Method of making contact probe
    7.
    发明授权
    Method of making contact probe 有权
    制作接触探针的方法

    公开(公告)号:US09134346B2

    公开(公告)日:2015-09-15

    申请号:US13168136

    申请日:2011-06-24

    摘要: A method of making a contact probe including a step of making a first printed wiring board having a signal electrode and a ground electrode used as a contact part of the contact probe with respect to a measuring object, in which the signal electrode and ground electrode are formed of a metal wiring pattern, and making a second printed wiring board with a coaxial line structure having a shield electrode which encloses a signal line and the surroundings of the signal line through an insulating layer. The signal electrode of the first printed wiring board and the signal line of the second printed wiring board are electrically connected together, and the ground electrode of the first printed wiring board and the shield electrode of the second printed wiring board are electrically connected together.

    摘要翻译: 一种制造接触探针的方法,包括以下步骤:制作具有信号电极和接地电极的第一印刷线路板,所述信号电极和接地电极相对于测量对象用作接触探针的接触部分,其中信号电极和接地电极为 由金属布线图案形成,并且制造具有同轴线结构的第二印刷布线板,其具有通过绝缘层包围信号线和信号线周围的屏蔽电极。 第一印刷电路板的信号电极和第二印刷电路板的信号线电连接在一起,并且第一印刷线路板的接地电极和第二印刷线路板的屏蔽电极电连接在一起。

    CONTACT PROVE AND METHOD OF MAKING THE SAME
    8.
    发明申请
    CONTACT PROVE AND METHOD OF MAKING THE SAME 有权
    联系方式及其制作方法

    公开(公告)号:US20090224781A1

    公开(公告)日:2009-09-10

    申请号:US12297732

    申请日:2007-04-19

    IPC分类号: G01R31/02 B32B37/00 H01R43/00

    摘要: [Problem]To provide a contact probe which can easily be connected with a measurement apparatus electrically, can measure a high speed and high frequency signal with a fine pitch easily and correctly, and can easily cope with signal measurement for a plurality of channels, and a method of making the contact probe. [Means to Solve Problem] It includes a first printed wiring board 3 having a signal electrode 10a and a ground electrode 10b used as a contact part with respect to a measuring object, in which the signal electrode 10a and ground electrode 10b are formed of a metal wiring pattern on a substrate, and a second printed wiring board 2 with a coaxial line structure having shield electrodes 12, 17, 18 which enclose a signal line 15a and the surroundings of the signal line 15a through an insulating layer. The signal electrode 10a of the first printed wiring board 3 and the signal line 15a of the second printed wiring board 2 are electrically connected together, and the ground electrode 10b of the first printed wiring board 3 and the shield electrodes 12, 17, 18 of the second printed wiring board 2 are electrically connected together.

    摘要翻译: [问题]为了提供可以容易地与测量装置电连接的接触探针,可以容易且准确地测量具有细间距的高速和高频信号,并且可以容易地处理多个通道的信号测量,以及 制作接触探针的方法。 解决问题的手段包括:第一印刷线路板3,其具有信号电极10a和接地电极10b,该接地电极用作相对于测量对象的接触部分,其中信号电极10a和接地电极10b由 金属布线图案和具有同轴线结构的第二印刷布线板2,其具有通过绝缘层包围信号线15a和信号线15a的周围的屏蔽电极12,17,18。 第一印刷线路板3的信号电极10a和第二印刷线路板2的信号线15a电连接在一起,第一印刷线路板3的接地电极10b和屏蔽电极12,17,18的 第二印刷线路板2电连接在一起。

    Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe
    9.
    发明授权
    Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe 有权
    接触式探针,用于接触式探针的测量垫以及接触式探头的制造方法

    公开(公告)号:US07227352B2

    公开(公告)日:2007-06-05

    申请号:US11602240

    申请日:2006-11-21

    IPC分类号: G01R31/02 H01R43/00

    摘要: There is provided a contact probe that is smaller than 50 μm in a pitch between a signal electrode and a ground electrode and can correctly conduct a high-speed high-frequency measurement, a measuring pad used for the contact probe, and a method of manufacturing the contact probe. The contact probe includes: a tip member having a signal electrode 10a and a ground electrode 11a that are put into contact with an object to be measured; and a coaxial cable 1 having a core 1b electrically connected to the signal electrode 10a and an outer covering conductor la electrically connected to the ground electrode 11a, wherein the tip member is formed on a printed wiring board 2, and wherein the signal electrode 10a and the ground electrode 11a are constructed of fine coplanar strip lines formed on an insulating board 2a.

    摘要翻译: 提供了在信号电极和接地电极之间以间距小于50um的接触探针,并且可以正确地进行高速高频测量,用于接触探针的测量垫以及制造方法 接触探头。 接触探针包括:具有与被测量物体接触的信号电极10a和接地电极11a的尖端部件; 以及具有电连接到信号电极10a的芯1b和电连接到接地电极11a的外覆盖导体1a的同轴电缆1,其中尖端构件形成在印刷线路板2上,并且其中信号 电极10a和接地电极11a由形成在绝缘板2a上的细共面带状线构成。

    Method of forming micro metal bump
    10.
    发明授权
    Method of forming micro metal bump 有权
    形成微金属凸块的方法

    公开(公告)号:US07767574B2

    公开(公告)日:2010-08-03

    申请号:US12225741

    申请日:2007-03-30

    IPC分类号: H01L21/44

    摘要: The present invention provides a method of forming a micro metal bump, which is capable of stably and industrially forming a micro metal bump, by a gas deposition process, at a prescribed position of a metal part formed on one side surface of a substrate. The method comprises the steps of: forming a straight hole (34) in a mask layer (30) covering one side surface of a substrate (10) on which a wiring pattern (12) is formed, wherein a prescribed position of the wiring pattern (12) is exposed in a bottom surface of the straight hole and the straight hole has an inner wall perpendicular to the one side surface of the substrate (10) and a sharp top opening portion; providing a metal plate, whose area is larger than that of the substrate (10), on the other side surface of the substrate (10) as a heat sink; placing the substrate (10) and the metal plate in a vacuum; forming a tapered metal bump (14) on the exposed surface of the wiring pattern (12), which is exposed in the bottom surface of the straight hole (34), by a gas deposition process, in which metal nanoparticles obtained by evaporating a metal are ejected from a nozzle together with a carrier gas so as to deposit on the prescribed position, with cooling the substrate (10) to a temperature lower than upper temperature limit of resin constituting the mask layer (30), by the metal plate as the heat sink, so as to retain a configuration of the straight hole (34); and removing the mask layer (30) from the one side surface of the substrate so as to complete the tapered metal bump (14) at the prescribed position of the wiring pattern (12).

    摘要翻译: 本发明提供一种通过气相沉积工艺在形成在基板的一个侧表面上的金属部件的规定位置上形成能够稳定地和工业上形成微小金属凸块的微型金属凸块的方法。 该方法包括以下步骤:在覆盖其上形成有布线图案(12)的基板(10)的一个侧表面的掩模层(30)中形成直孔(34),其中布线图案 (12)暴露在直孔的底面上,直孔具有与基板(10)的一个侧面垂直的内壁和尖锐的开口部; 在作为散热器的基板(10)的另一侧表面上设置面积比基板(10)的面积大的金属板; 将基板(10)和金属板放置在真空中; 在通过气相沉积工艺暴露在直孔(34)的底表面中的布线图案(12)的暴露表面上形成锥形金属凸块(14),其中通过蒸发金属 与载气一起从喷嘴喷射,以便沉积在规定位置,通过金属板作为基板(10)冷却至低于构成掩模层(30)的树脂的上限温度的温度 散热器,以保持直孔(34)的构造; 以及从所述基板的一个侧表面去除所述掩模层(30),以在所述布线图案(12)的规定位置处完成所述锥形金属凸块(14)。