公开(公告)号：US08020906B2

公开(公告)日：2011-09-20

申请号：US12180343

申请日：2008-07-25

申请人： Ralf Schmid ,  Martin Sedlar

发明人： Ralf Schmid ,  Martin Sedlar

IPC分类号： B60R19/34

CPC分类号： B60R19/34

摘要： A crash apparatus, in particular a crash box in a motor vehicle, has a deformation body for absorbing energy in the event of a crash, which body is assembled from two half shells having beads running transversely to the main deformation direction. The two half shells each have outwardly projecting flanges with beads also running transversely to the main deformation direction. The two half shells exclusively press against one another via the contact surfaces lying between the beads of the flanges and are connected to one another in these areas.

摘要翻译： 碰撞装置，特别是机动车辆中的碰撞箱，具有用于在发生碰撞的情况下吸收能量的变形体，所述变形体由具有横向于主变形方向延伸的珠的两个半壳组装。 两个半壳每个都具有向外突出的凸缘，凸缘也横向于主变形方向延伸。 两个半壳通过位于凸缘的凸缘之间的接触表面彼此压靠，并且在这些区域中彼此连接。

公开(公告)号：US08222911B2

公开(公告)日：2012-07-17

申请号：US12296055

申请日：2007-04-04

申请人： Bernhard Gunter Mueller ,  Ralf Schmid ,  Matthias Brunner

发明人： Bernhard Gunter Mueller ,  Ralf Schmid ,  Matthias Brunner

IPC分类号： G01R31/305

CPC分类号： G02F1/1309 ,  G02F2001/136254

摘要： The present invention relates to a device for testing an optoelectronic module, comprising a first source for generating an electromagnetic beam or particle beam, a second source for illuminating the optoelectronic module; and a detector. In addition, a method for testing an optoelectronic module is provided comprising illuminating the optoelectronic module, directing an electromagnetic beam or particle beam and detecting defects in the optoelectronic module. The illumination additional to the electromagnetic beam or particle beam makes defects visible which otherwise would not be detected.

摘要翻译： 本发明涉及一种用于测试光电子模块的装置，包括用于产生电磁束或粒子束的第一源，用于照亮光电子模块的第二源; 和检测器。 此外，提供了一种用于测试光电子模块的方法，包括照亮光电子模块，引导电磁束或粒子束并检测光电子模块中的缺陷。 附加到电磁波束或粒子束的照明使缺陷可见，否则将不会被检测到。

公开(公告)号：US08009299B2

公开(公告)日：2011-08-30

申请号：US11813334

申请日：2006-01-05

申请人： Matthias Brunner ,  Ralf Schmid ,  Bernhard Mueller ,  Axel Wenzel

发明人： Matthias Brunner ,  Ralf Schmid ,  Bernhard Mueller ,  Axel Wenzel

IPC分类号： G01B11/14

CPC分类号： G09G3/006 ,  G01R31/305 ,  G01R31/308 ,  G01R35/005 ,  H01J2237/2826

摘要： The invention relates to a method of calibration of the beam position of a corpuscular beam. A calibration body with structures is used, wherein the structures have a structure period PS in the plain section and within each structure there is a position L intended for the measurement. For the calibration, at least one detection signal each at structures in the plain section of the calibration body is generated, wherein the corpuscular beam is deflected with deflectors on beam target positions L1 with the beam target period P1, which is larger than half of the structure period PS, whereby a basic calibration is used for the control of the deflectors, and wherein the beam target deflections deviate either in the beam target period P1 from the structure period PS and/or in the beam target position L1 from the position L.

摘要翻译： 本发明涉及一种校准红细胞束的束位置的方法。 使用具有结构的校准体，其中结构在平坦部分中具有结构周期PS，并且在每个结构内具有用于测量的位置L. 对于校准，生成校准体的平坦部分中的结构处的至少一个检测信号，其中，粒子束在束目标位置L1上被偏转器偏转，其中光束目标周期P1大于 结构周期PS，由此使用基准校准来控制偏转器，并且其中光束目标偏转在光束目标周期P1中与结构周期PS和/或从位置L的光束目标位置L1偏离。

公开(公告)号：US07973546B2

公开(公告)日：2011-07-05

申请号：US12826635

申请日：2010-06-29

申请人： Fayez E. Abboud ,  Sriram Krishnaswami ,  Benjamin M. Johnston ,  Hung T. Nguyen ,  Matthias Brunner ,  Ralf Schmid ,  John M. White ,  Shinichi Kurita ,  James C. Hunter

发明人： Fayez E. Abboud ,  Sriram Krishnaswami ,  Benjamin M. Johnston ,  Hung T. Nguyen ,  Matthias Brunner ,  Ralf Schmid ,  John M. White ,  Shinichi Kurita ,  James C. Hunter

IPC分类号： G01R31/302 ,  G01R31/305

CPC分类号： H01L21/67748 ,  H01J2237/2811 ,  H01J2237/2817 ,  H01L21/67201 ,  H01L21/67236

摘要： A method for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the method includes transferring a substrate on an end effector relative to a testing platform having a plurality of testing columns coupled thereto, the substrate having a plurality of electronic devices located thereon, and moving the substrate in a single directional axis relative to an optical axis of each of the plurality of testing columns, the single directional axis being substantially orthogonal to the optical axis to define a test area on the substrate, wherein the test area is configured to cover an entire length or an entire width of the substrate such that the testing columns are capable of testing the entire substrate as the substrate is moved through the test area.

摘要翻译： 描述了用于测试形成在大面积基板上的多个电子设备的方法。 在一个实施例中，所述方法包括相对于具有耦合到其上的多个测试柱的测试平台在端部执行器上传送衬底，所述衬底具有位于其上的多个电子器件，并且相对于 所述多个测试列中的每一个的光轴，所述单方向轴基本上垂直于所述光轴，以在所述衬底上限定测试区域，其中所述测试区域被配置为覆盖所述衬底的整个长度或整个宽度 使得当衬底移动通过测试区域时，测试柱能够测试整个衬底。

公开(公告)号：US07256606B2

公开(公告)日：2007-08-14

申请号：US10977510

申请日：2004-10-29

申请人： Axel Wenzel ,  Ralf Schmid ,  Matthias Brunner

发明人： Axel Wenzel ,  Ralf Schmid ,  Matthias Brunner

IPC分类号： G01R31/00 ,  G01R31/307

CPC分类号： G01N23/2251 ,  G02F2001/136254

摘要： The present invention provides a method of electron beam testing of liquid crystal displays comprising non-uniform electrodes having a conductive portion and a dielectric portion. In accordance with methods of the present invention, the diameter of the electron beam is increased so that the beam is less focused, i.e., enlarged or “blurred,” over a non-uniform electrode area. The diameter of the beam is increased so that the beam generates secondary electrons from the conductive portion of the non-uniform electrode area. The configured test beam may be circular, elliptical, or other suitable shapes.

摘要翻译： 本发明提供了包括具有导电部分和电介质部分的不均匀电极的液晶显示器的电子束测试方法。 根据本发明的方法，电子束的直径增加，使得光束在非均匀电极区域上聚焦较少，即扩大或“模糊”。 光束的直径增加，使得光束从非均匀电极区域的导电部分产生二次电子。 配置的测试光束可以是圆形，椭圆形或其他合适的形状。

公开(公告)号：US06894411B2

公开(公告)日：2005-05-17

申请号：US10667017

申请日：2003-09-17

申请人： Ralf Schmid ,  Marco Schmidt

发明人： Ralf Schmid ,  Marco Schmidt

IPC分类号： H02K3/12 ,  H02K3/18 ,  H02K7/00 ,  H02K11/04 ,  H02K11/00

CPC分类号： H02K3/12 ,  B60L1/003 ,  B60L1/02 ,  B60L3/0061 ,  B60L11/14 ,  B60L15/007 ,  B60L15/06 ,  B60L2210/40 ,  B60L2220/50 ,  B60L2240/425 ,  B60L2240/427 ,  H02K3/18 ,  H02K7/006 ,  H02K11/048 ,  H02M7/493 ,  H02P27/06 ,  Y02T10/641 ,  Y02T10/644 ,  Y02T10/70 ,  Y02T10/7077 ,  Y02T10/7241

摘要： An electric machine designed as a starter, generator, or starter-generator for a motor vehicle and presenting a housing, wherein said housing comprises a winding with coils or coil groups including connector heads. It comprises power electronics units with power switch components distributed along the perimeter of the housing, as well as conductor rails connected with power electronics units, and coil exit rails going from a power electronics unit to an associated coil or coil group. Said power electronics units are arranged on the face of the housing in a clearance created by the connector heads, which are located radially outside or inside the connector heads. Said power switch components comprise a contact area and are arranged directly—without inserted electric insulation—on one of the power loops or a coil exit rail.

摘要翻译： 一种被设计为机动车辆的起动机，发电机或起动发电机并且呈现壳体的电机，其中所述壳体包括具有包括连接头的线圈或线圈组的绕组。 它包括具有沿壳体周边分布的电力开关元件的电力电子单元，以及与电力电子单元连接的导体轨道，以及从电力电子单元到相关线圈或线圈组的线圈出口轨道。 所述电力电子单元以由位于连接器头部的径向外侧或内部的连接头​​形成的间隙设置在壳体的表面上。 所述功率开关部件包括接触区域，并且在其中一个功率回路或线圈出口导轨上直接布置而不插入电绝缘。

公开(公告)号：US06697257B1

公开(公告)日：2004-02-24

申请号：US09857802

申请日：2002-04-09

申请人： Kuno Wolf ,  Gerhard Koelle ,  Juergen Zaremba ,  Wolfgang Jacob ,  Alexander Wallrauch ,  Christoph Ruf ,  Ralf Schmid ,  Peter Urbach ,  Bernd Bireckoven ,  Hans-Reiner Krauss ,  Dirk Scholz

发明人： Kuno Wolf ,  Gerhard Koelle ,  Juergen Zaremba ,  Wolfgang Jacob ,  Alexander Wallrauch ,  Christoph Ruf ,  Ralf Schmid ,  Peter Urbach ,  Bernd Bireckoven ,  Hans-Reiner Krauss ,  Dirk Scholz

IPC分类号： H05K720

CPC分类号： H01L25/071 ,  H01L23/5385 ,  H01L2924/0002 ,  H01L2924/00

摘要： Disclosed in a power semiconductor module which includes a stack of carrier substrates, disposed one above the other in multiple layers and provided with at least one conductor track on at least one main surface, in which at least one electronic semiconductor component is disposed between two adjacent carrier substrates of the stack and is contacted electrically and heat-conductively to at least one conductor track of a carrier substrate disposed in the stack above the semiconductor component and to at least one further conductor track of a carrier substrate disposed in the stack below the semiconductor component. To both improve heat output and provide a compact design, the two outer carrier substrates of the stack are embodied as one upper and one lower housing wall of a closed housing part surrounding the at least one semiconductor component, and the interstices between the stacked carrier substrates are tightly closed by an encompassing wall secured to the carrier substrates.

摘要翻译： 公开在一种功率半导体模块中，该功率半导体模块包括一堆载体衬底，多个层叠在另一层之上并且在至少一个主表面上设置有至少一个导体轨道，其中至少一个电子半导体部件设置在两个相邻 并且对于布置在半导体部件上方的堆叠中的载体衬底的至少一个导体轨道和布置在半导体下面的堆叠中的载体衬底的至少一个另外的导体轨道，电性和热导电地接触 零件。 为了提高热输出并提供紧凑的设计，堆叠的两个外部载体衬底被实施为围绕至少一个半导体部件的封闭壳体部分的一个上部和一个下壳体壁，以及堆叠的载体衬底之间的间隙 被固定到载体基底的封闭壁紧密封闭。

公开(公告)号：US20100327162A1

公开(公告)日：2010-12-30

申请号：US12826635

申请日：2010-06-29

申请人： FAYEZ E. ABBOUD ,  Sriram Krishnaswami ,  Benjamin M. Johnston ,  Hung T. Nguyen ,  Matthias Brunner ,  Ralf Schmid ,  John M. White ,  Shinichi Kurita ,  James C. Hunter

发明人： FAYEZ E. ABBOUD ,  Sriram Krishnaswami ,  Benjamin M. Johnston ,  Hung T. Nguyen ,  Matthias Brunner ,  Ralf Schmid ,  John M. White ,  Shinichi Kurita ,  James C. Hunter

IPC分类号： G01N23/00

CPC分类号： H01L21/67748 ,  H01J2237/2811 ,  H01J2237/2817 ,  H01L21/67201 ,  H01L21/67236

摘要： A method and apparatus for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the apparatus performs a test on the substrate in one linear axis in at least one chamber that is slightly wider than a dimension of the substrate to be tested. Clean room space and process time is minimized due to the smaller dimensions and volume of the system.

摘要翻译： 描述了用于测试形成在大面积基板上的多个电子装置的方法和装置。 在一个实施例中，该装置在至少一个室内的一个线性轴线上对衬底进行测试，所述至少一个腔室比待测试衬底的尺寸略宽。 由于系统的尺寸和体积较小，洁净室空间和处理时间被最小化。

公开(公告)号：US07569818B2

公开(公告)日：2009-08-04

申请号：US11684745

申请日：2007-03-12

申请人： Ralf Schmid ,  Thomas Schwedes

发明人： Ralf Schmid ,  Thomas Schwedes

IPC分类号： G01N23/225

CPC分类号： G01R31/305 ,  G09G3/006 ,  G09G3/3648 ,  H01J37/28 ,  H01J2237/2594

摘要： A method and apparatus for reducing or eliminating crosstalk between a plurality of electron beams is described. The plurality of electron beams may produce test areas on a large area substrate that are adjacent wherein secondary electrons from one test area may be detected in an adjacent test area. In one embodiment, the timing of a primary beam emission and detection of secondary electrons from that primary beam is controlled to eliminate or reduce the possibility of detection of secondary electrons from another primary beam.

摘要翻译： 描述了用于减少或消除多个电子束之间的串扰的方法和装置。 多个电子束可以在邻近的大面积衬底上产生测试区域，其中可以在相邻测试区域中检测来自一个测试区域的二次电子。 在一个实施例中，主光束发射的定时和来自该主光束的二次电子的检测被控制以消除或减少从另一个主光束检测二次电子的可能性。

公开(公告)号：US20090179656A1

公开(公告)日：2009-07-16

申请号：US12296055

申请日：2007-04-04

申请人： Bernhard Gunter Mueller ,  Ralf Schmid ,  Matthias Brunner

发明人： Bernhard Gunter Mueller ,  Ralf Schmid ,  Matthias Brunner

IPC分类号： G01R31/305 ,  G01N23/225 ,  G01N21/88

CPC分类号： G02F1/1309 ,  G02F2001/136254

摘要： The present invention relates to a device for testing an optoelectronic module, comprising a first source for generating an electromagnetic beam or particle beam, a second source for illuminating the optoelectronic module; and a detector. In addition, a method for testing an optoelectronic module is provided comprising illuminating the optoelectronic module, directing an electromagnetic beam or particle beam and detecting defects in the optoelectronic module. The illumination additional to the electromagnetic beam or particle beam makes defects visible which otherwise would not be detected.

摘要翻译： 本发明涉及一种用于测试光电子模块的装置，包括用于产生电磁束或粒子束的第一源，用于照亮光电子模块的第二源; 和检测器。 此外，提供了一种用于测试光电子模块的方法，包括照亮光电子模块，引导电磁束或粒子束并检测光电子模块中的缺陷。 附加到电磁波束或粒子束的照明使缺陷可见，否则将不会被检测到。