PROXIMITY CORRECTION METHOD AND SYSTEM
    93.
    发明申请
    PROXIMITY CORRECTION METHOD AND SYSTEM 审中-公开
    近似校正方法和系统

    公开(公告)号:US20100064274A1

    公开(公告)日:2010-03-11

    申请号:US12205006

    申请日:2008-09-05

    申请人: Wolfgang Grimm

    发明人: Wolfgang Grimm

    IPC分类号: G06F17/50 G03B27/54

    CPC分类号: G03B27/54 G03F1/36

    摘要: A proximity correction method includes creating a first proximity correction model having a focus value and creating a second proximity correction model having a first defocus value. One of the first or second proximity correction models are associated with corresponding first and second layout areas of a semiconductor wafer.

    摘要翻译: 接近校正方法包括创建具有焦点值的第一邻近度校正模型并创建具有第一散焦值的第二邻近校正模型。 第一或第二接近校正模型中的一个与半导体晶片的对应的第一和第二布局区域相关联。

    INFORMATION STORAGE AND RETRIEVAL SYSTEM
    94.
    发明申请
    INFORMATION STORAGE AND RETRIEVAL SYSTEM 审中-公开
    信息存储和检索系统

    公开(公告)号:US20100057685A1

    公开(公告)日:2010-03-04

    申请号:US12202869

    申请日:2008-09-02

    IPC分类号: G06F7/06 G06F17/30

    CPC分类号: G06F16/313 G06F16/93

    摘要: An information storage and retrieval system includes a first data structure and a second data structure. The first data structure is configured to store documents. Each document includes a plurality of data portions. The second data structure is configured to store addresses to each document and data portion stored in the first data structure at addresses defined by an identity of each data portion.

    摘要翻译: 信息存储和检索系统包括第一数据结构和第二数据结构。 第一个数据结构被配置为存储文档。 每个文档包括多个数据部分。 第二数据结构被配置为将存储在第一数据结构中的每个文档和数据部分的地址存储在由每个数据部分的身份定义的地址处。

    Method and Apparatus for Reducing Charge Trapping in High-K Dielectric Material
    95.
    发明申请
    Method and Apparatus for Reducing Charge Trapping in High-K Dielectric Material 有权
    用于降低高K电介质材料电荷捕获的方法和装置

    公开(公告)号:US20100054022A1

    公开(公告)日:2010-03-04

    申请号:US12201223

    申请日:2008-08-29

    IPC分类号: G11C11/24 G11C7/00

    摘要: In one embodiment, an integrated circuit includes a memory array having a plurality of capacitors for storing data of an initial state in the memory array in an initial state. The integrated circuit also includes circuitry for occasionally inverting the data stored by the plurality of capacitors and tracking whether the current state of the data stored by the plurality of capacitors corresponds to the initial state. The circuitry inverts the data read out of the memory array during a read operation when the current state of the data does not correspond to the initial state.

    摘要翻译: 在一个实施例中,集成电路包括具有多个电容器的存储器阵列,用于在初始状态下存储存储器阵列中初始状态的数据。 集成电路还包括用于偶尔反转由多个电容器存储的数据的电路,并且跟踪由多个电容器存储的数据的当前状态是否对应于初始状态。 当数据的当前状态不对应于初始状态时,电路在读取操作期间将从存储器阵列读出的数据反相。

    Metrology Mark with Elements Arranged in a Matrix, Method of Manufacturing Same and Alignment Method
    96.
    发明申请
    Metrology Mark with Elements Arranged in a Matrix, Method of Manufacturing Same and Alignment Method 审中-公开
    具有矩阵中的元素的计量标记,制造方法和对准方法

    公开(公告)号:US20100052191A1

    公开(公告)日:2010-03-04

    申请号:US12201605

    申请日:2008-08-29

    IPC分类号: H01L23/544 H01L21/76

    摘要: A method of manufacturing an integrated circuit provides a metrology mark (e.g., alignment mark or overlay mark). The method includes forming a first plurality of first structures arranged in a matrix in a substrate. Portions of the matrix are covered with a mask such that first portions of the matrix are left exposed and second portions of the matrix are covered. Signal response properties of exposed ones of the first structures in the matrix are altered to form a metrology mark. The metrology mark includes first and second mark portions with different signal response properties and which are aligned to a virtual grid. The evaluation of precisely positioned metrology marks may be improved with low impact on process complexity.

    摘要翻译: 集成电路的制造方法提供计量标记(例如,对准标记或重叠标记)。 该方法包括在衬底中形成以矩阵形式布置的第一多个第一结构。 矩阵的部分用掩模覆盖,使得矩阵的第一部分被暴露并且覆盖矩阵的第二部分。 矩阵中第一个结构中暴露的结构的信号响应特性被改变以形成计量标记。 测量标记包括具有不同信号响应特性并且与虚拟网格对准的第一和第二标记部分。 对精确定位的计量标记的评估可能会改善,对过程复杂性的影响较小。

    INTEGRATED CIRCUIT AND PROGRAMMABLE DELAY
    97.
    发明申请
    INTEGRATED CIRCUIT AND PROGRAMMABLE DELAY 有权
    集成电路和可编程延迟

    公开(公告)号:US20100045351A1

    公开(公告)日:2010-02-25

    申请号:US12195120

    申请日:2008-08-20

    IPC分类号: H03L7/00 H03H11/26 H03K3/00

    摘要: Integrated circuit and programmable delay. One embodiment provides an integrated circuit including a programmable delay element having a plurality of single delay cells. The delay cells include a first input and a second input and a first output. The delay cells are arranged to form a chain such that the first output of a preceding delay cell is coupled to the second input of a successive delay cell. The first inputs of any delay cells are configured to receive an input signal to be delayed. The delay cells out of the plurality of delay cells is configured to constitute a starting point of a signal path including any of the delay cells arranged downstream of the starting point. The first output of the last delay cell in the chain forms an output of the programmable delay element.

    摘要翻译: 集成电路和可编程延时。 一个实施例提供了包括具有多个单个延迟单元的可编程延迟元件的集成电路。 延迟单元包括第一输入和第二输入以及第一输出。 延迟单元被布置成形成链,使得先前延迟单元的第一输出耦合到连续延迟​​单元的第二输入。 任何延迟单元的第一输入被配置为接收待延迟的输入信号。 多个延迟单元中的延迟单元被配置为构成包括布置在起始点下游的任何延迟单元的信号路径的起始点。 链中最后一个延迟单元的第一个输出形成可编程延迟元件的输出。

    INTEGRATED CIRCUIT INCLUDING MEMORY CELL HAVING CUP-SHAPED ELECTRODE INTERFACE
    98.
    发明申请
    INTEGRATED CIRCUIT INCLUDING MEMORY CELL HAVING CUP-SHAPED ELECTRODE INTERFACE 有权
    集成电路,包括具有电池形状电极接口的存储器单元

    公开(公告)号:US20100044669A1

    公开(公告)日:2010-02-25

    申请号:US12195964

    申请日:2008-08-21

    IPC分类号: H01L45/00 H01L21/28

    摘要: An integrated circuit includes a first electrode and a cup-shaped electrode interface coupled to the first electrode. The integrated circuit includes a dielectric spacer at least partially laterally enclosed by the electrode interface and a resistance changing material laterally enclosed by the spacer and contacting the electrode interface. The integrated circuit includes a second electrode coupled to the resistance changing material.

    摘要翻译: 集成电路包括耦合到第一电极的第一电极和杯形电极接口。 集成电路包括至少部分地由电极界面包围的电介质间隔物和由间隔物侧向包围并与电极界面接触的电阻改变材料。 集成电路包括耦合到电阻变化材料的第二电极。

    Magnetoresistive random access memory device with alternating liner magnetization orientation
    100.
    发明授权
    Magnetoresistive random access memory device with alternating liner magnetization orientation 失效
    磁阻随机存取存储器件具有交替的线性磁化方向

    公开(公告)号:US07663198B2

    公开(公告)日:2010-02-16

    申请号:US11512066

    申请日:2006-08-29

    IPC分类号: G11C11/15 H01L21/8246

    CPC分类号: H01L27/222 H01L43/08

    摘要: An arrangement of magnetic liners for the bit lines or word lines of an MRAM device that reduces or eliminates stray magnetic fields at the ends of the magnetic liners, thereby reducing the occurrence of offset fields over portions of the MRAM device due to the magnetic liners is described. The orientation of magnetization of adjacent magnetic liners is alternated, causing the end poles of the magnetic liners to cancel each other. The shapes of the ends of the magnetic liners are alternated to vary their switching fields. Methods are described that use this ability to vary the switching fields to alternate the orientation of magnetization of the magnetic liners.

    摘要翻译: 用于MRAM装置的位线或字线的磁性衬垫的布置,其减少或消除磁性衬垫的端部处的杂散磁场,从而减少由于磁性衬垫而导致的MRAM器件的部分上的偏移场的出现, 描述。 相邻磁性衬垫的磁化方向交替变化,导致磁性衬垫的端极彼此抵消。 磁性衬垫的端部的形状被交替以改变其切换场。 描述了使用这种能力来改变切换场以交替磁性衬垫的磁化方向的方法。