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公开(公告)号:US12062631B2
公开(公告)日:2024-08-13
申请号:US17025181
申请日:2020-09-18
Applicant: Intel Corporation
Inventor: Adel A Elsherbini , Krishna Bharath , Kevin P. O'Brien , Kimin Jun , Han Wui Then , Mohammad Enamul Kabir , Gerald S. Pasdast , Feras Eid , Aleksandar Aleksov , Johanna M. Swan , Shawna M. Liff
IPC: H01L23/00 , H01L25/065 , H01L49/02
CPC classification number: H01L24/08 , H01L24/05 , H01L24/29 , H01L24/32 , H01L25/0657 , H01L28/10 , H01L2224/05147 , H01L2224/05639 , H01L2224/05644 , H01L2224/05647 , H01L2224/0801 , H01L2224/08145 , H01L2224/0903 , H01L2224/09055 , H01L2224/09505 , H01L2224/29186 , H01L2224/32145
Abstract: Disclosed herein are microelectronic assemblies including microelectronic components that are coupled together by direct bonding, as well as related structures and techniques. For example, in some embodiments, a microelectronic assembly may include a first microelectronic component and a second microelectronic component coupled to the first microelectronic component by a direct bonding region, wherein the direct bonding region includes at least part of an inductor.
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公开(公告)号:US20230197676A1
公开(公告)日:2023-06-22
申请号:US17557166
申请日:2021-12-21
Applicant: Intel Corporation
Inventor: Gerald S. Pasdast , Adel A. Elsherbini , Nevine Nassif , Carleton L. Molnar , Vivek Kumar Rajan , Peipei Wang , Shawna M. Liff , Tejpal Singh , Johanna M. Swan
IPC: H01L25/065 , H01L23/498
CPC classification number: H01L25/0652 , H01L23/49827 , H01L23/49894 , H01L23/49838
Abstract: A microelectronic assembly is provided, comprising: a first integrated circuit (IC) die having a first connection to a first serializer/deserializer (SERDES) circuit and a second connection to a second SERDES circuit; a second IC die having the first SERDES circuit; and a third IC die having the second SERDES circuit, in which the first IC die is in a first layer, the second IC die and the third IC die are in a second layer not coplanar with the first layer, the first layer and the second layer are coupled by interconnects having a pitch of less than 10 micrometers between adjacent ones of the interconnects, and the first SERDES circuit and the second SERDES circuit are coupled by a conductive pathway.
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公开(公告)号:US20210344354A1
公开(公告)日:2021-11-04
申请号:US17359517
申请日:2021-06-26
Applicant: Intel Corporation
Inventor: Narasimha Lanka , Lakshmipriya Seshan , Debendra Das Sharma , Zuoguo Wu , Gerald S. Pasdast
Abstract: In one embodiment, an apparatus includes PHY circuitry to implement a PHY-based retry technique, e.g., in die-to-die interfaces. The PHY circuitry includes a retry buffer to buffer data provided by the interface controller and error detection code generation circuitry to generate error detection codes based on input data. The PHY circuitry is to implement the retry technique by detecting a stall signal asserted by another apparatus across the channel, causing the error detection code generation circuitry to generate error detection codes based on data in the retry buffer, and transmitting the data from the retry buffer and its corresponding error detection codes across the channel to the other apparatus.
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公开(公告)号:US20200320031A1
公开(公告)日:2020-10-08
申请号:US16779377
申请日:2020-01-31
Applicant: Intel Corporation
Inventor: Zuoguo Wu , Mahesh Wagh , Debendra Das Sharma , Gerald S. Pasdast , Ananthan Ayyasamy , Xiaobei Li , Robert G. Blankenship , Robert J. Safranek
IPC: G06F13/40 , G06F13/42 , G06F13/12 , G06F15/173 , G06F1/10
Abstract: Physical layer logic is provided that is to receive data on one or more data lanes of a physical link, receive a valid signal on another of the lanes of the physical link identifying that valid data is to follow assertion of the valid signal on the one or more data lanes, and receive a stream signal on another of the lanes of the physical link identifying a type of the data on the one or more data lanes.
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公开(公告)号:US20200067816A1
公开(公告)日:2020-02-27
申请号:US16106926
申请日:2018-08-21
Applicant: Intel Corporation
Inventor: Adel A. Elsherbini , Tejpal Singh , Shawna M. Liff , Gerald S. Pasdast , Johanna M. Swan
IPC: H04L12/733 , H04L12/933 , G06F12/0842 , H04L29/06
Abstract: Embodiments herein may relate to a processor package with a substrate and a multi-chip processor coupled with the substrate. The multi-chip processor may include a dual-sided interconnect structure coupled with a first chip, a second chip, and a third chip. The first chip may be communicatively coupled with the second chip by an on-chip communication route. Likewise, the second chip may be communicatively coupled with the first chip by an on-chip communication route. Additionally, the first chip may be communicatively coupled with the third chip by a fast-lane communication route. Other embodiments may be described and/or claimed.
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公开(公告)号:US10552357B2
公开(公告)日:2020-02-04
申请号:US15821492
申请日:2017-11-22
Applicant: Intel Corporation
Inventor: Zuoguo J. Wu , Mahesh Wagh , Debendra Das Sharma , Gerald S. Pasdast , Ananthan Ayyasamy , Xiaobei Li , Robert G. Blankenship , Robert J. Safranek
IPC: G06F13/40 , G06F13/42 , G06F13/12 , G06F15/173 , G06F1/10
Abstract: Physical layer logic is provided that is to receive data on one or more data lanes of a physical link, receive a valid signal on another of the lanes of the physical link identifying that valid data is to follow assertion of the valid signal on the one or more data lanes, and receive a stream signal on another of the lanes of the physical link identifying a type of the data on the one or more data lanes.
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公开(公告)号:US12107060B2
公开(公告)日:2024-10-01
申请号:US17025843
申请日:2020-09-18
Applicant: Intel Corporation
Inventor: Adel A. Elsherbini , Zhiguo Qian , Gerald S. Pasdast , Mohammad Enamul Kabir , Han Wui Then , Kimin Jun , Kevin P. O'Brien , Johanna M. Swan , Shawna M. Liff , Aleksandar Aleksov , Feras Eid
IPC: H01L23/00 , H01L25/065 , H01L49/02
CPC classification number: H01L24/08 , H01L24/05 , H01L24/29 , H01L24/32 , H01L25/0657 , H01L28/10 , H01L2224/05147 , H01L2224/05639 , H01L2224/05644 , H01L2224/05647 , H01L2224/0801 , H01L2224/08145 , H01L2224/0903 , H01L2224/09055 , H01L2224/29186 , H01L2224/32145
Abstract: Disclosed herein are microelectronic assemblies including microelectronic components that are coupled together by direct bonding, as well as related structures and techniques. For example, in some embodiments, a microelectronic assembly may include a first microelectronic component and a second microelectronic component coupled to the first microelectronic component by a direct bonding region, wherein the direct bonding region includes at least part of an inductor.
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公开(公告)号:US11003610B2
公开(公告)日:2021-05-11
申请号:US16779377
申请日:2020-01-31
Applicant: Intel Corporation
Inventor: Zuoguo Wu , Mahesh Wagh , Debendra Das Sharma , Gerald S. Pasdast , Ananthan Ayyasamy , Xiaobel Li , Robert G. Blankenship , Robert J. Safranek
IPC: G06F13/40 , G06F13/42 , G06F13/12 , G06F15/173 , G06F1/10
Abstract: Physical layer logic is provided that is to receive data on one or more data lanes of a physical link, receive a valid signal on another of the lanes of the physical link identifying that valid data is to follow assertion of the valid signal on the one or more data lanes, and receive a stream signal on another of the lanes of the physical link identifying a type of the data on the one or more data lanes.
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公开(公告)号:US10560081B2
公开(公告)日:2020-02-11
申请号:US15632836
申请日:2017-06-26
Applicant: Intel Corporation
Inventor: Mahesh Wagh , Zuoguo J. Wu , Venkatraman Iyer , Gerald S. Pasdast , Todd A. Hinck , David M. Lee , Narasimha R. Lanka
Abstract: In an example, a system and method for centering in a high-performance interconnect (HPI) are disclosed. When an interconnect is powered up from a dormant state, it may be necessary to “center” the clock signal to ensure that data are read at the correct time. A multi-phase method may be used, in which a first phase comprises a reference voltage sweep to identify an optimal reference voltage. A second phase comprises a phase sweep to identify an optimal phase. A third sweep comprises a two-dimensional “eye” phase, in which a plurality of values within a two-dimensional eye derived from the first two sweeps are tested. In each case, the optimal value is the value that results in the fewest bit error across multiple lanes. In one example, the second and third phases are performed in software, and may include testing a “victim” lane, with adjacent “aggressor” lanes having a complementary bit pattern.
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公开(公告)号:US20190238179A1
公开(公告)日:2019-08-01
申请号:US15761408
申请日:2015-09-26
Applicant: Intel Corporation
Inventor: Venkatraman Iyer , Lip Khoon Teh , Mahesh Wagh , Zuoguo Wu , Azydee Hamid , Gerald S. Pasdast
CPC classification number: H04B3/40 , G06F13/20 , G06F13/40 , H04L25/03006 , H04L2025/0377
Abstract: One or more link training signals are received, including instances of a link training pattern, on a plurality of lanes of a physical link that includes at least one valid lane and a plurality of data lanes. The plurality of lanes are trained together using the link training signals to synchronize sampling of the valid lane with sampling of the plurality of data lanes. An active link state is entered and a valid signal received on the valid lane during the active link state. The valid signal includes a signal held at a value for a defined first duration and indicates that data is to be received on the plurality of data lanes in a second defined duration subsequent to the first duration. The data is to be received, during the active link state, on the plurality of data lanes during the second defined duration.
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