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1.
公开(公告)号:US08970051B2
公开(公告)日:2015-03-03
申请号:US13930889
申请日:2013-06-28
IPC分类号: H01L23/52 , H01L23/48 , H01L23/02 , H01L23/488 , H01L21/44 , H01L21/50 , H01L21/768 , H01L23/498
CPC分类号: H01L24/14 , H01L23/3114 , H01L23/49811 , H01L24/05 , H01L24/06 , H01L24/11 , H01L24/13 , H01L25/0657 , H01L2224/03462 , H01L2224/0347 , H01L2224/0401 , H01L2224/05555 , H01L2224/05647 , H01L2224/0603 , H01L2224/113 , H01L2224/11428 , H01L2224/11849 , H01L2224/131 , H01L2224/13111 , H01L2224/1403 , H01L2224/16148 , H01L2224/16225 , H01L2224/16227 , H01L2225/06513 , H01L2225/06517 , H01L2225/06565 , H01L2924/3511 , H01L2924/00014 , H01L2924/014
摘要: A method including forming a contact pad array on an integrated circuit substrate, the contact pad array including a first plurality of contact pads and a second plurality of contact pads, wherein an accessible area of each of the first plurality of contact pads is different than an accessible area of each of the second plurality of contact pads; and depositing solder on the accessible area of the contact pads. An apparatus including an integrated circuit substrate including a body having a nonplanar shape and a surface including a first plurality of contact pads and a second plurality of contact pads, wherein an accessible area of each of the first plurality of contact pads is different than an accessible area of each of the second plurality of contact pads.
摘要翻译: 一种包括在集成电路基板上形成接触焊盘阵列的方法,所述接触焊盘阵列包括第一多个接触焊盘和第二多个接触焊盘,其中所述第一多个接触焊盘中的每一个的可访问区域不同于 第二多个接触垫中的每一个的可访问区域; 以及将焊料沉积在接触垫的可接近区域上。 一种装置,包括集成电路基板,其包括具有非平面形状的主体和包括第一多个接触焊盘和第二多个接触焊盘的表面,其中,所述第一多个接触焊盘中的每一个的可访问区域不同于可访问的 每个第二多个接触垫的面积。
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2.
公开(公告)号:US20150001736A1
公开(公告)日:2015-01-01
申请号:US13931909
申请日:2013-06-29
申请人: Hualiang Shi , Shengquan Ou , Sairam Agraharam , Shan Zhong , Sivakumar Nagarajan , Weihua Tang
发明人: Hualiang Shi , Shengquan Ou , Sairam Agraharam , Shan Zhong , Sivakumar Nagarajan , Weihua Tang
IPC分类号: H01L21/762 , H01L25/065
CPC分类号: H01L25/0657 , H01L21/563 , H01L24/16 , H01L24/17 , H01L24/27 , H01L24/29 , H01L24/30 , H01L24/32 , H01L24/33 , H01L24/48 , H01L24/73 , H01L24/81 , H01L24/83 , H01L24/92 , H01L2224/16145 , H01L2224/16225 , H01L2224/17181 , H01L2224/27312 , H01L2224/27334 , H01L2224/29078 , H01L2224/2919 , H01L2224/2929 , H01L2224/29386 , H01L2224/30051 , H01L2224/30131 , H01L2224/30135 , H01L2224/30151 , H01L2224/30152 , H01L2224/30505 , H01L2224/3201 , H01L2224/32145 , H01L2224/32225 , H01L2224/3301 , H01L2224/33181 , H01L2224/48225 , H01L2224/73104 , H01L2224/73204 , H01L2224/81191 , H01L2224/81192 , H01L2224/81193 , H01L2224/81203 , H01L2224/81815 , H01L2224/83191 , H01L2224/83192 , H01L2224/83203 , H01L2224/8385 , H01L2224/9211 , H01L2225/06513 , H01L2225/06565 , H01L2924/00014 , H01L2924/181 , H01L2924/384 , H01L2924/00012 , H01L2224/81 , H01L2224/83 , H01L2924/00 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
摘要: Die connections are described using different underfill types for different regions. In one example, a first electrically-non-conductive underfill paste (NCP) type is applied to an I/O region of a first die. A second NCP type is applied outside the I/O region of the first die, the second NCP type having more filler than the first NCP type, and the second die is bonded to a first die using the NCP.
摘要翻译: 针对不同区域使用不同的底部填充型描述了模具连接。 在一个示例中,将第一非导电底层填充膏(NCP)类型施加到第一管芯的I / O区域。 第二NCP类型被施加在第一管芯的I / O区域之外,第二NCP类型具有比第一NCP型更多的填充物,并且第二管芯使用NCP结合到第一管芯。
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