摘要:
Sense amplifier configurations for memories are described. In these configurations, the differential inputs are boosted proportional to the respective bitline voltage enabling a low-voltage, reliable, faster sense amplifier operation. Disclosed sense amplifiers are also capable of compensating the threshold mismatch between the sensing transistors.
摘要:
An asymmetric Static Random Access Memory (SRAM) cell is provided. The SRAM cell comprises first and second storage nodes, drive transistors and access transistors. The first and second storage nodes are configured to store complementary voltages. The drive transistors are configured to selectively couple each of the first and second storage nodes to corresponding high and low voltage power supplies, and maintain a first logic state through a feedback loop. The access transistors are configured to selectively couple each of the first and second storage nodes to corresponding first and second bit-lines and maintain a second logic state through relative transistor leakage currents. A method for reading from and writing to the SRAM cell are also provided.
摘要:
A master-slave flip-flop has master and slave latches cascaded between an input and an output. Each latch has two inverters directly connected to one another head to tail. The latches are coupled via a buffer and a clock controlled pass gate. This architecture reduces the number of pass gates and clock lines, improves hold time and enhances I.sub.DDQ -testability with respect to known flip-flops.
摘要:
A bias generator is tested in an I.sub.DDQ -scheme by applying each respective one of the bias voltages to a respective PFET that is individually gated by a respective NFET. This permits measuring the quiescent currents. Any deviation in the bias voltages is translated into a deviation of the quiescent current.
摘要:
The disclosure is directed at energy and/or power recycling techniques for use with portable displays in order to extend battery life for portable displays.
摘要:
Sense amplifier configurations for memories are described. In these configurations, the differential inputs are boosted proportional to the respective bitline voltage enabling a low-voltage, reliable, faster sense amplifier operation. Disclosed sense amplifiers are also capable of compensating the threshold mismatch between the sensing transistors.
摘要:
An offset cancellation scheme for sense amplification is described. The scheme consists of group of transistors which are selectively coupled to high and low voltage levels via multi-phase timing. This results in a voltage level on sensing nodes of interest which are a function of transistor mismatch. The resulting voltage levels act to compensates for the transistor mismatch, thereby improving the reliability of the sense amplifier in the presence of process non-idealities. The offset cancellation scheme is applicable to numerous types of sense amplifiers, amplifiers, and comparators.
摘要:
A Static Random Access Memory (SRAM) cell without dedicated access transistors is described. The SRAM cell comprises a plurality of transistors configured to provide at least a pair of storage nodes for storing complementary logic values represented by corresponding voltages. The transistors comprise at least one bitline transistor, at least on wordline transistor and at least two supply transistors. The bitline transistor is configured to selectively couple one of the storage nodes to at least one corresponding bitline, the bitline for being shared by SRAM cells in one of a common row or column. The wordline transistor is configured to selectively couple another of the storage nodes to at least one corresponding wordline, the wordline for being shared by SRAM cells in the other of the common row or column. The supply transistors are configured to selectively couple corresponding ones of the storage nodes to a supply voltage.
摘要:
A flip-flop circuit is provided with an improved robustness to radiation induced soft errors. The flip-flop cell comprises the following elements. A transfer unit for receiving at least one data signal and at least one clock signal, a storage unit coupled to the transfer unit and a buffer unit coupled to the storage unit. The transfer unit includes a plurality of input nodes adapted to receive said at least one data signal and said at least one clock signal; a first output node for providing a sampled data signal in response to said at least one clock signal and said at least one data signal; and a second output node for providing a sampled inverse data signal, the sampled inverse data signal provided in response to said at least one clock signal and said at least one data signal. The storage unit comprises a first and a second storage nodes configured to receive and store the sampled data signal and the sampled inverse data signal. The storage unit comprises drive transistors configured to selectively couple one of the first and second storage nodes to ground; load transistors configured to selectively couple the other one of the first and second storage nodes to a power supply; and at least one stabilizer transistor configured to provide a corresponding redundant storage node and limit feedback between the first and second storage nodes, the redundant storage node being capable of restoring the first or second storage nodes in case of a soft error. The buffer unit provides an output sampled data signal as received from the storage unit.
摘要:
A method and apparatus for voltage regulation uses, in one aspect, worst-case supply voltages specific to the process split of the integrated device at issue. In another aspect, a two-phase voltage regulation system and method identifies the characterization data pertinent to a family of integrated circuit devices in a first phase, and identifies an associated process split of a candidate integrated circuit device in a second phase. The characterization data from the first phase is then used to provide supply voltages that correspond to target frequencies of operation for the candidate device. In another aspect, a hybrid voltage regulator circuit includes an open loop circuit which automatically identifies the process split of the integrated circuit device and allows a regulator to modify supply voltage based on characterization data specific to that process split, and a closed loop circuit which fine-tunes the supply voltage. In one embodiment, the closed-loop circuit includes a critical path replica for providing estimated frequencies of operation necessary for a critical path in the integrated circuit device. A ring oscillator circuit may be used in one embodiment in the critical path and/or in the open loop circuit.