Apparatus and Methods for De-Embedding Through Substrate Vias
    6.
    发明申请
    Apparatus and Methods for De-Embedding Through Substrate Vias 审中-公开
    通过基板通孔去嵌入的装置和方法

    公开(公告)号:US20140327005A1

    公开(公告)日:2014-11-06

    申请号:US14332090

    申请日:2014-07-15

    IPC分类号: G01R31/26 H01L23/48

    摘要: An apparatus for de-embedding through substrate vias is provided. The apparatus may include pads on a first side of a substrate are coupled to through vias extending through a substrate, wherein pairs of the through vias are interconnected by transmission lines of varying lengths along a second side of the substrate. The apparatus may further include pairs of pads coupled together by transmission lines of the same varying lengths. Apparatuses may include through vias surrounding a through via device under test. The surrounding through vias are connected to the through via device under test by a backside metal layer. The apparatus may further include a dummy structure having an area equal to an area of the backside metal layer.

    摘要翻译: 提供了一种通过衬底通孔去嵌入的设备。 该设备可以包括在衬底的第一侧上的焊盘通过延伸穿过衬底的通孔耦合,其中通孔对通过沿着衬底的第二侧的不同长度的传输线互连。 该装置还可以包括通过相同变化长度的传输线耦合在一起的成对的焊盘。 装置可以包括围绕通过测试通孔的通孔。 周围通孔通过背面金属层连接到被测试的通孔装置。 该装置还可以包括具有等于背面金属层的面积的面积的虚拟结构。