Method and apparatus for processing a semiconductor wafer using novel final polishing method
    2.
    发明授权
    Method and apparatus for processing a semiconductor wafer using novel final polishing method 有权
    使用新的最终抛光方法处理半导体晶片的方法和装置

    公开(公告)号:US06709981B2

    公开(公告)日:2004-03-23

    申请号:US09928559

    申请日:2001-08-13

    IPC分类号: H01L21461

    摘要: A method of manufacturing a semiconductor wafer includes providing an ingot of semiconductor material, slicing the wafer from the ingot, and processing the wafer to increase parallelism of the front surface and the back surface. A final polishing operation on at least the front surface is performed by positioning the wafer between a first pad and a second pad and obtaining motion of the front and back surfaces of the wafer relative to the first and second pads to maintain parallelism of the front and back surfaces and to produce a finish on at least the front surface of the wafer so that the front surface is prepared for integrated circuit fabrication. In another aspect, the wafer is rinsed by a rinsing fluid to increase hydrodynamic lubrication. Other methods are directed to conditioning the polishing pad and to handling wafers after polishing. An apparatus for polishing wafers is also included.

    摘要翻译: 制造半导体晶片的方法包括提供半导体材料锭,从锭切片晶片,以及加工晶片以增加前表面和后表面的平行度。 通过将晶片定位在第一焊盘和第二焊盘之间并且获得晶片的前表面和后表面相对于第一和第二焊盘的运动来实现至少前表面的最终抛光操作,以保持晶片的前表面和第二焊盘的平行度 并且在至少晶片的前表面上产生光洁度,使得前表面准备用于集成电路制造。 在另一方面,通过冲洗流体冲洗晶片以增加流体动力润滑。 其他方法涉及调整抛光垫和抛光后处理晶片。 还包括用于抛光晶片的设备。

    Wafer carrier
    4.
    发明授权
    Wafer carrier 失效
    晶圆载体

    公开(公告)号:US07008308B2

    公开(公告)日:2006-03-07

    申请号:US10442900

    申请日:2003-05-20

    IPC分类号: B24B29/00

    CPC分类号: B24B37/28

    摘要: A wafer carrier for retaining at least one semiconductor wafer in a processing apparatus during a processing operation which removes wafer material by at least one of abrading and chemical reaction. The processing apparatus is adapted for removing wafer material from a front side and a back side of each wafer simultaneously. The carrier includes a plate including wafer contaminating material and having an opening and a thickness. An insert has a thickness and is disposed in the opening for receiving at least one wafer and engaging a peripheral edge of the wafer to hold the wafer as the carrier rotates. The thickness of the insert is significantly greater than the thickness of the plate to inhibit removal of material from the plate and thereby inhibit bulk metal contamination of the wafer.

    摘要翻译: 一种用于在处理操作期间将至少一个半导体晶片保持在处理装置中的晶片载体,其通过研磨和化学反应中的至少一种去除晶片材料。 处理装置适用于同时从每个晶片的前侧和后侧去除晶片材料。 载体包括包括晶片污染材料并具有开口和厚度的板。 插入件具有厚度并且设置在开口中,用于接收至少一个晶片并与晶片的周边边缘接合以在托架旋转时保持晶片。 插入件的厚度显着大于板的厚度,以阻止材料从板上移除,从而抑制晶片的大量金属污染。

    Methods for producing silane
    6.
    发明授权
    Methods for producing silane 有权
    生产硅烷的方法

    公开(公告)号:US08821825B2

    公开(公告)日:2014-09-02

    申请号:US12978209

    申请日:2010-12-23

    IPC分类号: C01B33/04

    摘要: Methods and systems for producing silane that use electrolysis to regenerate reactive components therein are disclosed. The methods and systems may be substantially closed-loop with respect to halogen, an alkali or alkaline earth metal and/or hydrogen.

    摘要翻译: 公开了用于生产使用电解以再生其中的反应性组分的硅烷的方法和系统。 所述方法和系统可以相对于卤素,碱金属或碱土金属和/或氢基本上是闭环的。

    METHODS FOR PRODUCING SILANE
    7.
    发明申请
    METHODS FOR PRODUCING SILANE 有权
    生产硅烷的方法

    公开(公告)号:US20120160702A1

    公开(公告)日:2012-06-28

    申请号:US12978209

    申请日:2010-12-23

    IPC分类号: C25B1/00 C01B33/00

    摘要: Methods and systems for producing silane that use electrolysis to regenerate reactive components therein are disclosed. The methods and systems may be substantially closed-loop with respect to halogen, an alkali or alkaline earth metal and/or hydrogen.

    摘要翻译: 公开了用于生产使用电解以再生其中的反应性组分的硅烷的方法和系统。 所述方法和系统可以相对于卤素,碱金属或碱土金属和/或氢基本上是闭环的。