Production of platinum particle nucleic acid composite comprising subnanometer size particles
    5.
    发明授权
    Production of platinum particle nucleic acid composite comprising subnanometer size particles 失效
    铂颗粒核酸复合物的生产包括亚纳米尺度颗粒

    公开(公告)号:US08227582B2

    公开(公告)日:2012-07-24

    申请号:US09990049

    申请日:2001-11-21

    IPC分类号: C07H19/00 C07H21/00 C12N15/11

    CPC分类号: H01B1/12

    摘要: The present invention provides an improved process for the direct and selective metallization of nucleic acids via metal nanoparticles produced in-situ in which a nucleic acid specific metal complex is reacted with a nucleic acid to produce a metal complex-nucleic acid conjugate, non-conjugated metal complex and/or non-conjugated by-products are removed, and the metal complex-nucleic acid conjugate is reacted with a reducing agent to produce a metal nanoparticle-nucleic acid composite. The metal nanoparticle-nucleic acid composites may be used, e. g., in the formation of nanowires, for electronic networks and circuits allowing a high density arrangement.

    摘要翻译: 本发明提供了通过原位生产的金属纳米颗粒直接和选择性地金属化核酸的改进方法,其中核酸特异性金属络合物与核酸反应以产生金属络合物 - 核酸缀合物,非共轭 去除金属络合物和/或非共轭副产物,并且使金属络合物 - 核酸缀合物与还原剂反应以产生金属纳米颗粒 - 核酸复合物。 可以使用金属纳米颗粒 - 核酸复合物,例如, 例如,在形成纳米线时,用于允许高密度布置的电子网络和电路。

    Method for defect and conductivity engineering of a conducting nanoscaled structure
    6.
    发明授权
    Method for defect and conductivity engineering of a conducting nanoscaled structure 失效
    导电纳米结构的缺陷和导电工程方法

    公开(公告)号:US06888150B2

    公开(公告)日:2005-05-03

    申请号:US10316722

    申请日:2002-12-11

    CPC分类号: B82Y30/00 B82Y10/00

    摘要: The invention relates to a method for defect and conductivity engineering of an individual part in a conducting nanoscaled structure by generating heat-induced migration, melting, sputtering and/or evaporation of conductive material of the nanoscaled structure by directing a focussed electron beam on this individual part of the structure to be engineered. The invention further relates to the use of a secondary electron microscope having a filter for detecting back scattered electrons for such a method and a respective secondary electron microscope having such a filter for detecting back scattered electrons.

    摘要翻译: 本发明涉及通过将聚焦的电子束引导到该个体上来产生导热纳米尺度结构中的各个部分的缺陷和导电性工程的方法,该方法通过产生热诱导的纳米尺度结构的导电材料的迁移,熔化,溅射和/或蒸发 部分结构要设计。 本发明还涉及具有用于检测这种方法的背散射电子的滤波器的二次电子显微镜的使用和具有用于检测反向散射电子的这种滤波器的二次电子显微镜。