Memory error detection reporting
    3.
    发明申请
    Memory error detection reporting 有权
    内存错误检测报告

    公开(公告)号:US20050132263A1

    公开(公告)日:2005-06-16

    申请号:US10950797

    申请日:2004-09-27

    IPC分类号: G06F11/10 G11C29/00

    CPC分类号: G06F11/1032

    摘要: A memory system or a digital signal processor (DSP) includes single-bit-error detection hardware in its level two (L2) memory controller to mitigate the effects of soft errors. Error detection hardware detects erroneous data that is fetched by the central processing unit and signals the central processing unit. The parity is generated and checked only for whole memory line accesses. This technique is especially useful for cache memory. The central processing unit can query the memory controller as to the specific location that generated the error and decide the next course of action based on the type of data affected.

    摘要翻译: 存储器系统或数字信号处理器(DSP)包括其二级(L2)存储器控制器中的单位错误检测硬件,以减轻软错误的影响。 错误检测硬件检测由中央处理单元取出并向中央处理单元发出信号的错误数据。 仅对整个存储器线路访问生成和检查奇偶校验。 这种技术对缓存特别有用。 中央处理单元可以根据生成错误的特定位置查询存储器控制器,并根据受影响的数据类型决定下一个操作过程。

    Multiple pBIST Controllers
    10.
    发明申请
    Multiple pBIST Controllers 有权
    多个pBIST控制器

    公开(公告)号:US20090172487A1

    公开(公告)日:2009-07-02

    申请号:US11967148

    申请日:2007-12-29

    IPC分类号: G06F11/27

    CPC分类号: G06F11/27

    摘要: A system on a single integrated circuit chip (SoC) includes a plurality of operational circuits to be tested. A plurality of programmable built-in self-test (pBIST) controllers is connected to respective ones of the plurality of operational circuits in a manner that allows the pBIST controllers to test the respective operation circuits in parallel. An interface is connected to each of the plurality of pBIST controllers for connection to an external tester to facilitate programming of each of the plurality of pBIST controllers by the external tester, such that the plurality of pBIST controllers are operable to test the plurality of operational circuits in parallel and report the results of the parallel tests to the external tester, thereby reducing test time.

    摘要翻译: 单个集成电路芯片(SoC)上的系统包括要测试的多个操作电路。 多个可编程内置自检(pBIST)控制器以允许pBIST控制器并行测试各个操作电路的方式连接到多个操作电路中的相应的一个操作电路。 接口连接到多个pBIST控制器中的每一个,用于连接到外部测试器,以便外部测试器对多个pBIST控制器中的每一个进行编程,使得多个pBIST控制器可操作以测试多个操作电路 并行并行测试结果报告给外部测试仪,从而减少测试时间。