Semiconductor devices
    2.
    发明授权
    Semiconductor devices 失效
    半导体器件

    公开(公告)号:US3918070A

    公开(公告)日:1975-11-04

    申请号:US41943573

    申请日:1973-11-27

    Applicant: PHILIPS CORP

    CPC classification number: H01L29/76816 H01L27/00 H01L27/148

    Abstract: A semiconductor device comprising a charge transfer device having a plurality of storage sites and a plurality of field effect transistors for reading the charge condition at a plurality of said sites. This is accomplished by locating the channels of the field effect transistors below the storage sites to be read and controlling or affecting the size of the channels by the amount of charge stored at the associated sites. Measuring the current through the channel thus indicates the charge level.

    Abstract translation: 一种半导体器件,包括具有多个存储位置的电荷转移装置和用于读取多个所述位置处的充电条件的多个场效应晶体管。 这是通过将场效应晶体管的通道定位在存储位置下方以进行读取和控制,或者通过存储在相关联位置的电荷量来影响通道的大小。 通过通道测量电流表示充电电平。

    Methods of manufacturing semiconductor bodies
    3.
    发明授权
    Methods of manufacturing semiconductor bodies 失效
    制造半导体体的方法

    公开(公告)号:US3865633A

    公开(公告)日:1975-02-11

    申请号:US32435773

    申请日:1973-01-17

    Applicant: PHILIPS CORP

    CPC classification number: H01L21/00 H01L21/263 Y10S438/912 Y10S438/916

    Abstract: In order to provide a semiconductor surface layer of desired properties at a substantially constant depth from all parts of the surface, the body is subjected to bombardment with a beam of energetic particles so as to cause internal crystal damage in the layer over a controlled distance while the semiconductor is maintained at an elevated temperature causing enhanced diffusion of substrate impurities into the layer along the boundary of the damaged zone.

    Abstract translation: 为了从表面的所有部分以基本恒定的深度提供具有所需特性的半导体表面层,用高能粒子束对本体进行轰击,以便在受控距离上引起层中的内部晶体损伤,同时 半导体保持在升高的温度,导致衬底杂质沿受损区域的边界增加到层中。

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