SENSOR ELEMENT FOR ACQUIRING AT LEAST ONE PROPERTY OF A MEASUREMNT GAS IN A MEASUREMENT GAS COMPARTMENT, AND METHOD FOR THE PRODUCTION THEREOF
    1.
    发明申请
    SENSOR ELEMENT FOR ACQUIRING AT LEAST ONE PROPERTY OF A MEASUREMNT GAS IN A MEASUREMENT GAS COMPARTMENT, AND METHOD FOR THE PRODUCTION THEREOF 审中-公开
    用于在测量气体舱中获取测量气体的至少一种性质的传感器元件及其生产方法

    公开(公告)号:US20170030857A1

    公开(公告)日:2017-02-02

    申请号:US15214057

    申请日:2016-07-19

    申请人: Robert Bosch GmbH

    发明人: Daniel Pantel

    IPC分类号: G01N27/407

    摘要: A sensor element for acquiring at least one property of a measurement gas in a measurement gas compartment, in particular for acquiring a portion of a gas component in the measurement gas or a temperature of the measurement gas, includes a bearer element and at least one solid electrolyte layer. The solid electrolyte layer is situated on the bearer element. The solid electrolyte layer is at least partially epitaxially fashioned. The bearer element has at least one opening, so that the solid electrolyte layer has at least one membrane segment. In addition, a method is provided for producing such a sensor element.

    摘要翻译: 一种用于获取测量气体隔室中的测量气体的至少一个特性的传感器元件,特别是用于获取测量气体中的气体成分的一部分或测量气体的温度,包括承载元件和至少一个固体 电解质层。 固体电解质层位于承载元件上。 固体电解质层至少部分地外延形成。 承载元件具有至少一个开口,使得固体电解质层具有至少一个膜段。 此外,提供了一种用于制造这种传感器元件的方法。

    SEMICONDUCTOR COMPONENT INCLUDING A DIELECTRIC LAYER

    公开(公告)号:US20220238791A1

    公开(公告)日:2022-07-28

    申请号:US17614706

    申请日:2020-06-23

    申请人: Robert Bosch GmbH

    摘要: A semiconductor component that includes at least one dielectric layer and at least one first electrode and one second electrode. A first defect type and a second defect type, which is different from the first defect type, are also present in dielectric layer. The at least two different defect types accumulate at one of the two electrodes as a function of a main operating voltage applied between the first electrode and the second electrode, and of a main operating temperature that is present at characteristic times τ1 and τ2, and generate the maximum changes in barrier height δΦ1 and δΦ2 at the electrodes. τ1 and δΦ1 are associated with the first defect type, and τ2 and δΦ2 are associated with the second defect type. τ1

    GALVANIC CELL AND METHOD FOR PRODUCING A GALVANIC CELL

    公开(公告)号:US20170324120A1

    公开(公告)日:2017-11-09

    申请号:US15525449

    申请日:2015-09-28

    申请人: Robert Bosch GmbH

    摘要: The invention relates to a galvanic cell (2) comprising a housing (4) which is equipped with at least one cell coil or a cell stack and comprising a sensor (16) for detecting the pressure of the galvanic cell (2). The housing (4) has a recess which is formed from a through-opening between an interior and an exterior of the cell (2), and the sensor (16) is arranged outside of the cell (2) so as to be secured directly or indirectly to the cell. The sensor (16), in particular a micro electromechanical system, is in contact with the interior of the galvanic cell (2) via the recess. The invention additionally relates to a method for producing such a galvanic cell (2).

    Galvanic cell and method for producing a galvanic cell

    公开(公告)号:US10700392B2

    公开(公告)日:2020-06-30

    申请号:US15525449

    申请日:2015-09-28

    申请人: Robert Bosch GmbH

    摘要: The invention relates to a galvanic cell (2) comprising a housing (4) which is equipped with at least one cell coil or a cell stack and comprising a sensor (16) for detecting the pressure of the galvanic cell (2). The housing (4) has a recess which is formed from a through-opening between an interior and an exterior of the cell (2), and the sensor (16) is arranged outside of the cell (2) so as to be secured directly or indirectly to the cell. The sensor (16), in particular a micro electromechanical system, is in contact with the interior of the galvanic cell (2) via the recess. The invention additionally relates to a method for producing such a galvanic cell (2).

    ASSEMBLY BODY FOR MICROMIRROR CHIPS, MIRROR DEVICE AND PRODUCTION METHOD FOR A MIRROR DEVICE
    10.
    发明申请
    ASSEMBLY BODY FOR MICROMIRROR CHIPS, MIRROR DEVICE AND PRODUCTION METHOD FOR A MIRROR DEVICE 有权
    用于微镜器件的组装体,镜子器件和用于镜子器件的制造方法

    公开(公告)号:US20170052364A1

    公开(公告)日:2017-02-23

    申请号:US15307433

    申请日:2015-04-27

    申请人: Robert Bosch GmbH

    IPC分类号: G02B26/08 G02B27/00 G02B7/182

    摘要: An assembly body for micromirror chips that partly encloses an internal cavity, the assembly body including at two sides oriented away from one another, at least one respective partial outer wall that is fashioned transparent for a specified spectrum, and the assembly body having at least one first outer opening on which a first micromirror chip can be attached, and a second outer opening on which a second micromirror chip can be attached, in such a way that a light beam passing through the first partial outer wall is capable of being deflected by the first micromirror chip onto the second micromirror chip, and is capable of being deflected by the second micromirror chip through the second partial outer wall. A mirror device and a production method for a mirror device are also described.

    摘要翻译: 一种用于微镜芯片的组件主体,其部分地包围内部空腔,所述组件主体包括彼此远离的两个侧面,至少一个对于特定光谱为透明的相应部分外壁,并且所述组装体具有至少一个 可以安装有第一微反射镜芯片的第一外部开口和可以安装第二微反射镜芯片的第二外部开口,使得穿过第一部分外壁的光束能够被第一外部开口偏转 第一微镜芯片到第二微镜芯片上,并且能够被第二微镜芯片通过第二部分外壁偏转。 还描述了用于镜装置的镜装置和制造方法。