Semiconductor device and method of fabricating same

    公开(公告)号:US11658073B2

    公开(公告)日:2023-05-23

    申请号:US17405134

    申请日:2021-08-18

    CPC classification number: H01L21/8234 H01L21/3086 H01L27/088

    Abstract: A semiconductor device includes; a substrate including a first region and a second region adjacent to the first region in a first direction, a pair of active patterns adjacently disposed on the substrate, wherein the pair of active patterns includes a first active pattern extending in the first direction and a second active pattern extending in parallel with the first active pattern, a first gate electrode on the first region and extending in a second direction that intersect the first direction across the first active pattern and the second active pattern, and a second gate electrode on the second region and extending in the second direction across the first active pattern and the second active pattern. A width of the first active pattern is greater on the first region than on the second region, a width of the second active pattern is greater on the first region than on the second region, and an interval between the first active pattern and the second active pattern is constant from the first region to the second region.

    Semiconductor device and method of manufacturing the same

    公开(公告)号:US10468252B2

    公开(公告)日:2019-11-05

    申请号:US16185137

    申请日:2018-11-09

    Inventor: Jongchan Shin

    Abstract: Disclosed are semiconductor devices and methods of manufacturing the same. The method comprises sequentially forming a target layer and a first mask layer on a substrate, patterning the first mask layer to form a first opening in the first mask layer, forming a spacer covering an inner wall of the first opening, forming on the first mask layer a first photoresist pattern having a second opening vertically overlapping at least a portion of the spacer, forming a third opening in the first mask layer that is adjacent to the first opening by using the spacer as a mask to remove a portion of the first mask layer that is exposed to the second opening, and using the first mask layer and the spacer as a mask to pattern the target layer.

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