Method for the formation of silica thin films
    3.
    发明授权
    Method for the formation of silica thin films 有权
    二氧化硅薄膜的形成方法

    公开(公告)号:US06191183B1

    公开(公告)日:2001-02-20

    申请号:US09412219

    申请日:1999-10-05

    IPC分类号: C08J328

    摘要: The instant invention pertains to a composition that can form silica thin films, wherein said composition performs well as a substrate planarizing coating when applied to a substrate and can be converted by exposure to high-energy radiation into silica thin film with an excellent electrical insulating performance. The composition for the formation of silica thin films comprises (A) a hydrogen silsesquioxane resin that contains at least 45 weight % hydrogen silsesquioxane resin with a molecular weight no greater than 1,500; and (B) solvent. A silica thin film is produced by evaporating the solvent (B), and then converting at least a portion of the hydrogen silsesquioxane resin (A) to silica by exposing the surface of the said substrate to high-energy radiation. The preferred substrate is a semiconductor substrate having at least one electrically conductive layer.

    摘要翻译: 本发明涉及可以形成二氧化硅薄膜的组合物,其中所述组合物在施加到基底上时作为基底平面化涂层表现良好,并且可以通过暴露于高能辐射而转化成具有优异电绝缘性能的二氧化硅薄膜 。 用于形成二氧化硅薄膜的组合物包括(A)含有至少45重量%的分子量不超过1500的氢倍半硅氧烷树脂的氢倍半硅氧烷树脂; 和(B)溶剂。 通过蒸发溶剂(B)制备二氧化硅薄膜,然后通过将所述基材的表面暴露于高能辐射而将至少一部分氢倍半硅氧烷树脂(A)转化为二氧化硅。 优选的衬底是具有至少一个导电层的半导体衬底。

    Method for forming insulating thin films
    6.
    发明授权
    Method for forming insulating thin films 失效
    绝缘薄膜的形成方法

    公开(公告)号:US06448175B1

    公开(公告)日:2002-09-10

    申请号:US09656728

    申请日:2000-09-07

    IPC分类号: H01L214763

    CPC分类号: H01L21/316

    摘要: To provide a method for forming insulating thin films that can induce condensation of silanol and dehydration to a high degree at or near ambient pressure. An interlevel dielectric layer is formed on a semiconductor substrate by coating hydrogen silsesquioxane resin onto the substrate and curing the hydrogen silsesquioxane resin to produce an interlevel dielectric layer. This interlevel dielectric layer is then heated at a pressure from 1 to 1,000 torr at a temperature from 150 to 550° C.

    摘要翻译: 提供一种形成绝缘薄膜的方法,该方法可以在环境压力或接近环境压力的情况下高度地引起硅烷醇的冷凝和脱水。通过将氢倍半硅氧烷树脂涂覆到基底上并固化氢倍半硅氧烷,形成在半导体衬底上的层间电介质层 树脂以产生层间介电层。 然后在150至550℃的温度下,将该层间电介质层在1至1000托的压力下加热。