摘要:
A bin cap for mushroom culture bins for cultivating mushrooms such as shiitake (Lentinus edodes (Berk.) Sing.), Lyophyllum shimeji (Kawam.) Hongo, and the like which includes a housing part 2 including a space S internally for ventilation and having windows 2w for ventilation with a broader open area than the open area of bin mouth Bo, breathable filter part 3 blocking window 2w, and fitting part 4 being installed at the under surface 2d of housing part 2 and being attached to or detached from bin mouth Bo. Thereby, the ventilation is secured and the exhaust of carbon dioxide is promoted.
摘要:
A bin for mushroom culture for cultivating mushrooms such as shiitake that comprises upper half bin 2 and lower half bin 3 so arranged as to be able to elongate and contract by sliding upward and downward when fitted. Fitting part C of upper half bin 2 and lower half bin 3 is so arranged as to form a ventilating route F connecting the inside and outside at an elongated position P2 compared with the most contracted position P1. Thereby, ventilation is performed through ventilating route F and carbon dioxide, which is heavier than air, is exhausted.
摘要:
A redundant computing system is composed of two systems: a first arithmetic processing unit (A-system) and a second arithmetic processing unit (B-system) having the same functions. A diagnosis control unit performs diagnosis of one system while the other system is performing arithmetic processing operation. The diagnosis control unit controls the input to the first and second arithmetic processing units by way of an input control unit according to the diagnosis operation, and an output control unit controls the output from the first and second arithmetic processing units according to the diagnosis result. After termination of the diagnosis, a value is copied from a storage unit of the system which has not been diagnosed to a storage unit of the system which has been diagnosed, and the redundant computing system resumes the redundant operation.
摘要:
A signal measuring device, comprises one set, or a plurality of sets, of measuring unit(s) measuring an object of measurement in synch with a driving clock signal for measurement and outputting result of measurement as first data, and a timing identification unit which, in accordance with a measurement-start command, outputs a value, which differs every period, as second data in synch with a reference signal having a prescribed period and a speed lower than that of the driving clock signal; and a storage unit collecting and successively storing the first data and the second data as one set in synch with the driving clock signal.
摘要:
Current reading means detects an output current of a current source whose output current varies with a variation in temperature and outputs a value proportional to the output current. The temperature of the current source corresponding to the output value of the current reading means which is proportional to the output current of the current source is measured, and a parameter for converting the output value to temperature information is determined from the output value of the current reading means and the measured value of the temperature of the current source corresponding to the output value. The output value of the current reading means is converted to the temperature information using the determined parameter.
摘要:
A semiconductor test apparatus, semiconductor device, and test method are provided that enable the realization of a high-speed delay test. Semiconductor test apparatuses (1a-1c) include: flip-flops (11) each provided with first input terminal SI, second input terminal D, mode terminal SE that accepts a mode signal indicating either a first mode or a second mode, clock terminal CK that accepts a clock signal, and output terminal Q, the flip-flops (11) selecting first input terminal SI when the mode signal indicates the first mode, selecting second input terminal D when the mode signal indicates the second mode, and holding information being received by the input terminal that was selected based on the mode signal in synchronization with the clock signal and supplying as output from output terminal Q; and hold unit 12 that holds a set value and that provides the set value to first input terminal SI.
摘要:
Disclosed is a clock adjusting circuit comprising a phase shifter that receives a clock signal and variably shifts, based on a control signal, respective timing phases of a rising edge and a falling edge of the clock signal; and a control circuit that supplies the control signal to the phase shifter circuit before each edge is output; wherein the clock signal, in which at least one of a period, a duty ratio, jitter and skew/delay of the input clock signal is changed over an arbitrary number of clock cycles, is output.
摘要:
Disclosed is a semiconductor integrated circuit including a first storage circuit and a second storage circuit that respectively store logic levels of an input to the delay circuit and an output of the delay circuit when a logic level of a clock line is changed, and a determination circuit that determines whether or not the results of the first storage circuit and the second storage circuit coincide or not. Even if a transistor or a wiring that constitutes the semiconductor integrated circuit has been degraded due to secular change or the like, a possibility of an anomaly or a failure in one of the operation circuits caused by the degradation can be predicted before the anomaly or the failure occurs.
摘要:
A clock signal dividing circuit in which a dividing ratio is regulated by N/M (M and N are positive integers and satisfy M>N) includes: a variable delay circuit which gives a predetermined delay amount based on a control value to an input clock signal CKI to output an output clock signal CKO; and a variable delay control circuit which cumulatively adds values obtained by subtracting N from M every cycle of the input clock signal CKI, when the addition result is N or more, performs a calculation which subtracts N from the addition result to obtain a calculation result K, and calculates, to a maximum delay amount in the variable delay circuit corresponding to one cycle of the input clock signal CKI, a control value corresponding to a delay amount of K/N of the maximum delay amount to give the control value to the variable delay circuit.
摘要:
[Problems] to provide a CMOS low-noise amplification circuit which can reduce a chip area and design time, and which is easy to be digital-controlled from outside. [Means For Solving the Problems] The amplification circuit includes; an amplification stage (12) which amplifies an input signal up to an intended value; a sample and hold circuit (13) which samples the output signal from the amplification stage (12) by sampling the output signal with a sampling frequency which is at least twice the frequency band of the output signal to convert the output signal to a discrete time signal; a moving average calculation unit (15) which selects and outputs a particular frequency from the discrete time signal outputted from the sample and hold circuit (13) by a moving average operation; and a smoothing filter (17) which smoothes the output signal from the moving average calculation unit (15) and feed it back to the input of the amplification stage (12).