摘要:
An optical semiconductor device has a structure in which a semiconductor active layer is sandwiched by a p-type semiconductor cladding layer and an n-type semiconductor cladding layer and a p-type contact layer is formed on the p-type semiconductor cladding layer side and an n-type contact layer is formed on the n-type semiconductor cladding layer side, wherein two ferromagnetic layers are formed on the n-type contact layer and two ferromagnetic layers are formed on the p-type contact layer. Magnetization directions of a pair of ferromagnetic layers vertically opposed to each other are set to be parallel to each other, and the magnetization directions of adjacent ferromagnetic layers are inverted to each other.
摘要:
An exchange-coupling film has an antiferromagnetic film consisting of an antiferromagnetic alloy such as an RMn alloy or an RMnFe alloy (R is at least one kind of element selected from Ir, Rh, Pt, Au, Ag, Co, Pd, Ni, Cr, Ge, Ru and Cu) and a ferromagnetic film stacked with the antiferromagnetic film. The antiferromagnetic film is oriented in its plane. Further, the antiferromagnetic film has a large grain diameter of such as 5 nm or more. The antiferromagnetic film can be obtained by forming a film with an alloy target of which oxygen content is 1% by weight or less. An exchange-coupling film using such an antiferromagnetic film has exchange-coupling force enough large at room temperature and high temperature region together with excellent corrosion resistance or heat resistance. The exchange-coupling film is provided with an electrode for energizing an electric current to the ferromagnetic film and is used as, for example, a spin valve type magneto-resistance effect element.
摘要:
A magnetoresistance effect element provided with a spin valve film composed of a first magnetic layer formed on a metallic buffer layer, a middle non-magnetic layer formed on the first magnetic layer, and a second magnetic layer formed on the non-magnetic layer, has an atomic-diffusion barrier layer whose average thickness is 2 nm or less formed in the interface between the metallic buffer layer and the first magnetic layer. Or a magnetoresistance effect element provided with a spin valve film composed of a first magnetic layer composed of a laminated film of a magnetic undercoat layer and a ferromagnetic layer, a middle non-magnetic layer formed on the first magnetic layer, and a second magnetic layer formed on the middle non-magnetic layer, has an atomic-diffusion barrier layer whose average thickness is 2 nm or less formed in the interface between the magnetic undercoat layer and the ferromagnetic layer.
摘要:
The present invention provides an exchange coupling film having a stacked-film-structure consisting of a ferromagnetic film made of at least one material of Fe, Co and Ni, and an antiferromagnetic film, wherein the exchange coupling film made of a ferromagnetic material to which an element is added, is provided at the interface between the ferromagnetic film and the antiferromagnetic film so as to improve the lattice matching, which results in the enhancement of the exchange coupling force, and a magnetoresistance effect element including such an exchange coupling film as described above, and an electrode for supplying a current to the ferromagnetic film which constitutes the exchange coupling film.
摘要:
It is an object of the present invention to provide a magnetoresistance effect element which has a film with a spin valve structure or an artificial lattice film having good soft magnetic characteristics, and which can be applied to a high-sensitivity magnetic head. The present invention provides a magnetoresistance effect element including a stacked film formed on a substrate by sequentially stacking a ferromagnetic film containing as its main constituents at least one elements selected from the group consisting of Co, Fe, and Ni, a nonmagnetic film, and the ferromagnetic film, wherein the two ferromagnetic films are not coupled with each other, and the closest packed plane of each ferromagnetic film is oriented in a direction perpendicular to the film surface.
摘要:
Magnetic sensor comprises a pair of hard magnetic films magnetized inplane in directions substantially perpendicular to the direction of a signal magnetic field and substantially equal to each other, a soft magnetic film formed in the same plane as the pair of hard magnetic films and interposed between the pair of hard magnetic films and held in contact therewith or in proximity thereto, and a signal magnetic field detecting film superposed on the main surface of the soft magnetic film. A magnetic recording.reproducing head using this reproducing head comprises the reproducing head mentioned above, a pair of magnetic pole layers vertically opposed to each other through the medium of a recording gap, and a recording head possessed of a recording track width equal to or smaller than the reproducing track width of the reproducing head. The reproducing track width L.sub.1 is so set as to satisfy the relation, L.sub.2
摘要:
It is an object of the present invention to provide a magnetoresistance effect element which has a film with a spin valve structure or an artificial lattice film having good soft magnetic characteristics, and which can be applied to a high-sensitivity magnetic head. The present invention provides a magnetoresistance effect element including a stacked film formed on a substrate by sequentially stacking a ferromagnetic film containing as its main constituents at least one elements selected from the group consisting of Co, Fe, and Ni, a nonmagnetic film, and the ferromagnetic film, wherein the two ferromagnetic films are not coupled with each other, and the closest packed plane of each ferromagnetic film is oriented in a direction perpendicular to the film surface.
摘要:
A magnetic material with an improved maximum energy product useful for high performance permanent magnet, bond magnet and other applications is disclosed. The magnetic material is expressed in a general formula R1.sub.x R2.sub.y M.sub.100-x-y where R1 is at least one element selected from the rare earth elements, R2 is at least one element selected from elements having an atomic radius in a range of 0.156 to 0.174 nm, M is at least one element selected from Fe and Co and x and y are atomic percent individually defined as x.gtoreq.2, y.gtoreq.0.01 and 4.ltoreq.x+y.ltoreq.20, and M occupying 90 atomic percent or more in the principal phase of the compound.
摘要:
Disclosed is a magnetic material which suppresses formation of impurity phase of Fe, Co or Fe-Co alloy, possesses a stable ThMn.sub.12 crystal structure as the principal phase, and is excellent in magnetic properties and lower in cost. Such magnetic material is expressed in a general formula:R1.sub.x R2.sub.y Si.sub.z M.sub.u T.sub.vwhere R1is at least one element selected from Zr and Hf, R2is at least one element selected from rare earth element, M is at least one element selected from C, N and P, T is at least one element selected from Fe and Co, x+y+z+u+v=100, x, y, z, u, v are atomic percent individually defined as 0.1.ltoreq.x.ltoreq.20, 2.ltoreq.y.ltoreq.20, 0.5.ltoreq.z.ltoreq.20, 0.ltoreq.u.ltoreq.20, v.gtoreq.50, and of which principal phase possesses a ThMn.sub.12 crystal structure.
摘要翻译:公开了抑制Fe,Co或Fe-Co合金的杂质相的形成的磁性材料,其具有稳定的ThMn12晶体结构作为主相,磁性优异,成本低。 这种磁性材料以通式表示:R1xR2ySizMuTv其中R1为选自Zr和Hf中的至少一种元素,R2为选自稀土元素中的至少一种元素,M为选自C,N和P中的至少一种元素,T为 选自Fe和Co中的至少一种元素,x + y + z + u + v = 100,x,y,z,u,v是原子百分数,各自定义为0.1≤x≤20,2/ = y = 20,0.5 = z = 20,0 / = 50,其主相具有ThMn12晶体结构。
摘要:
A magnetoresistance effect element is prepared by successively forming one upon the other a first magnetic layer, a P- or N-type semiconductor layer, a second magnetic layer, and a magnetization fixing layer in this order on an insulating substrate. A Schottky junction is formed between the first magnetic layer and the semiconductor layer and between the semiconductor layer and the second magnetic layer. The relative angle between the magnetization direction within the first magnetic layer and the magnetization direction within the second magnetic layer is changed depending on the intensity of the magnetic field, leading to a change in the tunnel conductance.