Family of Multiplexer/Flip-Flops with Enhanced Testability
    3.
    发明申请
    Family of Multiplexer/Flip-Flops with Enhanced Testability 有权
    具有增强可测性的多路复用器/触发器系列

    公开(公告)号:US20130169332A1

    公开(公告)日:2013-07-04

    申请号:US12796949

    申请日:2010-06-09

    IPC分类号: H03K3/356

    CPC分类号: H03K3/356 H03K3/356052

    摘要: A multibit combined multiplexer and flip-flop circuit has a plurality of bit circuits. Each bit circuit includes and input section, a flip-flop section and a per bit control section. The input sections have inputs for plural of input signals and corresponding input pass gates. The outputs of the input pass gates are connected to the input of the flip-flop section. Each per bit control section includes an inverter for each input terminal. There is a combined control section receiving a clock signal and a control signals for selection of only one of the input signals. The combined control section include a logical AND for each input signal combining the clock signal and the selection signal. The output of each logical AND is connected to the input of a corresponding inverter of each per bit control circuit. The input pass gate are controlled by a corresponding logical AND and said corresponding inverter.

    摘要翻译: 多位组合多路复用器和触发器电路具有多个位电路。 每个位电路包括和输入部分,触发器部分和每位控制部分。 输入部分具有用于多个输入信号和相应的输入传递门的输入。 输入通过门的输出端连接到触发器部分的输入端。 每个位控制部分包括用于每个输入端的反相器。 存在组合控制部分,其接收时钟信号和用于仅选择一个输入信号的控制信号。 组合控制部分包括组合时钟信号和选择信号的每个输入信号的逻辑“与”。 每个逻辑AND的输出连接到每个位每个控制电路的相应反相器的输入端。 输入通道门由对应的逻辑与和相应的反相器控制。

    Family of multiplexer/flip-flops with enhanced testability
    4.
    发明授权
    Family of multiplexer/flip-flops with enhanced testability 有权
    具有增强可测性的多路复用器/触发器系列

    公开(公告)号:US08525565B2

    公开(公告)日:2013-09-03

    申请号:US12796949

    申请日:2010-06-09

    IPC分类号: H03K3/289 H03K3/356

    CPC分类号: H03K3/356 H03K3/356052

    摘要: A multibit combined multiplexer and flip-flop circuit has a plurality of bit circuits. Each bit circuit includes and input section, a flip-flop section and a per bit control section. The input sections have inputs for plural of input signals and corresponding input pass gates. The outputs of the input pass gates are connected to the input of the flip-flop section. Each per bit control section includes an inverter for each input terminal. There is a combined control section receiving a clock signal and a control signals for selection of only one of the input signals. The combined control section include a logical AND for each input signal combining the clock signal and the selection signal. The output of each logical AND is connected to the input of a corresponding inverter of each per bit control circuit. The input pass gate are controlled by a corresponding logical AND and said corresponding inverter.

    摘要翻译: 多位组合多路复用器和触发器电路具有多个位电路。 每个位电路包括和输入部分,触发器部分和每位控制部分。 输入部分具有用于多个输入信号和相应的输入传递门的输入。 输入通过门的输出端连接到触发器部分的输入端。 每个位控制部分包括用于每个输入端的反相器。 存在组合控制部分,其接收时钟信号和用于仅选择一个输入信号的控制信号。 组合控制部分包括组合时钟信号和选择信号的每个输入信号的逻辑“与”。 每个逻辑AND的输出连接到每个位每个控制电路的相应反相器的输入端。 输入通道门由对应的逻辑与和相应的反相器控制。

    Test chain testability in a system for testing tri-state functionality
    5.
    发明授权
    Test chain testability in a system for testing tri-state functionality 有权
    用于测试三态功能的系统中的测试链可测性

    公开(公告)号:US08397112B2

    公开(公告)日:2013-03-12

    申请号:US12969939

    申请日:2010-12-16

    IPC分类号: G01R31/28

    CPC分类号: G01R31/31715

    摘要: An embodiment of the invention provides system for detecting faults on a test chain. A circuit provides a test signal to an input of a test chain. The test chain includes a plurality of buffers connected in series. A register receives a logical value representing the output of the test chain. The register sends the logical value representing the output of the test chain to test circuitry where the value is observed.

    摘要翻译: 本发明的实施例提供了一种用于检测测试链上的故障的系统。 电路向测试链的输入端提供测试信号。 测试链包括串联连接的多个缓冲器。 寄存器接收表示测试链输出的逻辑值。 寄存器将表示测试链的输出的逻辑值发送到测量电路,其中观察到该值。

    THREE-TERM PREDICTIVE ADDER AND/OR SUBTRACTER
    6.
    发明申请
    THREE-TERM PREDICTIVE ADDER AND/OR SUBTRACTER 有权
    三级预测添加剂和/或除草剂

    公开(公告)号:US20130013656A1

    公开(公告)日:2013-01-10

    申请号:US13178508

    申请日:2011-07-08

    IPC分类号: G06F7/503

    CPC分类号: G06F7/57 G06F7/5055 G06F7/506

    摘要: A predictive adder produces the result of incrementing and/or decrementing a sum of A and B by a one-bit constant of the form of the form 2k, where k is a bit position at which the sum is to be incremented or decremented. The predictive adder predicts the ripple portion of bits in the potential sum of the first operand A and the second operand B that would be toggled by incrementing or decrementing the sum A+B by the one-bit constant to generate and indication of the ripple portion of bits in the potential sum. The predictive adder uses the indication of the ripple portion of bits in the potential sum and the carry output generated by evaluating A+B to produce the results of at least one of A+B+2k and A+B−2k.

    摘要翻译: 预测加法器产生将形式为2k的1比特常数递增和/或递减A和B的和的结果,其中k是要递增或递减的比特位置。 预测加法器预测第一操作数A和第二操作数B的电位之和的纹波部分,该第一操作数A和第二操作数B将通过将和A + B递增或递减1比特常数来切换,以产生和指示纹波部分 的位数在电位和。 预测加法器使用电位和中的波纹部分的指示和通过评估A + B产生的进位输出来产生A + B + 2k和A + B-2k中的至少一个的结果。

    Test Chain Testability In a System for Testing Tri-State Functionality
    7.
    发明申请
    Test Chain Testability In a System for Testing Tri-State Functionality 有权
    用于测试三态功能的系统中的测试链可测试性

    公开(公告)号:US20120036408A1

    公开(公告)日:2012-02-09

    申请号:US12969939

    申请日:2010-12-16

    IPC分类号: G06F11/27 G01R31/28

    CPC分类号: G01R31/31715

    摘要: An embodiment of the invention provides system for detecting faults on a test chain. A circuit provides a test signal to an input of a test chain. The test chain includes a plurality of buffers connected in series. A register receives a logical value representing the output of the test chain. The register sends the logical value representing the output of the test chain to test circuitry where the value is observed.

    摘要翻译: 本发明的实施例提供了一种用于检测测试链上的故障的系统。 电路向测试链的输入端提供测试信号。 测试链包括串联连接的多个缓冲器。 寄存器接收表示测试链输出的逻辑值。 寄存器将表示测试链的输出的逻辑值发送到测量电路,其中观察到该值。

    Three-term predictive adder and/or subtracter
    9.
    发明授权
    Three-term predictive adder and/or subtracter 有权
    三项预测加法器和/或减法器

    公开(公告)号:US08713086B2

    公开(公告)日:2014-04-29

    申请号:US13178508

    申请日:2011-07-08

    IPC分类号: G06F7/50

    CPC分类号: G06F7/57 G06F7/5055 G06F7/506

    摘要: A predictive adder produces the result of incrementing and/or decrementing a sum of A and B by a one-bit constant of the form of the form 2k, where k is a bit position at which the sum is to be incremented or decremented. The predictive adder predicts the ripple portion of bits in the potential sum of the first operand A and the second operand B that would be toggled by incrementing or decrementing the sum A+B by the one-bit constant to generate and indication of the ripple portion of bits in the potential sum. The predictive adder uses the indication of the ripple portion of bits in the potential sum and the carry output generated by evaluating A+B to produce the results of at least one of A+B+2k and A+B−2k.

    摘要翻译: 预测加法器产生将形式为2k的1比特常数递增和/或递减A和B的和的结果,其中k是要递增或递减的比特位置。 预测加法器预测第一操作数A和第二操作数B的电位之和的纹波部分,该第一操作数A和第二操作数B将通过将和A + B递增或递减1比特常数来切换,以产生和指示纹波部分 的位数在电位和。 预测加法器使用电位和中的波纹部分的指示和通过评估A + B产生的进位输出来产生A + B + 2k和A + B-2k中的至少一个的结果。