摘要:
A method and apparatus for determining or adjusting a projecting direction of a light beam emitted from an automobile headlight is provided. In a first aspect of the present invention, the peripheral region of a light beam is used in determining its projecting direction. In particular, a region definable in a light pattern of the projected beam having a proportionality relation between log S and I, where S indicates the value of an area having light intensity I or above, is determined and its outer contour or any predetermined point in the contour is used in determining the projecting direction. In a second aspect, apparatus for determining a projecting direction of a light beam emitted from an automobile headlight includes an indicator which automatically indicates a predetermined position of a light pattern of the light beam projected. In a third aspect, there is provided a system for automatically adjusting a projecting direction of a light beam if it deviates from a predetermined direction using a motor engageable with a mounting structure of the headlight.
摘要:
A method and apparatus for determining or adjusting a projecting direction of a light beam emitted from an automobile headlight is provided. In a first aspect of the present invention, the peripheral region of a light beam is used in determining its projecting direction. In particular, a region definable in a light pattern of the projected beam having a proportionality relation between log S and I, where S indicates the value of an area having light intensity I or above, is determined and its outer contour or any predetermined point in the contour is used in determining the projecting direction. In a second aspect, apparatus for determining a projecting direction of a light beam emitted from an automobile headlight includes an indicator which automatically indicates a predetermined position of a light pattern of the light beam projected. In a third aspect, there is provided a system for automatically adjusting a projecting direction of a light beam if it deviates from a predetermined direction using a motor engageable with a mounting structure of the headlight.
摘要:
A method and apparatus for measuring the inclination of the wheels of an automobile is provided. In accordance with one form of the present invention, there is provided a toe angle detecting device including a pair of detector plates which are normally spaced apart from each other to allow the corresponding wheel of the automobile to be located therebetween and which are pressed against the wheel from both sides when activated to determine the inclination of the wheel with respect to the longitudinal center line of the vehicle, i.e., toe angle of the wheel. In another aspect, a particular link mechanism is provided to interconnect four support members on which the four wheels of the automobile are placed, and the link mechanism is structured to determine the direction of the longitudinal center line of the automobile with respect to the reference line of the link mechanism.
摘要:
A roller clamp type wheel examining apparatus includes a support for supporting thereon a wheel of a vehicle to be examined, a plurality of rollers for clamping the wheel supported on the support from both sides thereof and an angle detector for detecting the angle of orientation of the wheel when clamped by the plurality of rollers. The wheel of a vehicle clamped by the rollers on both sides thereof may be driven to rotate around its own rotating axis to thereby examine dynamic characteristics of the wheel. In this case, the support structure should, for example, include a pair of support rollers for supporting thereon the wheel to be examined in a rotatable manner. The support may include a floating table having a flat top support surface and movable in a horizontal plane translationally as well as rotationally, in which case only the dynamic characteristics of the wheel may be examined since the wheel is not rotatable around its rotating axis.
摘要:
A roller clamp type wheel examining apparatus includes a support for supporting thereon a wheel of a vehicle to be examined, a plurality of rollers for clamping the wheel supported on the support from both sides thereof and an angle detector for detecting the angle of orientation of the wheel when clamped by the plurality of rollers. The wheel of a vehicle clamped by the rollers on both sides thereof may be driven to rotate around its own rotating axis to thereby examine dynamic characteristics of the wheel. In this case, the support structure should, for example, include a pair of support rollers for supporting thereon the wheel to be examined in a rotatable manner. The support may include a floating table having a flat top support surface and movable in a horizontal plane translationally as well as rotationally, in which case only the dynamic characteristics of the wheel may be examined since the wheel is not rotatable around its rotating axis.
摘要:
A thin circuit substrate and a circuit module are arranged such that the circuit module includes an IC mounted on a circuit substrate, the IC includes an IC body and an solder bump located on a mounting surface of the IC body, and the circuit substrate includes a substrate including a recess formed by recessing a portion of a mounting surface of the substrate on which the IC is to be mounted, and a terminal protruding from the mounting surface of the substrate. The terminal is to be electrically connected to the solder bump.
摘要:
An object is to provide an artificial vision system ensuring a wide field of view without damaging a retina. In the artificial vision system, a plurality of electrodes (23) are to be implanted so as to stick in an optic papilla of an eye of a patient. A signal for stimulation pulse is generated based on an image captured by an image pick up device (11) to be disposed outside a body of the patient. The electrical stimulation signals outputted from the electrodes (23) based on the signals for stimulation pulse stimulate an optic nerve of the eye, thereby enabling the patient to visually recognize the image from the image pickup device (11).
摘要:
A semiconductor device includes: a semiconductor substrate having a first semiconductor layer and a second semiconductor layer formed on a first surface; a diode having a first electrode and a second electrode; a control pad; a control electrode electrically coupled with the control pad; and an insulation member. The first electrode is formed on a second surface of the first semiconductor layer. The second electrode is formed on the first surface. Current flows between the first electrode and the second electrode. The control pad is arranged on the first surface so that the pad inputs a control signal for controlling an injection amount of a carrier into the first semiconductor layer. The insulation member insulates between the control electrode and the second electrode and between the control electrode and the semiconductor substrate.
摘要:
An electrical part comprising a lead conductor and a sealed vessel including a metal layer, the lead conductor extending from the inside of the sealed vessel to the outside, wherein the lead conductor and the sealed vessel are fusion-bonded through a thermal adhesive layer at the sealing portion, and wherein a softening-resistant layer having through holes made in the thickness direction is provided between the lead conductor and the metal layer at the sealing portion. A nonaqueous electrolyte cell comprising an electrode and a nonaqueous electrolyte both enclosed inside the sealed vessel. A sealed vessel and a lead conductor having an insulating coating layer, both of which can be used in the electrical part or the like.
摘要:
In a method of manufacturing a semiconductor device, a semiconductor substrate of a first conductivity type having first and second surfaces is prepared. Second conductivity type impurities for forming a collector layer are implanted to the second surface using a mask that has an opening at a portion where the collector layer will be formed. An oxide layer is formed by enhanced-oxidizing the collector layer. First conductivity type impurities for forming a first conductivity type layer are implanted to the second surface using the oxide layer as a mask. A support base is attached to the second surface and a thickness of the semiconductor substrate is reduced from the first surface. An element part including a base region, an emitter region, a plurality of trenches, a gate insulating layer, a gate electrode, and a first electrode is formed on the first surface of the semiconductor substrate.