利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

142 条记录 (耗时 0.033 秒)

    Sample preparing apparatus
    1.
    发明授权
    Sample preparing apparatus 有权
    样品制备装置

    公开(公告)号：US07833485B2

    公开(公告)日：2010-11-16

    申请号：US11223495

    申请日：2005-09-08

    申请人： Hideyuki Higuchi ,  Hiroshi Kuroda

    发明人： Hideyuki Higuchi ,  Hiroshi Kuroda

    IPC分类号： B01L3/02

    CPC分类号： G01N1/2813 ,  G01N2035/00138

    摘要： The sample preparing apparatus comprises a smear forming means for forming a sample smear on a slide glass, a print means for printing sample identification information on a slide glass, a mode selecting means for selecting one operating mode from among a plurality of operating modes including a print mode, and a control means for selectively controlling the print means and the smear forming means. The control means operates the print means without operating the smear forming means when the print mode is selected.

    摘要翻译： 样品制备装置包括用于在载玻片上形成样品污迹的涂片形成装置，用于在载玻片上打印样品识别信息的打印装置，用于从多个操作模式中选择一个操作模式的模式选择装置，包括 打印模式，以及用于选择性地控制打印装置和拖尾形成装置的控制装置。 当选择打印模式时，控制装置操作打印装置而不操作拖影形成装置。

    Sample preparing apparatus
    2.
    发明申请
    Sample preparing apparatus 有权
    样品制备装置

    公开(公告)号：US20060051241A1

    公开(公告)日：2006-03-09

    申请号：US11223495

    申请日：2005-09-08

    申请人： Hideyuki Higuchi ,  Hiroshi Kuroda

    发明人： Hideyuki Higuchi ,  Hiroshi Kuroda

    IPC分类号： G01N35/00

    CPC分类号： G01N1/2813 ,  G01N2035/00138

    摘要： The sample preparing apparatus comprises a smear forming means for forming a sample smear on a slide glass, a print means for printing sample identification information on a slide glass, a mode selecting means for selecting one operating mode from among a plurality of operating modes including a print mode, and a control means for selectively controlling the print means and the smear forming means. The control means operates the print means without operating the smear forming means when the print mode is selected.

    摘要翻译： 样品制备装置包括用于在载玻片上形成样品污迹的涂片形成装置，用于在载玻片上打印样品识别信息的打印装置，用于从多个操作模式中选择一个操作模式的模式选择装置，包括 打印模式，以及用于选择性地控制打印装置和拖尾形成装置的控制装置。 当选择打印模式时，控制装置操作打印装置而不操作拖影形成装置。

    Scanning probe microscope
    3.
    发明授权
    Scanning probe microscope 有权
    扫描探针显微镜

    公开(公告)号：US08011230B2

    公开(公告)日：2011-09-06

    申请号：US12023158

    申请日：2008-01-31

    申请人： Masahiro Watanabe ,  Toru Kurenuma ,  Hiroshi Kuroda ,  Takafumi Morimoto ,  Shuichi Baba ,  Toshihiko Nakata ,  Manabu Edamura ,  Yukio Kembo

    发明人： Masahiro Watanabe ,  Toru Kurenuma ,  Hiroshi Kuroda ,  Takafumi Morimoto ,  Shuichi Baba ,  Toshihiko Nakata ,  Manabu Edamura ,  Yukio Kembo

    IPC分类号： G01B5/28

    CPC分类号： G01Q70/04 ,  G01Q10/06

    摘要： A scanning probe microscope, capable of performing shape measurement not affected by electrostatic charge distribution of a sample, which: monitors an electrostatic charge state by detecting a change in a flexure or vibrating state of a cantilever due to electrostatic charges in synchronization with scanning during measurement with relative scanning between the probe and the sample, and makes potential adjustment so as to cancel an influence of electrostatic charge distribution, thus preventing damage of the probe or the sample due to discharge and achieving reduction in measurement errors due to electrostatic charge distribution.

    摘要翻译： 扫描探针显微镜，其能够执行不受样品静电荷分布影响的形状测量，其通过检测与测量同步的静电荷引起的静电荷的悬臂的挠曲或振动状态的变化来监测静电荷状态 通过探针和样品之间的相对扫描，进行电位调整，以消除静电电荷分布的影响，从而防止由于放电而引起的探针或样品的损伤，并实现由静电电荷分布引起的测量误差的降低。

    Radar device
    5.
    发明授权
    Radar device 失效
    雷达设备

    公开(公告)号：US07570197B2

    公开(公告)日：2009-08-04

    申请号：US10478805

    申请日：2001-05-30

    申请人： Kazuaki Takano ,  Jiro Takezaki ,  Hiroshi Kuroda ,  Hiroshi Kondo

    发明人： Kazuaki Takano ,  Jiro Takezaki ,  Hiroshi Kuroda ,  Hiroshi Kondo

    IPC分类号： G01S13/93 ,  G01S7/40 ,  G01S13/00 ,  G01S7/00

    CPC分类号： G01S13/931 ,  G01S13/003 ,  G01S13/345 ,  G01S13/348 ,  G01S13/426 ,  G01S13/4454 ,  G01S13/48 ,  G01S13/584 ,  G01S2013/9321 ,  G01S2013/9325 ,  G01S2013/9346 ,  G01S2013/935 ,  G01S2013/9353 ,  G01S2013/9375 ,  G01S2013/9389

    摘要： One of the objects of the present invention is to reduce the size of a radar device mounted on a vehicle body. To achieve the object, one aspect of the invention provides a radar device, which is mounted on a vehicle body and detects a target present in a moving direction of the vehicle body, with (1) a transmitting antenna for transmitting a mm-Wave that forms an electric field having a width equivalent to the width of the vehicle body at a position away in a moving direction of the vehicle body by a distance corresponding to the most-approached distance defined between the vehicle body and the target and (2) two receiving antennas for receiving the reflected mm-Waves at mutually different positions.

    摘要翻译： 本发明的目的之一是减小安装在车体上的雷达装置的尺寸。 为了实现该目的，本发明的一个方面提供了一种雷达装置，其安装在车身上，并且检测目前存在于车身的移动方向上的目标，其中（1）发射天线用于发射mm波， 在车体的移动方向上的位置处的距离对应于车身与目标之间最接近的距离的距离，形成与车体的宽度相当的宽度的电场，（2）两 接收天线，用于在相互不同的位置接收反射的mm波。

    Radar apparatus and radar system for a vehicle
    6.
    发明授权
    Radar apparatus and radar system for a vehicle 失效
    用于车辆的雷达装置和雷达系统

    公开(公告)号：US07522092B2

    公开(公告)日：2009-04-21

    申请号：US11655148

    申请日：2007-01-19

    申请人： Fumihiko Okai ,  Hiroshi Kuroda

    发明人： Fumihiko Okai ,  Hiroshi Kuroda

    IPC分类号： G01S13/93

    CPC分类号： G01S7/36 ,  G01S7/021 ,  G01S7/023 ,  G01S13/222 ,  G01S13/931 ,  G01S2007/4013 ,  G01S2013/936 ,  G01S2013/9375 ,  G01S2013/9378 ,  G01S2013/9385

    摘要： A radar apparatus including units for transmitting and receiving an electric wave to detect a target, a unit for detecting wave interference caused by surroundings, a unit for controlling the modulation state of the transmitted wave, a communication unit for acquiring modulation state information being used by the other radar apparatuses, and a unit for selecting such a modulation state as to avoid interference with the modulation state information when the wave interference detecting unit detects the wave interference.

    摘要翻译： 一种包括用于发送和接收用于检测目标的电波的单元的雷达装置，用于检测由周围环境引起的波浪干扰的单元，用于控制发送波的调制状态的单元，用于获取调制状态信息的通信单元， 其他雷达装置，以及用于选择这种调制状态以在波干涉检测单元检测到波干扰时避免干扰调制状态信息的单元。

    SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD OF SAME
    8.
    发明申请
    SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD OF SAME 审中-公开
    扫描探针显微镜及其测量方法

    公开(公告)号：US20080245139A1

    公开(公告)日：2008-10-09

    申请号：US12061308

    申请日：2008-04-02

    申请人： Takafumi Morimoto ,  Toru Kurenuma ,  Manabu Edamura ,  Hiroshi Kuroda ,  Yukio Kembo ,  Masahiro Watanabe ,  Shuichi Baba

    发明人： Takafumi Morimoto ,  Toru Kurenuma ,  Manabu Edamura ,  Hiroshi Kuroda ,  Yukio Kembo ,  Masahiro Watanabe ,  Shuichi Baba

    IPC分类号： G01B5/28

    CPC分类号： G01Q10/06 ,  G01Q10/04

    摘要： A measurement method of a scanning probe microscope including a first approach operation adjusting an operation position of a fine positioning unit to near a maximum extension amount and ending the approach by coarse positioning, a first measurement operation making the probe scan the surface for measurement in a close probe state based on the first approach operation to obtain relief information of the sample surface, a positioning operation positioning the probe at a recessed part based on the relief information obtained by the first measurement operation, a second approach operation making the probe again approach the surface at a position determined by the positioning operation, adjusting an operation position of the Z-axis fine positioning device to close to a maximum extension amount, and ending the repeated approach, and a second measurement operation making the probe scan the surface for measurement in a close probe state based on the second approach operation to obtain relief information of the sample surface.

    摘要翻译： 一种扫描探针显微镜的测量方法，包括：将精细定位单元的操作位置调整到最大延伸量附近的第一接近操作，并且通过粗略定位来结束接近;第一测量操作，使得探测器扫描表面以进行测量 基于第一接近操作关闭探针状态以获得样品表面的浮雕信息，基于通过第一测量操作获得的浮雕信息将探针定位在凹陷部分的定位操作，使探针再次接近的第二接近操作 在由定位操作确定的位置处的表面，将Z轴精细定位装置的操作位置调整为接近最大延伸量，并且结束重复进近，以及使探针扫描表面以进行测量的第二测量操作 基于第二种方法操作获得缓解的近距离探测状态 样品表面的信息。

    Method of Control of Probe Scan and Apparatus for Controlling Probe Scan of Scanning Probe Microscope
    9.
    发明申请
    Method of Control of Probe Scan and Apparatus for Controlling Probe Scan of Scanning Probe Microscope 审中-公开
    探针扫描控制方法及扫描探针显微镜探头扫描控制装置

    公开(公告)号：US20080236259A1

    公开(公告)日：2008-10-02

    申请号：US11660271

    申请日：2005-08-18

    申请人： Tooru Kurenuma ,  Yukio Kenbou ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Takafumi Morimoto

    发明人： Tooru Kurenuma ,  Yukio Kenbou ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Takafumi Morimoto

    IPC分类号： G01B5/28

    CPC分类号： G01Q10/065

    摘要： A scanning probe microscope provided with a cantilever 21 having a probe 20 facing a sample 12, a measurement unit 24 measuring a physical quantity occurring between the probe and sample, and movement mechanisms 11, 29 changing a positional relationship between the probe and sample to cause a scanning operation and making the probe scan the surface of the sample by the movement mechanism and measure the surface of the sample by the measurement unit. This method is provided with a step of feeding the probe in a direction along the surface of the sample at a position separate from the surface at certain distances, a step of making the probe approach the sample at each of a plurality of measurement points determined at certain distances and perform measurement to obtain measurement values, then retract, and a step setting a measurement point at a position between a certain measurement point and next measurement point for measurement when a difference between a measurement value at the certain measurement point and a measurement value at the next measurement point is larger than a reference value.

    摘要翻译： 具有悬臂21的扫描探针显微镜，其具有面向样品12的探针20，测量在探针和样品之间发生的物理量的测量单元24和改变探针与样品之间的位置关系的移动机构11,29， 扫描操作并使探针通过移动机构扫描样品的表面，并通过测量单元测量样品的表面。 该方法具有以下步骤：沿着与样品表面在一定距离处分开的位置沿着样品表面的方向进给探针，使得探针在多个测量点中的每一个测量点处接近样品的步骤 一定距离并进行测量以获得测量值，然后缩回，并且当在某个测量点处的测量值与测量值之间的差异时，将某个测量点和下一测量点之间的位置处的测量点设置为测量点 在下一个测量点大于参考值。