MULTIPLE SIZED BUMP BONDS
    3.
    发明申请

    公开(公告)号:US20200035585A1

    公开(公告)日:2020-01-30

    申请号:US15813760

    申请日:2017-11-15

    Abstract: A semiconductor structure and methods for the creation of solder bumps configured to carry a signal and solder bumps configured for ground planes and/or mechanical connections as well as methods for increasing reliability of a chip package generally include formation of multiple sized bump bonds on under bump metallization patterns and/or pads of the same dimension. The signal carrying solder bumps are larger in terms of diameter and bump height than solder bumps configured for ground plane and/or mechanical connections.

    BUMP BONDED CRYOGENIC CHIP CARRIER
    4.
    发明申请

    公开(公告)号:US20190131509A1

    公开(公告)日:2019-05-02

    申请号:US16233873

    申请日:2018-12-27

    Abstract: A device has a first stack of thin films, the first stack of thin films having a first opposing surface and a first connection surface, wherein the first connection surface contacts a first superconducting region; a second stack of thin films, the second stack of thin films having a second opposing surface and a second connection surface, wherein the second connection surface contacts a second superconducting region; and a superconducting bump bond electrically connecting the first and second opposing surfaces, the superconducting bump bond maintaining a low ohmic electrical contact between the first and second opposing surfaces at temperatures below 100 degrees Kelvin, wherein at least one of the first or second superconducting regions comprise material with a melting point of at least 700 degrees Celsius.

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