Lithographic apparatus and device manufacturing method
    93.
    发明授权
    Lithographic apparatus and device manufacturing method 有权
    平版印刷设备和器件制造方法

    公开(公告)号:US08094288B2

    公开(公告)日:2012-01-10

    申请号:US10842637

    申请日:2004-05-11

    IPC分类号: G03B27/52 G03B27/54

    CPC分类号: G03F7/70191 G03F7/70575

    摘要: A lithographic apparatus includes an illumination system configured to transmit a beam of radiation, the beam of radiation comprising desired radiation having a predetermined wavelength or a predetermined wavelength range, and undesired radiation having another wavelength or another wavelength range; a support structure configured to support a patterning structure, the patterning structure being configured to impart the beam of radiation with a pattern in its cross-section; a substrate table configured to hold a substrate; and a projection system configured to project the patterned beam of radiation onto a target portion of the substrate; wherein at least part of the lithographic apparatus, in use, includes a gas substantially transmissive for at least part of the desired radiation and substantially less transmissive for at least part of the undesired radiation.

    摘要翻译: 光刻设备包括被配置为透射辐射束的照明系统,所述辐射束包括具有预定波长或预定波长范围的期望辐射,以及具有另一波长或另一波长范围的不需要的辐射; 支撑结构,其构造成支撑图案形成结构,所述图案化结构被配置为在其横截面中赋予所述辐射束的图案; 被配置为保持基板的基板台; 以及投影系统,被配置为将所述图案化的辐射束投影到所述基板的目标部分上; 其中在使用中至少部分光刻设备包括至少部分所需辐射基本上透射的气体,对于至少部分不需要的辐射基本上较少透射。

    EXTREME ULTRAVIOLET RADIATION SOURCE AND METHOD FOR PRODUCING EXTREME ULTRAVIOLET RADIATION
    99.
    发明申请
    EXTREME ULTRAVIOLET RADIATION SOURCE AND METHOD FOR PRODUCING EXTREME ULTRAVIOLET RADIATION 审中-公开
    极端超紫外线辐射源和生产超极紫外线辐射的方法

    公开(公告)号:US20110020752A1

    公开(公告)日:2011-01-27

    申请号:US12810636

    申请日:2008-12-19

    IPC分类号: G03F7/20 H05G2/00 G03B27/54

    CPC分类号: H05G2/003

    摘要: A radiation source is constructed and arranged to produce extreme ultraviolet radiation. The radiation source includes a chamber, a first electrode at least partially contained in the chamber, a second electrode at least partially contained in the chamber, and a supply constructed and arranged to provide a discharge gas to the chamber. The first electrode and the second electrode are configured to create a discharge in the discharge gas to form a plasma so as to generate the extreme ultraviolet radiation. The source also includes a gas supply constructed and arranged to provide a gas at a partial pressure between about 1 Pa and about 10 Pa at a location near the discharge. The gas is selected from the group consisting of hydrogen, helium, and a mixture of hydrogen and helium.

    摘要翻译: 辐射源被构造和布置成产生极紫外辐射。 辐射源包括腔室,至少部分地容纳在腔室中的第一电极,至少部分地容纳在腔室中的第二电极,以及构造和布置成向腔室提供放电气体的供应源。 第一电极和第二电极被配置为在放电气体中产生放电以形成等离子体,以产生极紫外辐射。 源还包括构造和布置成在靠近放电的位置处提供在约1Pa和约10Pa之间的分压的气体的气体供应。 气体选自氢,氦和氢和氦的混合物。

    IMPRINT LITHOGRAPHY APPARATUS
    100.
    发明申请

    公开(公告)号:US20110008483A1

    公开(公告)日:2011-01-13

    申请号:US12821806

    申请日:2010-06-23

    IPC分类号: B29C59/00

    摘要: An imprint lithography apparatus is disclosed that includes a structure located away from a substrate holder and extending across the substrate holder, and such that an imprint template arrangement is, in use, located between the structure and the substrate holder, wherein the structure has one or more arrays of lines or one or more encoders, and the substrate or substrate holder and the imprint template have a corresponding one or more encoders that face towards one or more of the one or more arrays of lines or one or more arrays of lines that face towards one or more of the one or more encoders, and the configuration determination arrangement is configured to determine a relative configuration between the substrate or substrate holder and the structure, and/or a relative configuration between the imprint template arrangement and the structure, and/or a relative configuration between the imprint template arrangement and the substrate or substrate holder.

    摘要翻译: 公开了一种压印光刻设备,其包括远离衬底保持器并延伸穿过衬底保持器的结构,并且使得压印模板布置在使用中位于结构和衬底保持器之间,其中结构具有一个或 更多的线阵列或一个或多个编码器,并且衬底或衬底保持器和压印模板具有对应的一个或多个编码器,其面向一个或多个线阵列或一个或多个面阵列阵列 朝向一个或多个编码器中的一个或多个,并且配置确定装置被配置为确定衬底或衬底保持器与结构之间的相对配置,和/或压印模板布置和结构之间的相对配置,和/ 或压印模板布置和基板或基板保持器之间的相对配置。