Field emission cathode device and method of forming a field emission cathode device

    公开(公告)号:US12020890B2

    公开(公告)日:2024-06-25

    申请号:US18247257

    申请日:2021-09-29

    申请人: NCX Corporation

    发明人: Jian Zhang

    IPC分类号: H01J1/46 H01J1/304 H01J9/18

    CPC分类号: H01J1/46 H01J1/304 H01J9/18

    摘要: A field emission cathode device and formation method involves a rotating field emission cathode including a field emission material deposited on a surface thereof, the field emission cathode rotating about an axis and being electrically connected to ground, and a planar gate electrode extending parallel to the surface of the rotating field emission cathode and defining a gap therebetween. A gate voltage source is electrically connected to the gate electrode and is arranged to interact therewith to generate an electric field, with the electric field inducing a portion of the surface of the rotating field emission cathode adjacent to the gate electrode to emit electrons from the field emission material toward and through the gate electrode.

    Light modulated electron source
    5.
    发明授权

    公开(公告)号:US11715615B2

    公开(公告)日:2023-08-01

    申请号:US17858943

    申请日:2022-07-06

    申请人: KLA Corporation

    摘要: A light modulated electron source utilizes a photon-beam source to modulate the emission current of an electron beam emitted from a silicon-based field emitter. The field emitter's cathode includes a protrusion fabricated on a silicon substrate and having an emission tip covered by a coating layer. An extractor generates an electric field that attracts free electrons toward the emission tip for emission as part of the electron beam. The photon-beam source generates a photon beam including photons having an energy greater than the bandgap of silicon, and includes optics that direct the photon beam onto the emission tip, whereby each absorbed photon creates a photo-electron that combines with the free electrons to enhance the electron beam's emission current. A controller modulates the emission current by controlling the intensity of the photon beam applied to the emission tip. A monitor measures the electron beam and provides feedback to the controller.