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1.发明申请Single stage charged particle beam energy width reduction system for charged particle beam system 有权用于带电粒子束系统的单级带电粒子束能量减小系统公开(公告)号：US20070158561A1
公开(公告)日：2007-07-12
申请号：US10571345
申请日：2004-09-02
IPC分类号： G21K7/00
CPC分类号： H01J37/153 , H01J49/288 , H01J49/466 , H01J2237/057 , H01J2237/1534 , H01J2237/2801
摘要： The present invention provides a charged particle beam device. The device comprises a first lens (101; 510) generating a crossover a second lens (102; 512) positioned after the crossover and a element acting in a focusing and dispersive manner in an x-z-plane with a center of the element having essentially same z-position as the crossover. Further, a multipole element, which acts in the x-z-plane and a y-z-plane is provided. A first charged particle selection element and a second charged particle selection element are used for selecting a portion of the charged particles. Thereby, e.g. the energy width of the charged particle beam can be reduced.
摘要翻译： 本发明提供一种带电粒子束装置。 所述装置包括产生交叉的第一透镜（101; 510），所述第二透镜位于所述交叉之后，所述第二透镜（102; 512）位于所述交叉之后，并且所述元件以聚焦和分散方式作用在xz平面中，所述元件的中心具有基本相同 z位置作为交叉。 此外，提供了作用于x-z平面和y-z平面的多极元件。 第一带电粒子选择元件和第二带电粒子选择元件用于选择一部分带电粒子。 因此，例如 可以减少带电粒子束的能量宽度。
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2.发明申请Double Stage Charged Particle Beam Energy Width Reduction System For Charged Particle Beam System 有权用于带电粒子束系统的双级带电粒子束能量减少系统公开(公告)号：US20070200069A1
公开(公告)日：2007-08-30
申请号：US10571347
申请日：2004-09-02
申请人： Jürgen Frosien , Ralf Degenhardt , Stefan Lanio
发明人： Jürgen Frosien , Ralf Degenhardt , Stefan Lanio
IPC分类号： G21K1/08
CPC分类号： H01J37/26 , B82Y10/00 , B82Y40/00 , H01J37/05 , H01J37/153 , H01J37/3174 , H01J2237/057 , H01J2237/1534 , H01J2237/1538
摘要： The present invention relates to e.g. a charged particle beam energy width reduction system for a charged particle beam with a z-axis along the optical axis and a first and a second plane, comprising, a first element (110) acting in a focusing and dispersive manner, a second element (112) acting in a focusing and dispersive manner, a first quadrupole element (410) being positioned such that, in operation, a field of the first quadrupole element overlaps with a field of the first element acting in a focusing and dispersive manner, a second quadrupole element (412) being positioned such that, in operation, a field of the second quadrupole element overlaps with a field of the second element acting in a focusing and dispersive manner, a first charged particle selection element (618) being positioned, in beam direction, before the first element acting in a focusing and dispersive manner, and a second charged particle selection element (616;716) being positioned, in beam direction, after the first element acting in a focusing and dispersive manner. Thereby, a virtually dispersive source-like location without an inherent dispersion limitation can be realized.
摘要翻译： 本发明涉及例如 用于沿着光轴具有z轴的带电粒子束的带电粒子束能量宽度减小系统以及包括以聚焦和分散方式起作用的第一元件（110）的第一和第二平面，第二元件（ 112），第一四极元件（410）被定位成使得在操作中，第一四极元件的场与以聚焦和分散方式作用的第一元件的场重叠，第二四极元件 四极元件（412）被定位成使得在操作中，第二四极元件的场与以聚焦和分散方式作用的第二元件的场重叠，第一带电粒子选择元件（618）被定位成束 方向，在第一元件以聚焦和分散方式作用之前，第二带电粒子选择元件（616; 716）在光束方向上位于第一元件作用于第一元件 聚焦和分散的方式。 因此，可以实现没有固有分散限制的虚拟色散源状位置。
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3.发明授权Double stage charged particle beam energy width reduction system for charged particle beam system 有权用于带电粒子束系统的双级带电粒子束能量减小系统公开(公告)号：US07679054B2
公开(公告)日：2010-03-16
申请号：US10571347
申请日：2004-09-02
申请人： Jürgen Frosien , Ralf Degenhardt , Stefan Lanio
发明人： Jürgen Frosien , Ralf Degenhardt , Stefan Lanio
IPC分类号： H01J49/00
CPC分类号： H01J37/26 , B82Y10/00 , B82Y40/00 , H01J37/05 , H01J37/153 , H01J37/3174 , H01J2237/057 , H01J2237/1534 , H01J2237/1538
摘要： The present invention relates to e.g. a charged particle beam energy width reduction system for a charged particle beam with a z-axis along the optical axis and a first and a second plane, comprising, a first element acting in a focusing and dispersive manner, a second element acting in a focusing and dispersive manner, a first quadrupole element being positioned such that, in operation, a field of the first quadrupole element overlaps with a field of the first element acting in a focusing and dispersive manner, a second quadrupole element being positioned such that, in operation, a field of the second quadrupole element overlaps with a field of the second element acting in a focusing and dispersive manner, a first charged particle selection element being positioned, in beam direction, before the first element acting in a focusing and dispersive manner, and a second charged particle selection element being positioned, in beam direction, after the first element acting in a focusing and dispersive manner. Thereby, a virtually dispersive source-like location without an inherent dispersion limitation can be realized.
摘要翻译： 本发明涉及例如 用于带有沿着光轴的z轴的带电粒子束的带电粒子束能量宽度减小系统以及包括以聚焦和分散方式起作用的第一元件的第一和第二平面， 第一四极元件被定位成使得在操作中，第一四极元件的场与以聚焦和分散方式作用的第一元件的场重叠，第二四极元件被定位成使得在操作中 第二四极元件的场与以聚焦和分散方式作用的第二元件的场重叠，第一带电粒子选择元件沿光束方向定位在第一元件以聚焦和分散方式作用之前，以及 第二带电粒子选择元件在光束方向上位于第一元件以聚焦和分散方式作用之后。 因此，可以实现没有固有分散限制的虚拟色散源状位置。
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4.发明授权Single stage charged particle beam energy width reduction system for charged particle beam system 有权用于带电粒子束系统的单级带电粒子束能量减小系统公开(公告)号：US07468517B2
公开(公告)日：2008-12-23
申请号：US10571345
申请日：2004-09-02
CPC分类号： H01J37/153 , H01J49/288 , H01J49/466 , H01J2237/057 , H01J2237/1534 , H01J2237/2801
摘要： The present invention provides a charged particle beam device. The device comprises a first lens generating a crossover a second lens positioned after the crossover and an element acting in a focusing and dispersive manner in an x-z-plane with a center of the element having essentially same z-position as the crossover. Further, a multipole element, which acts in the x-z-plane and a y-z-plane is provided. A first charged particle selection element and a second charged particle selection element are used for selecting a portion of the charged particles. Thereby, e.g. the energy width of the charged particle beam can be reduced.
摘要翻译： 本发明提供一种带电粒子束装置。 该装置包括产生交叉的第一透镜，位于交叉后的第二透镜和以聚焦和分散方式作用在x-z平面中的元件，其中元件的中心具有与交叉点基本相同的z位置。 此外，提供了作用于x-z平面和y-z平面的多极元件。 第一带电粒子选择元件和第二带电粒子选择元件用于选择一部分带电粒子。 因此，例如 可以减少带电粒子束的能量宽度。
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5.发明授权Charged particle beam energy width reduction system for charged particle beam system 有权带电粒子束系统的带电粒子束能量减少系统公开(公告)号：US07507956B2
公开(公告)日：2009-03-24
申请号：US10571346
申请日：2004-09-02
申请人： Jürgen Frosien , Ralf Degenhardt , Stefan Lanio
发明人： Jürgen Frosien , Ralf Degenhardt , Stefan Lanio
IPC分类号： H01J40/00 , H01J47/00 , H01J3/14 , H01J3/26 , H01J49/42 , H01J1/50 , G21K1/08 , G01K1/08 , G01N23/00 , G21K7/00 , A61N5/00 , G21G5/00
CPC分类号： H01J37/05 , H01J37/153 , H01J2237/057 , H01J2237/1534
摘要： The present invention provides a charged particle beam energy width reduction system. The system comprises a first element acting in a focusing and dispersive manner in an x-z-plane; a second element acting in a focusing and dispersive manner in the x-z-plane; a charged particle selection element positioned between the first and the second element acting in a focusing and dispersive manner; and a focusing element positioned between the first and the second element acting in a focusing and dispersive manner.
摘要翻译： 本发明提供一种带电粒子束能量减少系统。 该系统包括在x-z平面中以聚焦和分散方式起作用的第一元件; 在x-z平面中以聚焦和分散方式起作用的第二元素; 位于第一和第二元件之间的带电粒子选择元件以聚焦和分散的方式起作用; 以及位于第一和第二元件之间的聚焦元件，其以聚焦和分散的方式起作用。
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6.发明申请Charged particle beam energy width reduction system for charged particle beam system 有权带电粒子束系统的带电粒子束能量减小系统公开(公告)号：US20070069150A1
公开(公告)日：2007-03-29
申请号：US10571346
申请日：2004-09-02
申请人： Jürgen Frosien , Ralf Degenhardt , Stefan Lanio
发明人： Jürgen Frosien , Ralf Degenhardt , Stefan Lanio
IPC分类号： H01J1/50
CPC分类号： H01J37/05 , H01J37/153 , H01J2237/057 , H01J2237/1534
摘要： The present invention provides a charged particle beam energy width reduction system. The system comprises a first element (110) acting in a focusing and dispersive manner in an x-z-plane; a second element (112) acting in a focusing and dispersive manner in the x-z-plane; a charged particle selection element (116; 116a; 116b) positioned between the first and the second element acting in a focusing and dispersive manner; and a focusing element (114; 314, 712; 714) positioned between the first and the second element acting in a focusing and dispersive manner.
摘要翻译： 本发明提供一种带电粒子束能量减少系统。 该系统包括以x-z平面聚焦和分散的方式起作用的第一元件（110） 在x-z平面中以聚焦和分散方式起作用的第二元件（112）; 位于第一和第二元件之间的带电粒子选择元件（116; 116a; 116b）以聚焦和分散方式起作用; 以及位于第一和第二元件之间的以聚焦和分散方式起作用的聚焦元件（114; 314,712; 714）。
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公开(公告)号：US07274018B2
公开(公告)日：2007-09-25
申请号：US11396751
申请日：2006-04-03
IPC分类号： H01J37/28
CPC分类号： H01J37/285 , H01J37/265 , H01J37/28 , H01J2237/0435 , H01J2237/049 , H01J2237/2855 , H01J2237/2857
摘要： A charged particle beam apparatus is provided which comprises a charged particle source for producing a primary beam of charged particles, aperture means for collimating said primary beam of charged particles, wherein said aperture means is adapted to switch between a collimation of said primary beam resulting in a width appropriate for serial imaging of a sample as well as a collimation of said primary beam to a width appropriate for parallel imaging of said sample, a condenser lens for condensing said primary beam of charged particles, scanning means for deflecting said primary beam of charged particles, an objective lens for focusing said condensed primary beam, a sectorized detector for detecting a secondary charged particles. Also, several different operation modes of the beam apparatus are described allowing for serial imaging as well as parallel imaging.
摘要翻译： 提供一种带电粒子束装置，其包括用于产生带电粒子的一次束的带电粒子源，用于准直所述带电粒子的一次束的孔径装置，其中所述孔口装置适于在所述主束的准直之间切换，导致 适合于样本的串行成像的宽度以及所述主光束的准直到适合于所述样品的平行成像的宽度;用于聚集所述带电粒子的一次束的聚光透镜;用于偏转所述主要束带电的扫描装置 颗粒，用于聚焦所述冷凝的主光束的物镜，用于检测次级带电粒子的扇形检测器。 此外，描述了束装置的几种不同的操作模式，允许串行成像以及平行成像。
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公开(公告)号：US07429740B2
公开(公告)日：2008-09-30
申请号：US11483804
申请日：2006-07-10
申请人： Carlo Salvesen , Ralf Degenhardt
发明人： Carlo Salvesen , Ralf Degenhardt
IPC分类号： H01J1/50
CPC分类号： H01J37/153 , H01J37/1413 , H01J37/145 , H01J2237/10 , H01J2237/1508 , Y10T29/4902
摘要： An electric-magnetic field-generating element and a multipole element comprising a plurality of these field-generating elements providing for a stable charged particle beam are described. For some embodiments, the electric-magnetic field-generating element includes a pole piece, a yoke to which the pole piece is attached, at least one coil, a vacuum-tight container accommodating the coil(s), and a holder adapted to hold the vacuum-tight container such that the vacuum-tight container is spaced from the pole piece and the yoke.
摘要翻译： 描述了包括提供稳定的带电粒子束的多个这些场产生元件的电磁场产生元件和多极元件。 对于一些实施例，电磁场产生元件包括极片，连接有极片的磁轭，至少一个线圈，容纳线圈的真空密封容器和适于保持 真空密封容器使得真空密封容器与极靴和轭架间隔开。
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公开(公告)号：US07045781B2
公开(公告)日：2006-05-16
申请号：US10759392
申请日：2004-01-16
IPC分类号： H01J37/28
CPC分类号： H01J37/285 , H01J37/265 , H01J37/28 , H01J2237/0435 , H01J2237/049 , H01J2237/2855 , H01J2237/2857
摘要： A charged particle beam apparatus is provided which comprises a charged particle source for producing a primary beam of charged particles, aperture means for collimating said primary beam of charged particles, wherein said aperture means is adapted to switch between a collimation of said primary beam to a width appropriate for serial imaging of a sample as well as a collimation of said primary beam to a width appropriate for parallel imaging of said sample, a condenser lens for condensing said primary beam of charged particles, scanning means for deflecting said primary beam of charged particles, an objective lens for focusing said condensed primary beam, a sectorized detector for detecting a secondary charged particles. Also, several different operation modes of the beam apparatus are described allowing for serial imaging as well as parallel imaging.
摘要翻译： 提供一种带电粒子束装置，其包括用于产生带电粒子的主束的带电粒子源，用于准直所述带电粒子的一次束的孔径装置，其中所述孔口装置适于在所述主光束的准直之间切换 适合于样本的串行成像的宽度以及所述主光束的准直到适合于所述样品的平行成像的宽度，用于聚集所述带电粒子的一次束的聚光透镜，用于偏转所述带电粒子的一次束的扫描装置 用于聚焦所述冷凝的主光束的物镜，用于检测次级带电粒子的扇形检测器。 此外，描述了束装置的几种不同的操作模式，允许串行成像以及平行成像。
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公开(公告)号：US08203119B2
公开(公告)日：2012-06-19
申请号：US11568442
申请日：2005-06-10
申请人： Ralf Degenhardt , Hans-Peter Feuerbaum , Dirk Hambach , Walter Kögler , Harry Munack , Carlo Salvesen
发明人： Ralf Degenhardt , Hans-Peter Feuerbaum , Dirk Hambach , Walter Kögler , Harry Munack , Carlo Salvesen
CPC分类号： H01J37/244 , G01R31/305 , H01J2237/24485 , H01J2237/24585
摘要： The invention provides a charged particle beam device to inspect or structure a specimen with a primary charged particle beam propagating along an optical axis; a beam tube element having a tube voltage; and a retarding field analyzer in the vicinity of the beam tube element to detect secondary charged particles generated by the primary charged particle beam on the specimen. According to the invention, the retarding field analyzer thereby comprises an entrance grid electrode at a second voltage; at least one filter grid electrode at a first voltage; a charged particle detector to detect the secondary charged particles; and at least one further electrode element arranged between the entrance grid electrode and the at least one filter grid electrode. The at least one further electrode element reduces the size of the stray fields regions in the retarding electric field region to improve the energy resolution of the retarding field analyzer. The improvement of the energy resolution is significant, in particular when the beam tube element is part of a high voltage beam tube.
摘要翻译： 本发明提供一种带电粒子束装置，用于沿着光轴传播的初级带电粒子束来检查或构造样本; 具有管电压的束管元件; 以及在束管元件附近的延迟场分析器，以检测由样品上的一次带电粒子束产生的二次带电粒子。 根据本发明，延迟场分析仪由此包括第二电压的入口栅电极; 至少一个第一电压的滤波栅极; 用于检测次级带电粒子的带电粒子检测器; 以及至少一个另外的电极元件，其布置在所述入口栅格电极和所述至少一个滤光栅格电极之间。 至少一个另外的电极元件减小了延迟电场区域中的杂散场区域的尺寸，以提高延迟场分析器的能量分辨率。 能量分辨率的提高是显着的，特别是当束管元件是高压束管的一部分时。
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