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公开(公告)号:US10134775B2
公开(公告)日:2018-11-20
申请号:US15899472
申请日:2018-02-20
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Atsushi Umezaki
IPC: G09G3/36 , H01L27/12 , G11C19/28 , H01L27/105 , G02F1/1333 , G02F1/1368 , G09G3/3266 , G02F1/1362 , H01L29/423 , H01L29/786 , H01L27/13 , G02F1/1343 , G02F1/1345 , H01L27/32
Abstract: By applying an AC pulse to a gate of a transistor which easily deteriorates, a shift in threshold voltage of the transistor is suppressed. However, in a case where amorphous silicon is used for a semiconductor layer of a transistor, the occurrence of a shift in threshold voltage naturally becomes a problem for a transistor which constitutes a part of circuit that generates an AC pulse. A shift in threshold voltage of a transistor which easily deteriorates and a shift in threshold voltage of a turned-on transistor are suppressed by signal input to a gate electrode of the transistor which easily deteriorates through the turned-on transistor. In other words, a structure for applying an AC pulse to a gate electrode of a transistor which easily deteriorates through a transistor to a gate electrode of which a high potential (VDD) is applied, is included.
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公开(公告)号:US10121435B2
公开(公告)日:2018-11-06
申请号:US15062265
申请日:2016-03-07
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Atsushi Umezaki
Abstract: To suppress malfunctions in a shift register circuit. A shift register having a plurality of flip-flop circuits is provided. The flip-flop circuit includes a transistor 11, a transistor 12, a transistor 13, a transistor 14, and a transistor 15. When the transistor 13 or the transistor 14 is turned on in a non-selection period, the potential of a node A is set, so that the node A is prevented from entering into a floating state.
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公开(公告)号:US10071904B2
公开(公告)日:2018-09-11
申请号:US14859681
申请日:2015-09-21
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Atsushi Umezaki
IPC: B81B7/00 , B81B3/00 , G09G3/34 , H03K19/003 , H03K19/00 , H03K19/0185 , H01L27/12
CPC classification number: B81B3/0083 , B81B7/008 , G09G3/3466 , G09G2300/08 , G09G2310/0262 , H01L27/1225 , H03K19/0013 , H03K19/00315 , H03K19/00384 , H03K19/018521
Abstract: An object is to continuously apply voltage to a MEMS device using first to fifth or sixth transistors. One of a source and a drain of the first transistor is electrically connected to one of a source and a drain of the second transistor. One of a source and a drain of the third transistor is electrically connected to one of a source and a drain of the fourth transistor. A gate of the first transistor is electrically connected to one of a source and a drain of the fifth transistor. A gate of the second transistor is electrically connected to the one of the source and the drain of the third transistor. A gate of the fourth transistor is electrically connected to the gate of the first transistor. The MEMS device is electrically connected to the one of the source and the drain of the first transistor.
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公开(公告)号:US09990894B2
公开(公告)日:2018-06-05
申请号:US15396862
申请日:2017-01-03
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Hajime Kimura , Atsushi Umezaki
CPC classification number: G09G3/3648 , G09G3/2096 , G09G3/3677 , G09G3/3688 , G09G2300/0426 , G09G2300/0814 , G09G2300/0819 , G09G2320/0209 , G09G2320/0223 , G09G2320/043
Abstract: A semiconductor device where delay or distortion of a signal output to a gate signal line in a selection period is reduced is provided. The semiconductor device includes a gate signal line, a first and second gate driver circuits which output a selection signal and a non-selection signal to the gate signal line, and pixels electrically connected to the gate signal line and supplied with the two signals. In a period during which the gate signal line is selected, both the first and second gate driver circuits output the selection signal to the gate signal line. In a period during which the gate signal line is not selected, one of the first and second gate driver circuits outputs the non-selection signal to the gate signal line, and the other gate driver circuit outputs neither the selection signal nor the non-selection signal to the gate signal line.
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公开(公告)号:US09954010B2
公开(公告)日:2018-04-24
申请号:US15279575
申请日:2016-09-29
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Atsushi Umezaki
IPC: H01L25/00 , H03K19/094 , H01L27/12 , G09G3/36 , G09G3/20 , H01L21/84 , G02F1/1368 , H01L27/15 , G02F1/133 , G02F1/1362 , H01L27/32 , H01L29/786
CPC classification number: H01L27/124 , G02F1/13306 , G02F1/13624 , G02F1/136286 , G02F1/1368 , G02F2001/136245 , G09G3/20 , G09G3/3648 , G09G3/3677 , G09G2300/04 , G09G2300/08 , G09G2310/0267 , G09G2310/0286 , G09G2310/08 , H01L21/84 , H01L27/12 , H01L27/1222 , H01L27/1225 , H01L27/156 , H01L27/3262 , H01L27/3276 , H01L29/78696
Abstract: To provide a circuit used for a shift register or the like. The basic configuration includes first to fourth transistors and four wirings. The power supply potential VDD is supplied to the first wiring and the power supply potential VSS is supplied to the second wiring. A binary digital signal is supplied to each of the third wiring and the fourth wiring. An H level of the digital signal is equal to the power supply potential VDD, and an L level of the digital signal is equal to the power supply potential VSS. There are four combinations of the potentials of the third wiring and the fourth wiring. Each of the first transistor to the fourth transistor can be turned off by any combination of the potentials. That is, since there is no transistor that is constantly on, deterioration of the characteristics of the transistors can be suppressed.
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公开(公告)号:US09847352B2
公开(公告)日:2017-12-19
申请号:US15231851
申请日:2016-08-09
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Hajime Kimura , Atsushi Umezaki
IPC: H01L27/088 , H01L27/12 , H01L29/786 , G02F1/133 , G02F1/1339 , G02F1/1362 , G02F1/1368 , H01L29/417 , H01L29/423 , G11C19/28 , G02F1/1333 , G02F1/1343 , G09G3/36
CPC classification number: H01L27/1225 , G02F1/13306 , G02F1/133345 , G02F1/1339 , G02F1/134309 , G02F1/136213 , G02F1/136286 , G02F1/1368 , G02F2001/133302 , G02F2201/121 , G02F2201/123 , G09G3/3677 , G09G2310/0251 , G09G2310/08 , G09G2330/021 , G11C19/28 , H01L27/088 , H01L27/124 , H01L27/1244 , H01L27/1251 , H01L27/1255 , H01L27/127 , H01L27/1288 , H01L29/41733 , H01L29/42384 , H01L29/7869 , H01L29/78696
Abstract: A semiconductor device including a circuit which does not easily deteriorate is provided. The semiconductor device includes a first transistor, a second transistor, a first switch, a second switch, and a third switch. A first terminal of the first transistor is connected to a first wiring. A second terminal of the first transistor is connected to a second wiring. A gate and a first terminal of the second transistor are connected to the first wiring. A second terminal of the second transistor is connected to a gate of the first transistor. The first switch is connected between the second wiring and a third wiring. The second switch is connected between the second wiring and the third wiring. The third switch is connected between the gate of the first transistor and the third wiring.
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公开(公告)号:US09824631B2
公开(公告)日:2017-11-21
申请号:US14819594
申请日:2015-08-06
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Shunpei Yamazaki , Hajime Kimura , Atsushi Umezaki , Yasunori Yoshida , Hideaki Shishido , Takuya Kimishima , Yasuyuki Arai
IPC: G09G3/3233 , G09G3/00 , G09G3/20 , G09G3/3225
CPC classification number: G09G3/3233 , G09G3/006 , G09G3/20 , G09G3/2022 , G09G3/3225 , G09G2300/0809 , G09G2300/0819 , G09G2300/0842 , G09G2310/0272 , G09G2310/0275 , G09G2320/0233 , G09G2320/0295 , G09G2320/046 , G09G2320/048 , G09G2330/022 , G09G2340/145
Abstract: In a display element such as an organic EL element, deterioration progresses due to light emission, and emission luminance is lowered even if the same voltage is applied to the display element. Therefore, use over time causes variations in luminance of each pixel, thereby a so-called “image burn-in” phenomenon occurs. Given this factor, the invention provides a display device which can reduce the difference in deterioration of a display element in each pixel and suppress variations in light emission of a display element in a pixel. It is prevented that only a specific pixel has a long accumulated lighting time. For that purpose, a gray scale of a display pattern is changed to prevent the difference in deterioration of display element in pixels from increasing. Alternatively, a specific display pattern is prevented from being fixedly displayed in a specific region. Further alternatively, a pixel lagging behind in deterioration is deteriorated so that the accumulated lighting time of pixels is equal to each other.
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公开(公告)号:US09798211B2
公开(公告)日:2017-10-24
申请号:US15262611
申请日:2016-09-12
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Hajime Kimura , Atsushi Umezaki
IPC: G02F1/1368 , G02F1/1362 , G09G3/00 , G09G3/36 , H01L27/12 , H01L29/786 , G02F1/167 , G02F1/1333 , G02F1/1339 , G02F1/1343 , H01L29/423
CPC classification number: G02F1/1368 , G02F1/133345 , G02F1/1339 , G02F1/134309 , G02F1/13439 , G02F1/13624 , G02F1/136259 , G02F1/136286 , G02F1/167 , G02F2001/133302 , G02F2001/136254 , G09G3/006 , G09G3/3648 , G09G2230/00 , G09G2310/0251 , H01L27/1225 , H01L27/124 , H01L27/1255 , H01L29/42384 , H01L29/7869
Abstract: An object is to provide a display device that performs accurate display. A circuit is formed using a transistor that includes an oxide semiconductor and has a low off-state current. A precharge circuit or an inspection circuit is formed in addition to a pixel circuit. The off-state current is low because the oxide semiconductor is used. Thus, it is not likely that a signal or voltage is leaked in the precharge circuit or the inspection circuit to cause defective display. As a result, a display device that performs accurate display can be provided.
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公开(公告)号:US09608010B2
公开(公告)日:2017-03-28
申请号:US14713941
申请日:2015-05-15
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Atsushi Umezaki
CPC classification number: G11C19/28 , G09G3/2092 , G09G2310/0267 , G09G2310/0286 , H01L27/088 , H01L27/1225 , H01L27/124 , H01L27/156 , H01L27/3244 , H01L29/7869
Abstract: A semiconductor device which shifts a low-level signal is provided. In an example, a first transistor including a first terminal electrically connected to a first wiring and a second terminal electrically connected to a second wiring, a second transistor including a first terminal electrically connected to a third wiring and a second terminal electrically connected to the second wiring, a third transistor including a first terminal electrically connected to a fourth wiring and a second terminal electrically connected to a gate of the second transistor, a fourth transistor including a first terminal electrically connected to a fifth wiring, a second terminal electrically connected to a gate of the third transistor, and a gate electrically connected to a sixth wiring, and a first switch including a first terminal electrically connected to the third wiring and a second terminal electrically connected to a gate of the first transistor are included.
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公开(公告)号:US09465271B2
公开(公告)日:2016-10-11
申请号:US14602876
申请日:2015-01-22
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Hajime Kimura , Atsushi Umezaki
IPC: G02F1/1368 , G02F1/1362 , G09G3/00 , G09G3/36 , H01L27/12 , H01L29/786 , G02F1/167
CPC classification number: G02F1/1368 , G02F1/133345 , G02F1/1339 , G02F1/134309 , G02F1/13439 , G02F1/13624 , G02F1/136259 , G02F1/136286 , G02F1/167 , G02F2001/133302 , G02F2001/136254 , G09G3/006 , G09G3/3648 , G09G2230/00 , G09G2310/0251 , H01L27/1225 , H01L27/124 , H01L27/1255 , H01L29/42384 , H01L29/7869
Abstract: An object is to provide a display device that performs accurate display. A circuit is formed using a transistor that includes an oxide semiconductor and has a low off-state current. A precharge circuit or an inspection circuit is formed in addition to a pixel circuit. The off-state current is low because the oxide semiconductor is used. Thus, it is not likely that a signal or voltage is leaked in the precharge circuit or the inspection circuit to cause defective display. As a result, a display device that performs accurate display can be provided.
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