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公开(公告)号:US20060079023A1
公开(公告)日:2006-04-13
申请号:US11281366
申请日:2005-11-18
IPC分类号: H01L21/60
CPC分类号: H01L21/561 , H01L21/563 , H01L23/3121 , H01L24/11 , H01L24/12 , H01L24/13 , H01L24/16 , H01L24/32 , H01L24/45 , H01L24/48 , H01L24/49 , H01L24/73 , H01L24/83 , H01L24/97 , H01L25/0657 , H01L29/0657 , H01L2224/0401 , H01L2224/05553 , H01L2224/05554 , H01L2224/05624 , H01L2224/11 , H01L2224/1134 , H01L2224/13 , H01L2224/13099 , H01L2224/13144 , H01L2224/16225 , H01L2224/2919 , H01L2224/32145 , H01L2224/32225 , H01L2224/45015 , H01L2224/45144 , H01L2224/48091 , H01L2224/48227 , H01L2224/48471 , H01L2224/48624 , H01L2224/4943 , H01L2224/73203 , H01L2224/73204 , H01L2224/73265 , H01L2224/78301 , H01L2224/83191 , H01L2224/83855 , H01L2224/85181 , H01L2224/85186 , H01L2224/97 , H01L2225/0651 , H01L2225/06513 , H01L2225/06517 , H01L2225/06527 , H01L2225/06555 , H01L2225/06586 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01014 , H01L2924/01027 , H01L2924/01028 , H01L2924/01029 , H01L2924/01042 , H01L2924/01047 , H01L2924/0105 , H01L2924/01074 , H01L2924/01078 , H01L2924/01079 , H01L2924/01204 , H01L2924/0132 , H01L2924/014 , H01L2924/0665 , H01L2924/07802 , H01L2924/10162 , H01L2924/12042 , H01L2924/14 , H01L2924/15787 , H01L2924/181 , H01L2924/19103 , H01L2924/19105 , H01L2924/20751 , H01L2924/20752 , H01L2924/20753 , H01L2924/351 , H01L2224/85 , H01L2224/81 , H01L2224/83 , H01L2924/00 , H01L2924/01046 , H01L2924/00012 , H01L2924/00011 , H01L2924/3512 , H01L2224/92247 , H01L2224/4554
摘要: A semiconductor device and a manufacturing method for the same are provided wherein the reliability of connections of fine metal wires connecting a second semiconductor chip to a wiring board can be improved in the case wherein the second semiconductor chip, which is located above the lower, first semiconductor chip, is significantly larger than the first semiconductor chip in a configuration wherein two semiconductor chips are stacked and mounted on a wiring board. In this semiconductor device the rear surface of the first semiconductor chip and the rear surface of the second semiconductor chip are adhered to each other by means of adhesive and the side of the adhesive is inclined from the edge portions of the first semiconductor chip toward the portions of the second semiconductor chip extending from the side of the first semiconductor chip. Therefore, it becomes possible to prevent the occurrence of microcracks in the second semiconductor chip and to prevent the occurrence of defective fine metal wire connections caused by the impact at the time of electrical connection of the second semiconductor chip to the wiring board.
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公开(公告)号:US20060208349A1
公开(公告)日:2006-09-21
申请号:US11392853
申请日:2006-03-30
IPC分类号: H01L23/12
CPC分类号: H01L21/561 , H01L21/563 , H01L23/3121 , H01L24/11 , H01L24/12 , H01L24/13 , H01L24/16 , H01L24/32 , H01L24/45 , H01L24/48 , H01L24/49 , H01L24/73 , H01L24/83 , H01L24/97 , H01L25/0657 , H01L29/0657 , H01L2224/0401 , H01L2224/05553 , H01L2224/05554 , H01L2224/05624 , H01L2224/11 , H01L2224/1134 , H01L2224/13 , H01L2224/13099 , H01L2224/13144 , H01L2224/16225 , H01L2224/2919 , H01L2224/32145 , H01L2224/32225 , H01L2224/45015 , H01L2224/45144 , H01L2224/48091 , H01L2224/48227 , H01L2224/48471 , H01L2224/48624 , H01L2224/4943 , H01L2224/73203 , H01L2224/73204 , H01L2224/73265 , H01L2224/78301 , H01L2224/83191 , H01L2224/83855 , H01L2224/85181 , H01L2224/85186 , H01L2224/97 , H01L2225/0651 , H01L2225/06513 , H01L2225/06517 , H01L2225/06527 , H01L2225/06555 , H01L2225/06586 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01014 , H01L2924/01027 , H01L2924/01028 , H01L2924/01029 , H01L2924/01042 , H01L2924/01047 , H01L2924/0105 , H01L2924/01074 , H01L2924/01078 , H01L2924/01079 , H01L2924/01204 , H01L2924/0132 , H01L2924/014 , H01L2924/0665 , H01L2924/07802 , H01L2924/10162 , H01L2924/12042 , H01L2924/14 , H01L2924/15787 , H01L2924/181 , H01L2924/19103 , H01L2924/19105 , H01L2924/20751 , H01L2924/20752 , H01L2924/20753 , H01L2924/351 , H01L2224/85 , H01L2224/81 , H01L2224/83 , H01L2924/00 , H01L2924/01046 , H01L2924/00012 , H01L2924/00011 , H01L2924/3512 , H01L2224/92247 , H01L2224/4554
摘要: A semiconductor device and a manufacturing method for the same are provided wherein the reliability of connections of fine metal wires connecting a second semiconductor chip to a wiring board can be improved in the case wherein the second semiconductor chip, which is located above the lower, first semiconductor chip, is significantly larger than the first semiconductor chip in a configuration wherein two semiconductor chips are stacked and mounted on a wiring board. In this semiconductor device the rear surface of the first semiconductor chip and the rear surface of the second semiconductor chip are adhered to each other by means of adhesive and the side of the adhesive is inclined from the edge portions of the first semiconductor chip toward the portions of the second semiconductor chip extending from the side of the first semiconductor chip. Therefore, it becomes possible to prevent the occurrence of microcracks in the second semiconductor chip and to prevent the occurrence of defective fine metal wire connections caused by the impact at the time of electrical connection of the second semiconductor chip to the wiring board.
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公开(公告)号:US07087455B2
公开(公告)日:2006-08-08
申请号:US10636595
申请日:2003-08-08
IPC分类号: H01L21/44
CPC分类号: H01L21/561 , H01L21/563 , H01L23/3121 , H01L24/11 , H01L24/12 , H01L24/13 , H01L24/16 , H01L24/32 , H01L24/45 , H01L24/48 , H01L24/49 , H01L24/73 , H01L24/83 , H01L24/97 , H01L25/0657 , H01L29/0657 , H01L2224/0401 , H01L2224/05553 , H01L2224/05554 , H01L2224/05624 , H01L2224/11 , H01L2224/1134 , H01L2224/13 , H01L2224/13099 , H01L2224/13144 , H01L2224/16225 , H01L2224/2919 , H01L2224/32145 , H01L2224/32225 , H01L2224/45015 , H01L2224/45144 , H01L2224/48091 , H01L2224/48227 , H01L2224/48471 , H01L2224/48624 , H01L2224/4943 , H01L2224/73203 , H01L2224/73204 , H01L2224/73265 , H01L2224/78301 , H01L2224/83191 , H01L2224/83855 , H01L2224/85181 , H01L2224/85186 , H01L2224/97 , H01L2225/0651 , H01L2225/06513 , H01L2225/06517 , H01L2225/06527 , H01L2225/06555 , H01L2225/06586 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01014 , H01L2924/01027 , H01L2924/01028 , H01L2924/01029 , H01L2924/01042 , H01L2924/01047 , H01L2924/0105 , H01L2924/01074 , H01L2924/01078 , H01L2924/01079 , H01L2924/01204 , H01L2924/0132 , H01L2924/014 , H01L2924/0665 , H01L2924/07802 , H01L2924/10162 , H01L2924/12042 , H01L2924/14 , H01L2924/15787 , H01L2924/181 , H01L2924/19103 , H01L2924/19105 , H01L2924/20751 , H01L2924/20752 , H01L2924/20753 , H01L2924/351 , H01L2224/85 , H01L2224/81 , H01L2224/83 , H01L2924/00 , H01L2924/01046 , H01L2924/00012 , H01L2924/00011 , H01L2924/3512 , H01L2224/92247 , H01L2224/4554
摘要: A semiconductor device and a manufacturing method for the same are provided wherein the reliability of connections of fine metal wires connecting a second semiconductor chip to a wiring board can be improved in the case wherein the second semiconductor chip, which is located above the lower, first semiconductor chip, is significantly larger than the first semiconductor chip in a configuration wherein two semiconductor chips are stacked and mounted on a wiring board. In this semiconductor device the rear surface of the first semiconductor chip and the rear surface of the second semiconductor chip are adhered to each other by means of adhesive and the side of the adhesive is inclined from the edge portions of the first semiconductor chip toward the portions of the second semiconductor chip extending from the side of the first semiconductor chip. Therefore, it becomes possible to prevent the occurrence of microcracks in the second semiconductor chip and to prevent the occurrence of defective fine metal wire connections caused by the impact at the time of electrical connection of the second semiconductor chip to the wiring board.
摘要翻译: 提供了一种半导体器件及其制造方法,其中在第二半导体芯片位于下部第一半导体芯片的情况下,可以提高连接第二半导体芯片到布线板的细金属线的连接的可靠性 半导体芯片明显大于其中两个半导体芯片堆叠并安装在布线板上的配置中的第一半导体芯片。 在该半导体器件中,第一半导体芯片的后表面和第二半导体芯片的后表面通过粘合剂彼此粘合,并且粘合剂的侧面从第一半导体芯片的边缘部朝向部分 的第二半导体芯片从第一半导体芯片的侧面延伸。 因此,可以防止第二半导体芯片中的微裂纹的发生,并且防止由于第二半导体芯片与布线板的电连接时的冲击而引起的细小金属线连接不良的发生。
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公开(公告)号:US06992396B2
公开(公告)日:2006-01-31
申请号:US10649741
申请日:2003-08-28
申请人: Yoshiyuki Arai , Takashi Yui , Yoshiaki Takeoka , Fumito Itou , Yasutake Yaguchi
发明人: Yoshiyuki Arai , Takashi Yui , Yoshiaki Takeoka , Fumito Itou , Yasutake Yaguchi
IPC分类号: H01L29/40
CPC分类号: H01L23/3128 , H01L21/563 , H01L24/45 , H01L24/48 , H01L24/49 , H01L24/73 , H01L25/0657 , H01L2224/05554 , H01L2224/05599 , H01L2224/16225 , H01L2224/32145 , H01L2224/32225 , H01L2224/45124 , H01L2224/45144 , H01L2224/48227 , H01L2224/49171 , H01L2224/49175 , H01L2224/73204 , H01L2224/73265 , H01L2224/83102 , H01L2224/85399 , H01L2224/92125 , H01L2224/92247 , H01L2225/0651 , H01L2225/06517 , H01L2225/06555 , H01L2225/06582 , H01L2924/00014 , H01L2924/01078 , H01L2924/01079 , H01L2924/15311 , H01L2924/181 , H01L2924/00 , H01L2924/00012 , H01L2224/45015 , H01L2924/207
摘要: A semiconductor device has a substrate having electrode pads, a first semiconductor chip mounted on the substrate with a first adhesion layer interposed therebetween, a second semiconductor chip mounted on the first semiconductor chip with a second adhesion layer interposed therebetween and having electrode pads on the upper surface thereof, wires for bonding the electrode pads of the substrate and the electrode pads of the second semiconductor chip to each other, and a mold resin sealing therein the first and second semiconductor chips and the wires. The peripheral edge portion of the first adhesion layer is protruding outwardly from the first semiconductor chip and the peripheral edge portion of the second semiconductor chip is protruding outwardly beyond the peripheral edge portion of the first semiconductor chip.
摘要翻译: 半导体器件具有具有电极焊盘的衬底,安装在衬底上的第一粘合层的第一半导体芯片,安装在第一半导体芯片上的第二半导体芯片,其间插入有第二粘合层,并且在上部具有电极焊盘 表面,用于将基板的电极焊盘和第二半导体芯片的电极焊盘彼此接合的导线,以及密封第一和第二半导体芯片和电线的模制树脂。 第一粘合层的周缘部从第一半导体芯片向外突出,第二半导体芯片的周缘部向外突出超过第一半导体芯片的周缘部。
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公开(公告)号:US07138706B2
公开(公告)日:2006-11-21
申请号:US10608295
申请日:2003-06-24
申请人: Yoshiyuki Arai , Takashi Yui , Yoshiaki Takeoka , Fumito Itou , Kouichi Yamauchi , Yasutake Yaguchi
发明人: Yoshiyuki Arai , Takashi Yui , Yoshiaki Takeoka , Fumito Itou , Kouichi Yamauchi , Yasutake Yaguchi
IPC分类号: H01L21/44
CPC分类号: H01L21/565 , H01L25/0652 , H01L25/0657 , H01L2224/16145 , H01L2224/16225 , H01L2224/32145 , H01L2224/32225 , H01L2224/32245 , H01L2224/48091 , H01L2224/48225 , H01L2224/48227 , H01L2224/731 , H01L2224/73204 , H01L2224/73207 , H01L2224/73265 , H01L2224/92125 , H01L2225/0651 , H01L2225/06517 , H01L2225/06558 , H01L2225/06568 , H01L2225/06582 , H01L2225/06589 , H01L2924/00014 , H01L2924/01019 , H01L2924/01046 , H01L2924/01078 , H01L2924/01079 , H01L2924/10253 , H01L2924/1815 , H01L2924/18161 , H01L2924/00 , H01L2224/0401
摘要: A semiconductor device with excellent heat dissipation characteristics that can achieve a high reliability when mounted in electronic equipment such as a cellular phone or the like and a method for manufacturing the same are provided. The semiconductor device includes a substrate, a plurality of semiconductor chips mounted on the substrate by stacking one on top of another, and an encapsulation resin layer made of encapsulation resin. Among the plurality of semiconductor chips, a first semiconductor chip as an uppermost semiconductor chip is mounted with a surface thereof on which a circuit is formed facing toward the substrate, and the encapsulation resin layer is formed so that at least a surface of the first semiconductor chip opposite to the surface on which the circuit is formed and a part of side surfaces of the first semiconductor chip are exposed to the outside of the encapsulation resin layer.
摘要翻译: 提供具有优异的散热特性的半导体器件,其在安装在诸如蜂窝电话等的电子设备中时可以实现高可靠性及其制造方法。 半导体器件包括基板,通过在其上顶层叠一个而安装在基板上的多个半导体芯片以及由密封树脂制成的封装树脂层。 在多个半导体芯片中,作为最上半导体芯片的第一半导体芯片的表面安装有面向基板的电路,并且形成密封树脂层,使得至少第一半导体 芯片与形成电路的表面相对,并且第一半导体芯片的一部分侧表面暴露于封装树脂层的外部。
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公开(公告)号:US20060091563A1
公开(公告)日:2006-05-04
申请号:US11282726
申请日:2005-11-21
申请人: Yoshiyuki Arai , Takashi Yui , Yoshiaki Takeoka , Fumito Itou , Yasutake Yaguchi
发明人: Yoshiyuki Arai , Takashi Yui , Yoshiaki Takeoka , Fumito Itou , Yasutake Yaguchi
IPC分类号: H01L23/48
CPC分类号: H01L23/3128 , H01L21/563 , H01L24/45 , H01L24/48 , H01L24/49 , H01L24/73 , H01L25/0657 , H01L2224/05554 , H01L2224/05599 , H01L2224/16225 , H01L2224/32145 , H01L2224/32225 , H01L2224/45124 , H01L2224/45144 , H01L2224/48227 , H01L2224/49171 , H01L2224/49175 , H01L2224/73204 , H01L2224/73265 , H01L2224/83102 , H01L2224/85399 , H01L2224/92125 , H01L2224/92247 , H01L2225/0651 , H01L2225/06517 , H01L2225/06555 , H01L2225/06582 , H01L2924/00014 , H01L2924/01078 , H01L2924/01079 , H01L2924/15311 , H01L2924/181 , H01L2924/00 , H01L2924/00012 , H01L2224/45015 , H01L2924/207
摘要: A semiconductor device has a substrate having electrode pads, a first semiconductor chip mounted on the substrate with a first adhesion layer interposed therebetween, a second semiconductor chip mounted on the first semiconductor chip with a second adhesion layer interposed therebetween and having electrode pads on the upper surface thereof, wires for bonding the electrode pads of the substrate and the electrode pads of the second semiconductor chip to each other, and a mold resin sealing therein the first and second semiconductor chips and the wires. The peripheral edge portion of the first adhesion layer is protruding outwardly from the first semiconductor chip and the peripheral edge portion of the second semiconductor chip is protruding outwardly beyond the peripheral edge portion of the first semiconductor chip.
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