Cost-saving scheme for scan testing of 3D stack die

    公开(公告)号:US12099091B2

    公开(公告)日:2024-09-24

    申请号:US17866342

    申请日:2022-07-15

    Abstract: A system and method for efficiently routing scan data between two dies used in three-dimensional packaging are described. In various implementations, a computing system includes at least a first semiconductor die (or first die) and a second die connected to one another within a three-dimensional (3D) package. The first die and the second die have multiple non-scan input/output (I/O) data channels between them for data transfer. The non-scan I/O data channels are partitioned into groups. The first die receives a given scan input data bit for testing a device under test (DUT) on the second die. The first die selects a first group of non-scan I/O data channels, and sends, to the second die, a copy of the given scan input data bit on each non-scan I/O data channel of the first group. The second die uses a voter circuit to determine the value of the given scan input data bit.

    MULTI-CHIPLET CLOCK DELAY COMPENSATION
    93.
    发明公开

    公开(公告)号:US20240295898A1

    公开(公告)日:2024-09-05

    申请号:US18663864

    申请日:2024-05-14

    CPC classification number: G06F1/08 H03K5/22 H03K2005/00286

    Abstract: Methods and systems are disclosed for clock delay compensation in a multiple chiplet system. Techniques disclosed include distributing, by a clock generator, a clock signal across distribution trees of respective chiplets; measuring phases, by phase detectors, where each phase measurement is associated with a chiplet of the chiplets and is indicative of a propagation speed of the clock signal through the distribution tree of the chiplet. Then, for each chiplet, techniques are further disclosed that determine, by a microcontroller, based on the phase measurements associated with the chiplet, a delay offset, and that delay, based on the delay offset, the propagation of the clock signal through the distribution tree of the chiplet using a delay unit associated with the chiplet.

    Method and apparatus for providing thermal wear leveling

    公开(公告)号:US12068215B2

    公开(公告)日:2024-08-20

    申请号:US18152022

    申请日:2023-01-09

    Abstract: Exemplary embodiments provide thermal wear spreading among a plurality of thermal die regions in an integrated circuit or among dies by using die region wear-out data that represents a cumulative amount of time each of a number of thermal die regions in one or more dies has spent at a particular temperature level. In one example, die region wear-out data is stored in persistent memory and is accrued over a life of each respective thermal region so that a long term monitoring of temperature levels in the various die regions is used to spread thermal wear among the thermal die regions. In one example, spreading thermal wear is done by controlling task execution such as thread execution among one or more processing cores, dies and/or data access operations for a memory.

    Color channel correlation detection

    公开(公告)号:US12067749B2

    公开(公告)日:2024-08-20

    申请号:US17562777

    申请日:2021-12-27

    Abstract: Systems, apparatuses, and methods for performing color channel correlation detection are disclosed. A compression engine performs a color channel transform on an original set of pixel data to generate a channel transformed set of pixel data. An analysis unit determines whether to compress the channel transformed set of pixel data or the original set of pixel data based on performing a comparison of the two sets of pixel data. In one scenario, the channel transformed set of pixel data is generated by calculating the difference between a first pixel component and a second pixel component for each pixel of the set of pixel data. The difference is then compared to the original first pixel component for each pixel. If the difference is less than or equal to the original for a threshold number of pixels, then the analysis unit decides to apply the color channel transform prior to compression.

Patent Agency Ranking