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    Mobile device using short cycle power source
    1.
    发明授权
    Mobile device using short cycle power source 有权
    移动设备使用短周期电源

    公开(公告)号：US08333323B2

    公开(公告)日：2012-12-18

    申请号：US12819671

    申请日：2010-06-21

    Applicant: Neil Richardson ,  James Timothy Sauerwein, Jr. ,  Douglas Hinson ,  Ynjiun Paul Wang

    Inventor： Neil Richardson ,  James Timothy Sauerwein, Jr. ,  Douglas Hinson ,  Ynjiun Paul Wang

    IPC: G06K7/00

    CPC classification number: G06K7/0008 ,  Y10T307/696

    Abstract: A mobile device comprising: a data collection device; a trigger to activate the data collection device; a communication system for wireless communications; a display for displaying information; a processor for controlling software and firmware operation; a keypad for entering data for the processor; a power supply for providing power to the mobile device, the power supply comprising a fuel cell or an ultracapacitor; and a housing for supporting the data collection device, trigger, communication system, display, processor, keypad and power supply.

    Abstract translation: 一种移动设备，包括：数据收集设备; 激活数据采集设备的触发器; 一种用于无线通信的通信系统; 用于显示信息的显示器; 用于控制软件和固件操作的处理器; 用于输入处理器的数据的键盘; 用于向移动设备提供电力的电源，所述电源包括燃料电池或超级电容器; 以及用于支持数据采集装置，触发器，通信系统，显示器，处理器，键盘和电源的外壳。

    Dual probe test structures for semiconductor integrated circuits
    2.
    发明授权
    Dual probe test structures for semiconductor integrated circuits 有权
    半导体集成电路的双探针测试结构

    公开(公告)号：US06636064B1

    公开(公告)日：2003-10-21

    申请号：US09648092

    申请日：2000-08-25

    Applicant: Akella V. S. Satya ,  David L. Adler ,  Neil Richardson ,  Kurt H. Weiner ,  David J. Walker

    Inventor： Akella V. S. Satya ,  David L. Adler ,  Neil Richardson ,  Kurt H. Weiner ,  David J. Walker

    IPC: G01R3128

    CPC classification number: H01L22/34 ,  G01N21/66 ,  G01N21/9501 ,  G01N21/956 ,  G01R31/2884 ,  G01R31/307 ,  H01J2237/2817

    Abstract: Disclosed is a semiconductor die having an upper layer and a lower layer. The die includes a lower test structure formed in the lower metal layer of the semiconductor die. The lower conductive test structure has a first end and a second end, wherein the first end is coupled to a predetermined voltage level. The die also has an insulating layer formed over the lower metal layer and an upper test structure formed in the upper metal layer of the semiconductor die. The upper conductive test structure is coupled with the second end of the lower conductive test structure, and the upper metal layer being formed over the insulating layer. The die further includes at least one probe pad coupled with the upper test structure. Preferably, the first end of the lower test structure is coupled to a nominal ground potential. In another implementation, the upper test structure is a voltage contrast element. In another embodiment, a semiconductor die having a scanning area is disclosed. The semiconductor die includes a first plurality of test structures wherein each of the test structures in the first plurality of test structures is located entirely within the scanning area. The die includes a second plurality of test structures wherein each of the test structures in the first plurality of test structures is located only partially within the scanning area. The first plurality of test structures or the second plurality of test structures has a probe pad coupled to at least one test structure.

    Abstract translation: 公开了具有上层和下层的半导体管芯。 模具包括形成在半导体管芯的下金属层中的下部测试结构。 下导电测试结构具有第一端和第二端，其中第一端耦合到预定的电压电平。 模具还具有形成在下金属层上的绝缘层和形成在半导体管芯的上金属层中的上测试结构。 上导电测试结构与下导电测试结构的第二端耦合，并且上金属层形成在绝缘层上。 芯片还包括与上测试结构耦合的至少一个探针焊盘。 优选地，下测试结构的第一端耦合到标称接地电位。 在另一实施方案中，上测试结构是电压对比元件。 在另一实施例中，公开了具有扫描区域的半导体管芯。 半导体管芯包括第一多个测试结构，其中第一多个测试结构中的每个测试结构完全位于扫描区域内。 模具包括第二多个测试结构，其中第一多个测试结构中的每个测试结构仅部分地位于扫描区域内。 第一多个测试结构或第二多个测试结构具有耦合到至少一个测试结构的探针焊盘。

    Short-charge cordless scanner for retail terminals
    6.
    发明授权
    Short-charge cordless scanner for retail terminals 有权
    用于零售终端的短充电无线扫描仪

    公开(公告)号：US08392260B2

    公开(公告)日：2013-03-05

    申请号：US12871265

    申请日：2010-08-30

    Applicant: Neil Richardson

    Inventor： Neil Richardson

    IPC: G06K7/10

    CPC classification number: G07G1/145 ,  G06K7/10861 ,  G06K7/10881 ,  G06K2017/0067 ,  G06Q20/201 ,  G07G1/0081

    Abstract: A bar code reading terminal includes a cordless optical reader. The optical reader includes a microprocessor, a scan engine coupled to the microprocessor, a hand held housing supporting the scan engine, program memory coupled to the microprocessor, a decode processor circuit coupled to the microprocessor, and a short-cycle energy storage device coupled to the microprocessor. The energy storage device has high power density and low energy density. In one embodiment, the short-cycle energy storage device comprises a power density greater than 1 kW/kg. The bar code reading terminal further includes a base unit having a housing that includes a socket for receiving the hand held housing. The socket has a connector to facilitate transfer of bar code data messages from the hand held optical reader to the base unit. The connector also transfer powers from the base unit to the short-cycle energy storage device.

    Abstract translation: 条形码读取终端包括无绳光学读取器。 光学读取器包括微处理器，耦合到微处理器的扫描引擎，支撑扫描引擎的手持外壳，耦合到微处理器的程序存储器，耦合到微处理器的解码处理器电路以及耦合到 微处理器。 储能装置功率密度高，能量密度低。 在一个实施例中，短周期能量存储装置包括大于1kW / kg的功率密度。 条形码读取终端还包括具有壳体的基座单元，该壳体包括用于接收手持壳体的插座。 插座具有连接器以便于将条形码数据消息从手持式光学读取器传送到基座单元。 连接器还将功率从基本单元传递到短周期能量存储装置。

    Systems and Methods for Managing Wellhead Production
    7.
    发明申请
    Systems and Methods for Managing Wellhead Production 审中-公开
    管理井口生产的系统和方法

    公开(公告)号：US20120209540A1

    公开(公告)日：2012-08-16

    申请号：US13028172

    申请日：2011-02-15

    Applicant: Neil Richardson ,  William Richardson ,  Michael Saltsman ,  Anthony Brownlow

    Inventor： Neil Richardson ,  William Richardson ,  Michael Saltsman ,  Anthony Brownlow

    IPC: G06F19/00

    CPC classification number: E21B41/00 ,  G06Q10/06

    Abstract: A system and method for monitoring and managing wellhead production and costs associated therewith. Electronic equipment is placed at the well head to monitor the volume of product lifted from at a wellhead. The equipment monitors both the volume and the percentage of products lifted and stored at the well head. The status of the separation and the volume can be monitored in real time or on a delayed time basis. The data is displayed on a map and used to identify efficient routes for gathering the lifted product at an appropriate time. The data may be displayed in a user interface which displays desired data in connection with each well head in a represented geographic region.

    Abstract translation: 用于监测和管理井口生产的系统和方法以及与之相关的成本。 电子设备放置在井口，以监测从井口抬起的产品的体积。 该设备监测提升和存储在井口的产品的体积和百分比。 可以实时或延迟时间监控分离状态和体积。 数据显示在地图上，用于识别在适当的时间收集提升的产品的有效路线。 数据可以显示在与所表示的地理区域中的每个井头相关联地显示期望数据的用户界面中。

    Electron beam dose control for scanning electron microscopy and critical dimension measurement instruments
    10.
    发明授权
    Electron beam dose control for scanning electron microscopy and critical dimension measurement instruments 失效
    扫描电子显微镜和关键尺寸测量仪器的电子束剂量控制

    公开(公告)号：US5869833A

    公开(公告)日：1999-02-09

    申请号：US784749

    申请日：1997-01-16

    Applicant: Neil Richardson ,  Farid Askary ,  Stefano E. Concina ,  Kevin M. Monahan ,  David L. Adler

    Inventor： Neil Richardson ,  Farid Askary ,  Stefano E. Concina ,  Kevin M. Monahan ,  David L. Adler

    IPC: H01J37/20 ,  H01J37/147 ,  H01J37/28 ,  H01J37/00

    CPC classification number: H01J37/28 ,  H01J2237/004 ,  H01J2237/2817

    Abstract: A system and method for controlling electron exposure on image specimens by adjusting a raster scan area in-between scan frame cycles. A small, zoomed-in, scan area and the surrounding area are flooded with positive charge for a number of frame cycles between scan frames to reduce the voltage differential between the scan area and surrounding area, thereby reducing the positive charge buildup which tends to obscure small features in scanned images. The peak current into a pixel element on the specimen is reduced by scanning the beam with a line period that is very short compared to regular video. Frames of image data may further be acquired non-sequentially, in arbitrarily programmable patterns. Alternatively, an inert gas can be injected into the scanning electron microscope at the point where the electron beam impinges the specimen to neutralize a charge build-up on the specimen by the ionization of the inert gas by the electron beam.

    Abstract translation: 通过调整扫描帧周期之间的光栅扫描区域来控制图像样本上的电子曝光的系统和方法。 一个小的，放大的扫描区域和周围区域在扫描帧之间的多个帧周期中充满正电荷，以减少扫描区域和周围区域之间的电压差，从而减少倾向于模糊的正电荷积聚 扫描图像中的小功能。 通过以与常规视频相比非常短的线周期扫描光束来减小进入样品中的像素元件的峰值电流。 图像数据的帧可以以任意可编程的模式进一步非依次获取。 或者，可以在电子束照射样品的点处将惰性气体注入到扫描电子显微镜中，以通过电子束电离惰性气体来中和样品上的电荷积累。

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