公开(公告)号：US20100238455A1

公开(公告)日：2010-09-23

申请号：US12408121

申请日：2009-03-20

申请人： Peter de Groot

发明人： Peter de Groot

IPC分类号： G01B11/24 ,  G06F15/00

CPC分类号： G01B9/02057 ,  G01B9/02004 ,  G01B9/0201 ,  G01B9/02059 ,  G01B9/02069 ,  G01B9/02083 ,  G01B2290/35

摘要： In certain aspects, disclosed methods include combining reference light reflected from a reference surface with test light reflected from a test surface to form combined light, the test and reference light being derived from a common source, sinusoidally varying a phase between the test light and reference light, where the sinusoidal phase variation has an amplitude u, recording at least one interference signal related to changes in an intensity of the combined light in response to the sinusoidal variation of the phase, determining information related to the phase using a phase shifting algorithm that has a sensitivity that varies as a function of the sinusoidal phase shift amplitude, where the sensitivity of the algorithm at 2 u is 10% or less of the sensitivity of the algorithm at u.

摘要翻译： 在某些方面，所公开的方法包括将从参考表面反射的参考光与从测试表面反射的测试光组合以形成组合光，测试和参考光源自公共源，正弦变化测试光与参考光之间的相位 光，其中正弦相位变化具有振幅u，响应于相位的正弦变化记录与组合光的强度变化相关的至少一个干扰信号，使用相移算法确定与相位相关的信息，该相移算法 具有作为正弦相移幅度的函数的灵敏度，其中算法在2u处的灵敏度为u的算法的灵敏度的10％以下。

公开(公告)号：US20100128280A1

公开(公告)日：2010-05-27

申请号：US12509098

申请日：2009-07-24

申请人： Mark Davidson ,  Jan Liesener ,  Peter de Groot ,  Xavier Colonna de Lega ,  Leslie L. Deck

发明人： Mark Davidson ,  Jan Liesener ,  Peter de Groot ,  Xavier Colonna de Lega ,  Leslie L. Deck

IPC分类号： G01B9/02

CPC分类号： G01B9/0209 ,  G01B9/02007 ,  G01B9/0201 ,  G01B9/02027 ,  G01B9/02039 ,  G01B9/02057 ,  G01B9/02068 ,  G01B9/02077 ,  G01B11/2441 ,  G01B2290/45 ,  G01B2290/70 ,  Y10T29/49002

摘要： In general, in one aspect, the invention features apparatus that includes a broadband scanning interferometry system including interferometer optics for combining test light from a test object with reference light from a reference object to form an interference pattern on a detector, wherein the test and reference light are derived from a common light source. The interferometry system further includes a scanning stage configured to scan an optical path difference (OPD) between the test and reference light from the common source to the detector and a detector system including the detector for recording the interference pattern for each of a series of OPD increments, wherein the frequency of each OPD increment defines a frame rate. The interferometer optics are configured to produce at least two monitor interferometry signals each indicative of changes in the OPD as the OPD is scanned, wherein the detector system is further configured to record the monitor interferometry signals. The apparatus also includes an electronic processor electronically coupled to the detection system and scanning stage and configured to determine information about the OPD increments with sensitivity to perturbations to the OPD increments at frequencies greater than the frame rate.

摘要翻译： 一般来说，一方面，本发明的特征在于，包括宽带扫描干涉测量系统的装置，其包括用于将来自测试对象的测试光与来自参考物体的参考光组合在一起的干涉仪光学元件，以在检测器上形成干涉图案，其中测试和参考 光源自普通光源。 所述干涉测量系统还包括扫描级，其被配置为扫描来自所述公共源的所述测试参考光与所述检测器之间的光程差（OPD）;以及检测器系统，包括用于记录一系列OPD中的每一个的干涉图案的检测器 增量，其中每个OPD增量的频率定义帧速率。 干涉仪光学器件被配置为产生至少两个监视器干涉测量信号，每个监视器干涉测量信号指示当OPD被扫描时OPD的变化，其中检测器系统还被配置为记录监视器干涉测量信号。 该装置还包括电子处理器，其电耦合到检测系统和扫描级，并且被配置为以大于帧速率的频率灵敏地确定对OPD增量的扰动的OPD增量的信息。

公开(公告)号：US20100091296A1

公开(公告)日：2010-04-15

申请号：US12635932

申请日：2009-12-11

申请人： Peter de Groot ,  Leslie L. Deck ,  Carl Zanoni

发明人： Peter de Groot ,  Leslie L. Deck ,  Carl Zanoni

IPC分类号： G01B11/02

CPC分类号： G01B9/02004 ,  G01B9/02002 ,  G01B9/02007 ,  G01B9/02027 ,  G01B9/0209 ,  G01B2290/15 ,  G01B2290/45 ,  G03F7/70775

摘要： System for monitoring a position of one or more optical elements in a projection objective (PO) include a plurality of sensors each configured to receive input light and to form output light, each sensor including a first sensor optic and a second sensor optic, the first sensor optic of at least one of the sensors being affixed to a first PO optical element and the second sensor optic of the at least one sensor being affixed to a support element that positions the first PO optical element within the PO, the first and second sensor optics being configured introduce a first optical path length difference (OPD) between two components of the input light to form the output light, the first OPD being related to the position of the first PO optical element with respect to the support element. The systems also include a plurality of detectors configured to detect the output light from the sensors, a plurality of optical fibers configured to direct the input light to the sensors and to direct the output light from the sensors to the detectors, and an electronic controller in communication with the plurality of detectors, the electronic controller being configured to determine information about the position of the first PO optical element relative to the support element based on the detected output light from the at least one sensor.

摘要翻译： 用于监测投影物镜（PO）中的一个或多个光学元件的位置的系统包括多个传感器，每个传感器被配置为接收输入光并形成输出光，每个传感器包括第一传感器光学元件和第二传感器光学元件 至少一个传感器的传感器光学元件被固定到第一PO光学元件，并且所述至少一个传感器的第二传感器光学元件被固定到将第一PO光学元件定位在PO内的支撑元件，第一和第二传感器 光学器件被配置为在输入光的两个分量之间引入第一光程长度差（OPD）以形成输出光，第一OPD与第一PO光学元件相对于支撑元件的位置有关。 所述系统还包括多个检测器，其被配置为检测来自传感器的输出光，多个光纤被配置为将输入光引导到传感器并将来自传感器的输出光引导到检测器，以及电子控制器 与多个检测器通信，电子控制器被配置为基于来自至少一个传感器的检测到的输出光来确定关于第一PO光学元件相对于支撑元件的位置的信息。

公开(公告)号：US20080165347A1

公开(公告)日：2008-07-10

申请号：US12051531

申请日：2008-03-19

申请人： Peter de Groot ,  Leslie L. Deck ,  Carl A. Zanoni

发明人： Peter de Groot ,  Leslie L. Deck ,  Carl A. Zanoni

IPC分类号： G01N21/00

CPC分类号： G01B9/02004 ,  G01B9/02002 ,  G01B9/02007 ,  G01B9/02027 ,  G01B9/0209 ,  G01B2290/15 ,  G01B2290/45 ,  G03F7/70775

摘要： In general, in one aspect, the invention features a system including a light source, a plurality of interferometers configured to receive light from the light source and to form output light, each interferometer including a first optic and a second optic, the first and second optics configured to be mounted on a first object and a second object, respectively, where first object is moveable with respect to the second object, the first and second optics being configured introduce an optical path length difference (OPD) between two components of the light to form the output light, the OPD being related to the position of the first optic with respect to the second optic. The system further includes a plurality of detectors configured to detect the output light from the interferometers, a modulation apparatus in the optical path between the light source and the detectors, the modulation apparatus being configured to vary an OPD between the two components of the light over a range including OPDs for which a net OPD of the output light from at least one of the interferometers at the detectors is zero, a plurality of waveguides configured to direct light between the interferometers, the modulation apparatus, and the detectors, and an electronic controller in communication with the detectors, the electronic controller being configured to determine information about a position of the first object based on the detected output light from at least one of the interferometers.

摘要翻译： 通常，在一个方面，本发明的特征在于包括光源，多个干涉仪，被配置为从光源接收光并形成输出光，每个干涉仪包括第一光学元件和第二光学元件，第一和第二光学元件 分别被配置为安装在第一物体和第二物体上的光学元件，其中第一物体相对于第二物体可移动，第一和第二光学器件被配置为在第一物体和第二物体的两个部件之间引入光路长度差（OPD） 光以形成输出光，OPD与第一光学器件相对于第二光学元件的位置有关。 该系统还包括多个检测器，其被配置为检测来自干涉仪的输出光，在光源和检测器之间的光路中的调制装置，调制装置被配置为改变光的两个分量之间的OPD 包括OPD的范围，来自检测器中的至少一个干涉仪的输出光的净OPD为零;多个波导，被配置为在干涉仪，调制装置和检测器之间引导光，以及电子控制器 与所述检测器通信，所述电子控制器被配置为基于来自所述干涉仪中的至少一个的检测到的输出光来确定关于所述第一对象的位置的信息。

公开(公告)号：US20080088849A1

公开(公告)日：2008-04-17

申请号：US11758252

申请日：2007-06-05

申请人： XAVIER DE LEGA ,  Peter de Groot

发明人： XAVIER DE LEGA ,  Peter de Groot

IPC分类号： G01B9/02 ,  G01J3/00

CPC分类号： G01B9/02027 ,  G01B9/02043 ,  G01B9/02044 ,  G01B9/02057 ,  G01B9/02074 ,  G01B9/02084 ,  G01B9/02088 ,  G01B9/0209 ,  G01B2290/45 ,  G01B2290/70 ,  G01N21/211

摘要： Disclosed is an apparatus which includes: an interferometer configured to direct broadband spatially coherent test light to a test surface of a test object over a range of illumination angles and subsequently combine it with reference light to form an interference pattern, the test and reference light being derived from a common source; and multi-element detector; and one or more optics configured to direct at least a portion of the combined light to the detector so that different elements of the detector correspond to different illumination angles of a region of the test surface illuminated by the test light.

摘要翻译： 公开了一种装置，其包括：干涉仪，其被配置为在宽度范围的照射角度下将宽带空间相干测试光引导到测试对象的测试表面，并随后将其与参考光组合以形成干涉图案，所述测试和参考光为 源自一个共同的来源; 多元素检测器; 以及一个或多个光学器件，被配置为将组合的光的至少一部分引导到检测器，使得检测器的不同元件对应于由测试光照射的测试表面的区域的不同照明角度。

公开(公告)号：US20070221072A1

公开(公告)日：2007-09-27

申请号：US11617241

申请日：2006-12-28

申请人： Peter de Groot ,  Brian Caprara

发明人： Peter de Groot ,  Brian Caprara

IPC分类号： A23N4/04

CPC分类号： A23N15/003

摘要： A conveyor system includes a plurality of produce clamps that rotate around a clamp conveyor assembly. On a field side of the conveyor system, a synchronous conveyor belt provides a support for the butt or stem of a plant placed thereon, in between clamps. As the clamp conveyor turns away from the field side, the clamps close and fully support the plants. The conveyor assembly carries the clamps, and the clamped plants, through a series of coring and trimming blades. The clamps then open to release the cored and trimmed product onto a collection conveyor, and the clamps continue to the field side to receive further plants for processing.

摘要翻译： 输送系统包括围绕夹紧输送机组件旋转的多个产品夹具。 在输送系统的场侧，同步输送带为夹在其间的植物的对接或茎杆提供支撑。 当夹具传送带远离场侧时，夹具关闭并完全支撑植物。 输送机组件通过一系列取芯和修剪刀片携带夹具和夹紧的植物。 夹子然后打开以将芯和修剪的产品释放到收集输送机上，并且夹具继续到现场侧以接收另外的植物进行处理。

公开(公告)号：US06463722B1

公开(公告)日：2002-10-15

申请号：US09478918

申请日：2000-01-06

申请人： Peter de Groot

发明人： Peter de Groot

IPC分类号： A01D4526

CPC分类号： A01D45/26 ,  A01D45/28

摘要： The invention is a harvester particularly suited for harvesting baby greens. The harvester generally comprises a chassis with wheels that travel in the furrows between raised beds, a sorting belt assembly, and an articulated connection to a cutting assembly on a floating header. The floating header rides on the top surface of a raised bed and is articulated so that the floating header can move independently of the chassis to follow the contours of the top of the raised bed so that the cutting assembly can cut at a uniform height. The sorting belt assembly includes a series of belts for collecting and sorting the cut baby greens at the easiest and most effective time to do so, immediately after the baby greens are cut and before the baby greens are clumped in storage bins or in other storage containers. The invention further includes a method of using the harvester of the invention in which the forward momentum of the harvester and the density of the crop are used to assist the cut product onto the collection belt.

摘要翻译： 本发明是特别适用于收获幼果蔬菜的收割机。 收割机通常包括具有车轮的底架，轮毂在凸起的床之间的沟槽中，分类带组件以及与浮动接头上的切割组件的铰接连接。 漂浮的头部搭载在升高的床的顶面上并被铰接，使得浮动头部能够独立于底盘移动以跟随凸起床的顶部的轮廓，使得切割组件可以以均匀的高度切割。 分拣皮带组件包括一系列皮带，用于在最简单和最有效的时间收集和分类切割的婴儿蔬菜，以便在婴儿切割后立即将婴儿蔬菜切成小块或其他储存容器 。 本发明还包括使用本发明的收割机的方法，其中收割机的向前动量和作物的密度用于辅助切割产品到收集带上。

公开(公告)号：US06327039B1

公开(公告)日：2001-12-04

申请号：US09252266

申请日：1999-02-18

申请人： Peter de Groot ,  Henry A. Hill ,  Frank C. Demarest

发明人： Peter de Groot ,  Henry A. Hill ,  Frank C. Demarest

IPC分类号： G01B902

CPC分类号： G01B9/02007 ,  G01B9/02002 ,  G01B9/02027 ,  G01B9/02083 ,  G01B2290/60 ,  G01B2290/70

摘要： Apparatus and methods particularly suitable for use in electro-optical metrology and other applications to measure and monitor the refractive index of a gas in a measurement path and/or the change in optical path length of the measurement path due to the gas while the refractive index of the gas may be fluctuating due to turbulence or the like and/or the physical length of the measuring path may be changing. More specifically, the invention employs electronic frequency processing to provide measurements of dispersion of the refractive index, the dispersion being substantially proportional to the density of the gas, and/or measurements of dispersion of the optical path length, the dispersion of the optical path length being related to the dispersion of the refractive index and the physical length of the measurement path. The refractive index of the gas and/or the optical path length effects of the gas are subsequently computed from the measured dispersion of the refractive index and/or the measured dispersion of the optical path length, respectively. The information generated by the inventive apparatus is particularly suitable for use in interferometric distance measuring instruments (DMI) to compensate for errors related to refractive index of gas in a measurement path brought about by environmental effects and turbulence induced by rapid stage slew rates.

摘要翻译： 特别适用于电光计量学和其他应用的测量和监测测量路径中的气体的折射率和/或由于气体导致的测量路径的光路长度的变化的设备和方法，而折射率 的气体可能由于湍流等而波动，和/或测量路径的物理长度可能会改变。 更具体地，本发明采用电子频率处理来提供折射率的色散的测量，该色散基本上与气体的密度成比例，和/或光程长度的色散的测量，光程长度的色散 与折射率的偏差和测量路径的物理长度有关。 随后根据测量的折射率的色散和/或光程长度的测量的色散分别计算气体的折射率和/或光程长度效应。 由本发明装置产生的信息特别适用于干涉测距仪（DMI），以补偿由环境影响引起的测量路径中的气体的折射率和由快速平台压摆率引起的湍流相关的误差。

公开(公告)号：US06249351B1

公开(公告)日：2001-06-19

申请号：US09325175

申请日：1999-06-03

申请人： Peter de Groot

发明人： Peter de Groot

IPC分类号： G01B902

CPC分类号： G01B11/30 ,  G01B9/02004 ,  G01B9/02021 ,  G01B9/02022 ,  G01B9/02039 ,  G01B9/0209 ,  G01B2290/30

摘要： A two-beam interferometer illuminates a sample surface with light at grazing incidence angles for the purpose of analyzing a surface characteristic such as surface topography. The interferometer includes a diffractive-optic beam splitter, which separates an incoming light beam into measurement and reference beams and a diffractive-optic beam combiner, which produces an output beam by interfering portions of the reference beam with reflected portions of the measurement beam. Those portions of the reference wavefront and the measurement wavefront that interfere originate from substantially the same portion of the initial illumination wavefront.

摘要翻译： 双光束干涉仪用扫描入射角的光照射样品表面，以分析表面形貌等表面特性。 干涉仪包括衍射光束分离器，其将入射光束分离成测量和参考光束和衍射光束组合器，其通过将参考光束的部分与测量光束的反射部分相干来产生输出光束。 参考波阵面和干扰测量波阵面的那些部分源自初始照明波阵面的基本上相同的部分。

公开(公告)号：US20100291276A1

公开(公告)日：2010-11-18

申请号：US12820021

申请日：2010-06-21

申请人： Peter de Groot ,  Brian Caprara

发明人： Peter de Groot ,  Brian Caprara

IPC分类号： A23P1/00

CPC分类号： A23N15/003

摘要： A conveyor system includes a plurality of produce clamps that rotate around a clamp conveyor assembly. On a field side of the conveyor system, a synchronous conveyor belt provides a support for the butt or stem of a plant placed thereon, in between clamps. As the clamp conveyor turns away from the field side, the clamps close and fully support the plants. The conveyor assembly carries the clamps, and the clamped plants, through a series of coring and trimming blades. The clamps then open to release the cored and trimmed product onto a collection conveyor, and the clamps continue to the field side to receive further plants for processing.

摘要翻译： 输送系统包括围绕夹紧输送机组件旋转的多个产品夹具。 在输送系统的场侧，同步输送带为夹在其间的植物的对接或茎杆提供支撑。 当夹具传送带远离场侧时，夹具关闭并完全支撑植物。 输送机组件通过一系列取芯和修剪刀片携带夹具和夹紧的植物。 夹子然后打开以将芯和修剪的产品释放到收集输送机上，并且夹具继续到现场侧以接收另外的植物进行处理。