公开(公告)号：US07041985B1

公开(公告)日：2006-05-09

申请号：US10986631

申请日：2004-11-12

Applicant: Haifeng Wang ,  Loc Vinh

Inventor： Haifeng Wang ,  Loc Vinh

IPC: G21K5/10

CPC classification number: H01J37/20 ,  G01N1/32 ,  G01N2035/00059 ,  G01N2203/0417 ,  H01J2237/31745

Abstract: Manipulators for handling micron-scale samples, methods for making probes for the manipulators, and methods for using the manipulators are provided. An exemplary manipulator includes a probe, a probe holder, and a mechanical positioner. The probe includes an electrically conductive surface, a proximal end and a distal end where the distal end has a truncated conical shape with a generally flat face, and a bore extending from the proximal end to the face. The probe holder engages the proximal end and includes an inlet in fluid communication with the bore and with a source of sub-ambient pressure. An exemplary microscopy inspection method includes forming a free-standing membrane, positioning the probe of the manipulator proximate to the membrane, drawing the membrane to the face by drawing a vacuum through the bore, placing the membrane on a sample support, and inspecting the membrane with a microscope.

Abstract translation: 提供用于处理微米级样品的操纵器，用于制造用于操纵器的探针的方法以及使用操纵器的方法。 示例性的操纵器包括探针，探针支架和机械定位器。 探针包括导电表面，近端和远端，其中远端具有截头圆锥形状，具有大致平坦的表面，以及从近端延伸到面部的孔。 探针支架接合近端并且包括与孔和流体连通的入口，并具有低于环境压力的源。 示例性的显微镜检查方法包括形成独立的膜，将操纵器的探针定位在膜附近，通过从孔中拉出真空将膜拉到表面，将膜放置在样品支架上，并检查膜 用显微镜。

公开(公告)号：US06772628B2

公开(公告)日：2004-08-10

申请号：US10440696

申请日：2003-05-19

Applicant: Robert A. Clark

Inventor： Robert A. Clark

IPC: G01L504

CPC classification number: G01N3/20 ,  G01N2203/0046 ,  G01N2203/0258 ,  G01N2203/0417

Abstract: A method for measuring substrate bending stiffness and thereby basis weight on a real time basis. Provided is a corrugator having a plurality of parallel ribs, with one or more sheets of the substrate provided below the corrugator wherein a predetermined gap exists between a topmost sheet of the sheets and the corrugator. A vacuum is applied between the corrugator and the topmost sheet, wherein the vacuum is sufficiently large to raise the topmost sheet, thereby deflecting and bending it into a profile corresponding to the arrangement and size of the corrugator ribs and bending stiffness of the substrate. One or more sensors are provided for measuring the deflection of the topmost sheet. The vacuum, an air knife output and/or a fluffer output are then adjusted according to predetermined rules and the measured deflection.

Abstract translation: 一种用于实时测量基板弯曲刚度，从而测量基重的方法。 提供了一种波纹机，其具有多个平行的肋，其中一个或多个衬底设置在波纹机的下方，其中在最上面的片材片和波纹板之间存在预定的间隙。 在瓦楞纸机和最上面的纸张之间施加真空，其中真空足够大以升高最上面的纸张，从而偏转并将其弯曲成对应于波纹辊肋的布置和尺寸以及基板的弯曲刚度的轮廓。 提供一个或多个传感器用于测量最上面的片材的挠曲。 然后根据预定的规则和测量的偏差来调节真空，气刀输出和/或绒毛输出。

公开(公告)号：US20030200815A1

公开(公告)日：2003-10-30

申请号：US10440696

申请日：2003-05-19

Applicant: Xerox Corporation

Inventor： Robert A. Clark

IPC: G01N003/20

CPC classification number: G01N3/20 ,  G01N2203/0046 ,  G01N2203/0258 ,  G01N2203/0417

Abstract: A method for measuring substrate bending stiffness and thereby basis weight on a real time basis. Provided is a corrugator having a plurality of parallel ribs, with one or more sheets of the substrate provided below the corrugator wherein a predetermined gap exists between a topmost sheet of the sheets and the corrugator. A vacuum is applied between the corrugator and the topmost sheet, wherein the vacuum is sufficiently large to raise the topmost sheet, thereby deflecting and bending it into a profile corresponding to the arrangement and size of the corrugator ribs and bending stiffness of the substrate. One or more sensors are provided for measuring the deflection of the topmost sheet. The vacuum, an air knife output and/or a fluffer output are then adjusted according to predetermined rules and the measured deflection.

Abstract translation: 一种用于实时测量基板弯曲刚度，从而测量基重的方法。 提供了一种波纹机，其具有多个平行的肋，其中一个或多个衬底设置在波纹机的下方，其中在最上面的片材片和波纹板之间存在预定的间隙。 在瓦楞纸机和最上面的纸张之间施加真空，其中真空足够大以提升最上面的纸张，从而偏转并将其弯曲成对应于波纹板肋的布置和尺寸以及基板的弯曲刚度的轮廓。 提供一个或多个传感器用于测量最上面的片材的挠曲。 然后根据预定的规则和测量的偏差来调节真空，气刀输出和/或绒毛输出。

公开(公告)号：US20180372603A1

公开(公告)日：2018-12-27

申请号：US15629673

申请日：2017-06-21

Applicant: The Boeing Company

Inventor： Morteza SAFAI ,  Xiaoxi WANG

IPC: G01N3/24

CPC classification number: G01N3/24 ,  G01B11/162 ,  G01N3/32 ,  G01N3/60 ,  G01N19/04 ,  G01N2203/0007 ,  G01N2203/0208 ,  G01N2203/0417

Abstract: A vacuum system and method for inspecting a workpiece that can include use the vacuum system, where the vacuum system can include a housing defining at least a portion of a vacuum chamber, a piston within the housing that oscillates to vary a volume of the vacuum chamber, a first valve and a second valve in fluid communication with the vacuum chamber, and a hood in fluid communication with the second valve and the vacuum chamber. The vacuum system can include high-speed valves that enable vacuum system cycling and thus vacuum pressure cycling at a rapid frequency.

公开(公告)号：US06909173B2

公开(公告)日：2005-06-21

申请号：US10165319

申请日：2002-06-10

Applicant: Osamu Hamamoto ,  Koji Sato ,  Kenji Kajiwara

Inventor： Osamu Hamamoto ,  Koji Sato ,  Kenji Kajiwara

IPC: H01L23/498 ,  H01L25/04 ,  H05K1/11 ,  H05K3/40 ,  H01L23/48 ,  H01L23/52

CPC classification number: H01L25/041 ,  G01N2203/0417 ,  H01L23/4985 ,  H01L27/14663 ,  H01L2224/16225 ,  H01L2924/01327 ,  H01L2924/13091 ,  H05K1/118 ,  H05K3/4092 ,  H01L2924/00

Abstract: The invention concerns a flexible substrate comprising an inner lead connected to an external connection terminal formed on a substrate, and a base film formed on the lead. The base film area above the substrate and closest to the terminal is thinner than the terminal. The invention also provides a semiconductor device comprising an inner lead connected to an external connection terminal formed on a substrate, and a base film formed on the lead. The base film area above the substrate and closest to the terminal is thinner than the terminal. The invention also provides for a manufacturing method a semiconductor device comprising a substrate, an external connection terminal, and an inner lead with a base film. Further, the invention provides a semiconductor device with a substrate with a chamfered corner between the connection and side faces. By the invention, connection of an inner lead or a flexible substrate is made easier.

Abstract translation: 本发明涉及一种柔性基板，其包括连接到形成在基板上的外部连接端子的内部引线和形成在引线上的基底膜。 基板上方最靠近端子的基膜区比端子薄。 本发明还提供了一种半导体器件，包括连接到形成在衬底上的外部连接端子的内部引线和形成在引线上的基底膜。 基板上方最靠近端子的基膜区比端子薄。 本发明还提供一种半导体器件的制造方法，该半导体器件包括衬底，外部连接端子和具有基膜的内部引线。 此外，本发明提供一种具有在连接和侧面之间具有倒角的基板的半导体器件。 通过本发明，内引线或柔性基板的连接变得更容易。

公开(公告)号：US06581456B1

公开(公告)日：2003-06-24

申请号：US10041047

申请日：2002-01-07

Applicant: Robert A. Clark

Inventor： Robert A. Clark

IPC: G01L504

CPC classification number: G01N3/20 ,  G01N2203/0046 ,  G01N2203/0258 ,  G01N2203/0417

Abstract: A method and apparatus for measuring substrate bending stiffness and thereby basis weight on a real time basis. Provided is a corrugator having a plurality of parallel ribs, with one or more sheets of the substrate provided below the corrugator wherein a predetermined gap exists between a topmost sheet of the sheets and the corrugator. A vacuum is applied between the corrugator and the topmost sheet, wherein the vacuum is sufficiently large to raise the topmost sheet, thereby deflecting and bending it into a profile corresponding to the arrangement and size of the corrugator ribs and bending stiffness of the substrate. One or more sensors are provided for measuring the deflection of the topmost sheet. The vacuum, an air knife output and/or a fluffer output are then adjusted according to predetermined rules and the measured deflection.

Abstract translation: 一种实时测量基板弯曲刚度，从而测量基重的方法和装置。 提供了一种波纹机，其具有多个平行的肋，其中一个或多个衬底设置在波纹机的下方，其中在最上面的片材片和波纹板之间存在预定的间隙。 在瓦楞纸机和最上面的纸张之间施加真空，其中真空足够大以提升最上面的纸张，从而偏转并将其弯曲成对应于波纹板肋的布置和尺寸以及基板的弯曲刚度的轮廓。 提供一个或多个传感器用于测量最上面的片材的挠曲。 然后根据预定的规则和测量的偏差来调节真空，气刀输出和/或绒毛输出。

公开(公告)号：US3344660A

公开(公告)日：1967-10-03

申请号：US39967264

申请日：1964-09-28

Applicant: THIOKOL CHEMICAL CORP

Inventor： BALDWIN JOHN B

IPC: G01N3/04 ,  G01N3/06

CPC classification number: G01N3/06 ,  G01N2203/0417 ,  G01N2203/0482

公开(公告)号：US12061176B2

公开(公告)日：2024-08-13

申请号：US17667133

申请日：2022-02-08

Applicant: KunShan Go-Visionox Opto-Electronics Co., Ltd.

Inventor： Yuexing Ma ,  Shuanzhu Dong

IPC: G01N3/04 ,  G01N3/26 ,  G09F9/30

CPC classification number: G01N3/04 ,  G01N3/26 ,  G01N2203/0017 ,  G01N2203/0075 ,  G01N2203/0417 ,  G01N2203/0647 ,  G09F9/301

Abstract: A testing apparatus for a flexible screen includes a slide rail, a reel, and a clamping member. The reel is disposed at an end of the slide rail in the extension direction of the slide rail which the axial direction of the reel is perpendicular to. The reel has a hollow structure and is connected to a evacuating device through a gas path formed in the hollow structure to enable the evacuating device to vacuumize inside of the reel to fit the flexible screen and coil around the reel. The reel is configured to affix first end of flexible screen and rotate to coil the flexible screen. The clamping member is configured to clamp a second end of the flexible screen opposite to the first end. The reel is further configured to rotate to drive, through the flexible screen, the reel and the clamping member to slide towards each other along the slide rail.

公开(公告)号：US20020066311A1

公开(公告)日：2002-06-06

申请号：US10006259

申请日：2001-12-04

Applicant: University of Vermont and State Agricultural College

Inventor： Dryver R. Huston ,  Wolfgang Sauter ,  Peter A. Sonntag

IPC: G01L005/04

CPC classification number: G01N3/04 ,  G01N2203/0069 ,  G01N2203/0282 ,  G01N2203/0417 ,  G01N2203/0429

Abstract: A bulge tester (20) for determining residual stresses, and mechanical, thermal and other properties of a thin film (26) of material. The bulge tester includes a chuck (22) that supports the substrate (24) on which the film is deposited by stiction rather than through the use of mounting waxes, adhesives and mechanical clamping. The stiction inducing media (52) may be viscous grease, a flexible sheet of material such as a rubber, an elastomer, both or other materials. Bulge testing performed using the stiction-based chuck involves inducing stiction between the base (42) of the chuck and substrate of at least at least 1 kPascal (0.69 lb/in2), as determined using a corner peel test. Then pressurized fluid is delivered to the film to be tested, and materials properties of the film are determined as a function of pressure of the fluid and deflection of the film.

Abstract translation: 用于确定材料薄膜（26）的残余应力和机械，热等性质的凸起测试器（20）。 凸起测试器包括卡盘（22），该卡盘（22）支撑通过静电沉积薄膜的基底（24），而不是通过使用安装蜡，粘合剂和机械夹紧。 引导介质（52）的粘性介质可以是粘性润滑脂，诸如橡胶，弹性体，两种或其它材料的柔性片材。 使用基于胶片的卡盘进行的隆起测试包括使用拐角剥离测试来确定卡盘的基座（42）和至少至少1kPascal（0.69lb / in2）的基底之间的粘结。 然后将加压流体输送到待测试的膜，并且膜的材料性质被确定为流体的压力和膜的偏转的函数。

公开(公告)号：US6050127A

公开(公告)日：2000-04-18

申请号：US350839

申请日：1999-07-09

Applicant: Mukund Channagiri Rao ,  Harold Weaver Pexton

Inventor： Mukund Channagiri Rao ,  Harold Weaver Pexton

IPC: G01N3/30 ,  G01N3/303 ,  G01N3/48

CPC classification number: G01N3/48 ,  G01N3/30 ,  G01N3/303 ,  G01N2203/0417

Abstract: An apparatus and method for impact response testing of materials such as magnetic discs of a disc drive. The apparatus of the present invention supports a target disc in cooperative relationship with a sub-millimeter impact test ball such that the test ball can be dropped on selected portions of the target disc from selected heights above the target disc. The apparatus permits the method of observing the characteristics of a detent made in the target disc, by use of a high resolution surface profiler, and interpolating the observed characteristics to analytical standards which, for a given test ball size and drop height, indicate the dynamic hardness of the target disc at that test location. A vacuum is used to support the test ball above the disc, and a vacuum release valve is provided to negate the vacuum and release the test ball.

Abstract translation: 用于盘式磁盘的磁盘的材料的冲击响应测试的装置和方法。 本发明的装置支撑与亚毫米冲击试验球协调关系的目标盘，使得测试球可以从目标盘上方的选定高度落在目标盘的选定部分上。 该装置允许通过使用高分辨率表面轮廓仪观察在目标盘中制造的制动器的特性的方法，并将观察到的特征内插到分析标准，对于给定的测试球尺寸和液滴高度，其指示动态 在该测试位置的目标盘的硬度。 使用真空来支撑盘上方的测试球，并且提供真空释放阀以消除真空并释放测试球。