
    Method for producing a semiconductor structure 审中-公开
    半导体结构的制造方法

    公开(公告)号:US20070111547A1

    公开(公告)日:2007-05-17

    申请号:US11582656

    申请日:2006-10-18

    IPC分类号: H01L21/31

    摘要: In a method for producing a semiconductor structure a substrate is provided, a dielectric layer comprising at least one metal oxide is formed on the substrate, and a nitrided layer is formed from the dielectric layer. The nitrided layer comprises either at least one metal nitride corresponding to the metal oxide or a metal oxynitride. The nitrided layer is removed selectively with respect to the dielectric layer in a predetermined etching medium.

    摘要翻译: 在制造半导体结构体的方法中,提供了基板,在基板上形成包含至少一种金属氧化物的电介质层,并且从电介质层形成氮化层。 氮化层包括至少一种对应于金属氧化物的金属氮化物或金属氮氧化物。 在预定的蚀刻介质中相对于电介质层选择性地去除氮化层。

    Method for fabricating a capacitor
    5.
    发明授权
    Method for fabricating a capacitor 失效
    制造电容器的方法

    公开(公告)号:US07402860B2

    公开(公告)日:2008-07-22

    申请号:US11179052

    申请日:2005-07-11

    IPC分类号: H01L27/108

    CPC分类号: H01L28/40

    摘要: The present invention relates to a method of fabricating a capacitor in a semiconductor substrate. The capacitor is fabricated such that the capacitor comprises: a trench inside a substrate, the trench having a lower region and an upper region, wherein the trench's diameters in the lower region is larger than in the upper region; a first electrode; a dielectric layer on top of the first electrode; a conductive layer on top of the electric layer, the conductive layer forming a second electrode of the capacitor; and a plug forming a closed cavity inside the lower region.

    摘要翻译: 本发明涉及在半导体衬底中制造电容器的方法。 电容器被制造成使得电容器包括:衬底内的沟槽,沟槽具有下部区域和上部区域,其中下部区域中的沟槽直径大于上部区域中的沟槽直径; 第一电极; 位于所述第一电极顶部的电介质层; 在所述电层顶部的导电层,所述导电层形成所述电容器的第二电极; 以及在下部区域内形成闭合腔的塞子。

    Method for fabricating a capacitor
    6.
    发明申请
    Method for fabricating a capacitor 失效
    制造电容器的方法

    公开(公告)号:US20070007624A1

    公开(公告)日:2007-01-11

    申请号:US11179052

    申请日:2005-07-11

    IPC分类号: H01L29/00

    CPC分类号: H01L28/40

    摘要: The present invention relates to a method of fabricating a capacitor in a semiconductor substrate. The capacitor is fabricated such that the capacitor comprises: a trench inside a substrate, the trench having a lower region and an upper region, wherein the trench's diameters in the lower region is larger than in the upper region; a first electrode; a dielectric layer on top of the first electrode; a conductive layer on top of the electric layer, the conductive layer forming a second electrode of the capacitor; and a plug forming a closed cavity inside the lower region.

    摘要翻译: 本发明涉及在半导体衬底中制造电容器的方法。 电容器被制造成使得电容器包括:衬底内的沟槽,沟槽具有下部区域和上部区域,其中下部区域中的沟槽直径大于上部区域中的沟槽直径; 第一电极; 位于所述第一电极顶部的电介质层; 在所述电层顶部的导电层,所述导电层形成所述电容器的第二电极; 以及在下部区域内形成闭合腔的塞子。