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公开(公告)号:JP4429280B2
公开(公告)日:2010-03-10
申请号:JP2006068413
申请日:2006-03-13
Applicant: Necエレクトロニクス株式会社 , 日本電気株式会社
IPC: H01L23/12
CPC classification number: H01L2224/48091 , H01L2224/48227 , H01L2924/15312 , H01L2924/00014
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公开(公告)号:JP3841079B2
公开(公告)日:2006-11-01
申请号:JP2003382418
申请日:2003-11-12
Applicant: 日本電気株式会社
CPC classification number: H01L2224/16 , H01L2924/01046 , H01L2924/01078 , H01L2924/09701 , H01L2924/15311 , H01L2924/3011
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公开(公告)号:JP5061895B2
公开(公告)日:2012-10-31
申请号:JP2007501575
申请日:2006-01-31
Applicant: 日本電気株式会社
CPC classification number: H01G4/33 , H05K1/162 , H05K2201/0175 , H05K2201/0179 , H05K2201/09509 , H05K2201/09563
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公开(公告)号:JP4768994B2
公开(公告)日:2011-09-07
申请号:JP2005031100
申请日:2005-02-07
Applicant: ルネサスエレクトロニクス株式会社 , 日本電気株式会社
IPC: H01L23/12
CPC classification number: H05K3/205 , H01L21/6835 , H01L23/49816 , H01L23/49822 , H01L23/49827 , H01L23/49838 , H01L25/0657 , H01L2221/68345 , H01L2224/16 , H01L2224/16225 , H01L2224/16235 , H01L2224/16237 , H01L2224/32225 , H01L2224/73204 , H01L2224/83102 , H01L2224/92125 , H01L2225/06517 , H01L2225/06541 , H01L2225/06572 , H01L2924/00014 , H01L2924/01019 , H01L2924/01046 , H01L2924/01078 , H01L2924/01079 , H01L2924/09701 , H01L2924/10253 , H01L2924/15311 , H01L2924/1532 , H01L2924/3511 , H05K1/113 , H05K3/107 , H05K3/4682 , H05K2201/09472 , H05K2201/096 , H05K2203/0384 , H01L2924/00 , H01L2224/0401
Abstract: An interconnecting substrate is provided with a base insulating film having a sunken section in a bottom surface thereof, a first interconnection provided in the sunken section, a via hole formed in the base insulating film, and a second interconnection which is connected to the first interconnection via a conductor within the via hole and is formed on a top surface of the base insulating film, wherein the interconnecting substrate includes a first interconnection pattern formed of the first interconnection which includes at least a linear pattern which extends along a second direction orthogonal to a first direction, and a warpage-controlling pattern which is provided in the sunken section in the bottom surface of the base insulating film and is formed in such a manner as to suppress a warpage of the interconnecting substrate toward a bottom side on both sides of the first direction.
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公开(公告)号:JP4124173B2
公开(公告)日:2008-07-23
申请号:JP2004192446
申请日:2004-06-30
Applicant: 日本電気株式会社
IPC: H01L23/12
CPC classification number: H01L2224/16225 , H01L2924/15174
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公开(公告)号:JP4429281B2
公开(公告)日:2010-03-10
申请号:JP2006068419
申请日:2006-03-13
Applicant: Necエレクトロニクス株式会社 , 日本電気株式会社
IPC: H01L23/12
CPC classification number: H01L2224/48091 , H01L2224/48227 , H01L2924/15311 , H01L2924/15312 , H01L2924/00014
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公开(公告)号:JP4389788B2
公开(公告)日:2009-12-24
申请号:JP2004564474
申请日:2003-11-19
Applicant: 日本電気株式会社
IPC: B32B3/30 , B32B7/02 , B32B7/12 , B32B27/30 , B32B27/34 , H01L23/14 , H05K1/03 , H05K1/05 , H05K3/46
CPC classification number: H05K3/4673 , B32B7/12 , H05K3/4644 , H05K2201/0154 , H05K2201/0195 , H05K2201/0358 , Y10T428/24917 , Y10T428/249953 , Y10T428/249955 , Y10T428/249958 , Y10T428/31681
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公开(公告)号:JP4063240B2
公开(公告)日:2008-03-19
申请号:JP2004125011
申请日:2004-04-21
Applicant: 日本電気株式会社
IPC: H01L21/60 , H01L23/12 , H01L25/065 , H01L25/07 , H01L25/18
CPC classification number: H01L2924/0002 , H01L2924/00
Abstract: PROBLEM TO BE SOLVED: To provide a semiconductor device mounting substrate and its manufacturing method, and a semiconductor package, which can realize high density and microfabrication compatible with narrow pitch by improving a conventional wiring substrate. SOLUTION: The semiconductor device mounting substrate is characterized as follows. A first insulating layer 14 under which a first electrode pattern 13 is embedded so as to be exposed on a surface, one or a plurality of wiring structure films 16 in which the insulating layer and a wiring layer are laminated and which has a first via, and a second electrode pattern 17 are laminated in order. The first electrode pattern 13 and the second electrode pattern 17 are conducted through the first via and the wiring layer. A surface on which the electrode pattern 13 is exposed is covered with an insulating film with open which is corresponding to the electrode pattern 13, and a base is set in close proximity of the insulating film. COPYRIGHT: (C)2004,JPO&NCIPI
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公开(公告)号:JP3838232B2
公开(公告)日:2006-10-25
申请号:JP2003299304
申请日:2003-08-22
Applicant: 日本電気株式会社
IPC: H01L23/12
CPC classification number: H01L2224/19 , H01L2924/01013 , H01L2924/0105 , H01L2924/014 , H01L2924/15787 , H01L2924/19041 , H01L2924/00 , H01L2924/00012
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