公开(公告)号：US20100025863A1

公开(公告)日：2010-02-04

申请号：US12510650

申请日：2009-07-28

申请人： Peter Alfred Gruber ,  Jae-Woong Nah

发明人： Peter Alfred Gruber ,  Jae-Woong Nah

IPC分类号： H01L23/50

CPC分类号： H01L23/49894 ,  H01L21/563 ,  H01L21/6835 ,  H01L23/49811 ,  H01L23/49816 ,  H01L24/11 ,  H01L24/12 ,  H01L24/16 ,  H01L24/81 ,  H01L2224/11003 ,  H01L2224/11334 ,  H01L2224/13111 ,  H01L2224/16225 ,  H01L2224/81192 ,  H01L2224/8121 ,  H01L2224/81815 ,  H01L2924/01006 ,  H01L2924/01033 ,  H01L2924/0105 ,  H01L2924/01055 ,  H01L2924/01075 ,  H01L2924/01082 ,  H01L2924/01087 ,  H01L2924/01322 ,  H01L2924/10253 ,  H01L2924/14 ,  H01L2924/00

摘要： Techniques for interconnecting an IC chip and a receiving substrate are provided. A method includes the steps of: providing the IC chip, the IC chip including at least a first connection site formed thereon; providing the receiving substrate, the receiving substrate including at least a second connection site formed thereon; forming an alloy structure on at least a portion of an upper surface of the second connection site; orienting the IC chip relative to the receiving substrate so that the at least first connection site is aligned with the alloy deposit formed on the at least second connection site; and forming an electrical connection between the first and second connection sites, the electrical connection comprising a volume of electrically conductive fusible material, wherein a majority of the volume of electrically conductive fusible material is supplied from the alloy structure.

摘要翻译： 提供了用于互连IC芯片和接收基板的技术。 一种方法包括以下步骤：提供IC芯片，IC芯片至少包括形成在其上的第一连接部位; 提供接收基板，所述接收基板至少包括形成在其上的第二连接部位; 在所述第二连接部位的上表面的至少一部分上形成合金结构; 使所述IC芯片相对于所述接收基板定向，使得所述至少第一连接部位与形成在所述至少第二连接部位上的所述合金沉积物对准; 以及在所述第一和第二连接部位之间形成电连接，所述电连接包括一定体积的导电性易熔材料，其中大部分体积的导电性易熔材料从所述合金结构供给。

公开(公告)号：US20090197114A1

公开(公告)日：2009-08-06

申请号：US12254790

申请日：2008-10-20

申请人： Da-Yuan Shih ,  Donald W. Henderson ,  Sung K. Kang ,  Minhua Lu ,  Jae-Woong Nah ,  Kamalesh Srivastava

发明人： Da-Yuan Shih ,  Donald W. Henderson ,  Sung K. Kang ,  Minhua Lu ,  Jae-Woong Nah ,  Kamalesh Srivastava

IPC分类号： B32B15/01 ,  B23K1/20

CPC分类号： B23K1/008 ,  B23K1/0016 ,  B23K1/203 ,  B23K2101/42 ,  C22C13/00 ,  H01L2224/16225 ,  H05K3/3463 ,  Y10T428/12708 ,  Y10T428/12715

摘要： A solder joint comprising a solder capture pad on a substrate having a circuit; and a lead free solder selected from the group comprising Sn—Ag—Cu solder and Sn—Ag solder adhered to the solder capture pad; the solder selected from the group comprising between 0.1 to 2.0% by weight Sb or Bi, and 0.5 to 3.0% Ag. Formation of voids at an interface between the solder and the solder capture pad is suppressed, by including Zn. Interlayer dielectric delamination is suppressed, and electromigration characteristics are greatly improved. Methods for forming solder joints using the solders.

公开(公告)号：US20090072407A1

公开(公告)日：2009-03-19

申请号：US11855290

申请日：2007-09-14

申请人： Bruce K. Furman ,  Jae-Woong Nah

发明人： Bruce K. Furman ,  Jae-Woong Nah

IPC分类号： H01L23/488

CPC分类号： H01L21/6835 ,  H01L21/563 ,  H01L24/11 ,  H01L24/13 ,  H01L24/81 ,  H01L25/50 ,  H01L2224/05001 ,  H01L2224/05026 ,  H01L2224/05144 ,  H01L2224/05147 ,  H01L2224/05155 ,  H01L2224/05166 ,  H01L2224/05171 ,  H01L2224/05571 ,  H01L2224/05644 ,  H01L2224/11003 ,  H01L2224/11334 ,  H01L2224/13082 ,  H01L2224/13144 ,  H01L2224/13147 ,  H01L2224/13155 ,  H01L2224/1357 ,  H01L2224/13611 ,  H01L2224/13644 ,  H01L2224/13655 ,  H01L2224/73203 ,  H01L2224/73204 ,  H01L2224/81193 ,  H01L2224/81203 ,  H01L2224/81801 ,  H01L2924/00013 ,  H01L2924/01006 ,  H01L2924/01022 ,  H01L2924/01023 ,  H01L2924/01024 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/0105 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/014 ,  H01L2924/14 ,  H05K3/328 ,  H05K2201/0379 ,  H05K2201/10234 ,  H05K2201/10242 ,  H05K2201/10734 ,  H05K2203/0278 ,  H01L2924/00014 ,  H01L2224/13099

摘要： An electrical structure and method for forming. The electrical structure includes a first substrate comprising a first electrically conductive pad, a second substrate comprising a second electrically conductive pad, and an interconnect structure electrically and mechanically connecting the first electrically conductive pad to the second electrically conductive pad. The interconnect structure comprises a non-solder metallic core structure and a first solder structure. The first solder structure electrically and mechanically connects a first portion of the non-solder metallic core structure to the first electrically conductive pad. A second portion of the non-solder metallic core structure is thermo-compression bonded to the second electrically conductive pad.

摘要翻译： 一种电气结构和形成方法。 电结构包括第一衬底，其包括第一导电焊盘，第二衬底，其包括第二导电焊盘，以及将第一导电焊盘电连接和机械连接到第二导电焊盘的互连结构。 互连结构包括非焊料金属芯结构和第一焊料结构。 第一焊料结构将非焊料金属芯结构的第一部分电连接并机械地连接到第一导电焊盘。 非焊接金属芯结构的第二部分被热压接合到第二导电焊盘。