Micro-conformal templates for nanoimprint lithography
    6.
    发明授权
    Micro-conformal templates for nanoimprint lithography 有权
    用于纳米压印光刻的微型适形模板

    公开(公告)号:US08616873B2

    公开(公告)日:2013-12-31

    申请号:US13014354

    申请日:2011-01-26

    摘要: A micro-conformal nanoimprint lithography template includes a backing layer and a nanopatterned layer adhered to the backing layer. The elastic modulus of the backing layer exceeds the elastic modulus of the nanopatterned layer. The micro-conformal nanoimprint lithography template can be used to form a patterned layer from an imprint resist on a substrate, the substrate having a micron-scale defect, such that an excluded distance from an exterior surface of the micron-scale defect to the patterned layer formed by the nanoimprint lithography template is less than a height of the defect. The nanoimprint lithography template can be used to form multiple imprints with no reduction in feature fidelity.

    摘要翻译: 微型共形纳米压印光刻模板包括背衬层和粘附到背衬层的纳米图案化层。 背衬层的弹性模量超过纳米图案层的弹性模量。 微型共形纳米压印光刻模板可以用于从基底上的抗蚀刻剂形成图案化层,该衬底具有微米级缺陷,使得从微米级缺陷的外表面到图案化的排除距离 由纳米压印光刻模板形成的层小于缺陷的高度。 纳米压印光刻模板可以用于形成多个压印,而不会降低特征保真度。

    Compositions for Dark-Field Polymerization and Method of Using the Same for Imprint Lithography Processes
    8.
    发明申请
    Compositions for Dark-Field Polymerization and Method of Using the Same for Imprint Lithography Processes 失效
    暗场聚合的组合物及其使用印刷光刻工艺的方法

    公开(公告)号:US20080230959A1

    公开(公告)日:2008-09-25

    申请号:US12105704

    申请日:2008-04-18

    IPC分类号: B29C35/08

    摘要: The present invention provides a composition and a method of using the same to form a pattern on a substrate using imprint lithography employing dark-field polymerization. To that end, the composition includes a bis vinyl ether component, and an initiator component that produces an acid in response to radiation. The bis vinyl ether component is reactive to the acid and polymerizes in response thereto.

    摘要翻译: 本发明提供了一种组合物及其使用方法,该组合物及其方法使用使用暗场聚合的压印光刻法在基材上形成图案。 为此,组合物包括双乙烯基醚组分和响应于辐射产生酸的引发剂组分。 双乙烯基醚组分与酸反应并响应于此聚合。

    Self-Aligned Process for Fabricating Imprint Templates Containing Variously Etched Features
    9.
    发明申请
    Self-Aligned Process for Fabricating Imprint Templates Containing Variously Etched Features 有权
    用于制造包含各种蚀刻特征的印记模板的自对准过程

    公开(公告)号:US20070243655A1

    公开(公告)日:2007-10-18

    申请号:US11693236

    申请日:2007-03-29

    IPC分类号: H01L21/467

    摘要: A process that enables coplanarization of the structures that have been created in multiple independent etch steps. The various etches are performed independently by selectively exposing only certain patterns to particular etching conditions. After these structures have been created, it is possible that the various structures will exist at different planes/elevations relative to the template surface. The elevations of the various structures may be adjusted independently by selectively exposing “higher” structures to an anisotropic etch that reduces the overall elevation of the structures, while preserving the structural topography.

    摘要翻译: 能够在多个独立蚀刻步骤中产生的结构共面化的工艺。 通过仅选择性地将某些图案暴露于特定的蚀刻条件来独立地执行各种蚀刻。 在这些结构已被创建之后,可能各种结构将相对于模板表面存在于不同的平面/高度处。 可以通过选择性地将“较高”结构暴露于各向异性蚀刻来独立地调节各种结构的高度,从而降低结构的整体高度,同时保留结构形貌。