公开(公告)号：US20170336263A1

公开(公告)日：2017-11-23

申请号：US15597544

申请日：2017-05-17

Applicant: AOI ELECTRONICS CO., Ltd. ,  NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY

Inventor： Hiroki HAYASHI ,  Ichiro ISHIMARU

IPC: G01J3/447 ,  G01J3/45 ,  G01J3/02

CPC classification number: G01J3/447 ,  G01J3/0224 ,  G01J3/0289 ,  G01J3/45 ,  G01J3/50 ,  G01N21/21 ,  G01N21/255 ,  G01N21/55 ,  G01N2021/217 ,  G01N2021/559 ,  G01N2201/0642

Abstract: Reflected light detecting device and method with surface reflected light components collectively be extracted/removed when detecting reflected light arising in casting light onto target-object range having non-planar surface. The device includes: a first illuminating device causing first-measurement light in predetermined polarization direction to enter target-object first region from first direction; polarization optical system position part of first-surface reflected light enters the polarization optical system, the first-surface reflected light being the first-measurement in the first region surface; a second illuminating device causing second-measurement light in the same first-measurement light polarization direction to enter second region from second direction, the second region being on the target-object surface, different from the first region; adjusting direction of the second-measurement light optical axis so part of second-surface reflected light enters the polarization optical system, the second-surface reflected light being the second-measurement in second region surface; and detecting light having passed through the polarization optical system.

公开(公告)号：US20170280991A1

公开(公告)日：2017-10-05

申请号：US15625815

申请日：2017-06-16

Applicant: ABBOTT MEDICAL OPTICS INC.

Inventor： Stanley W. Huth ,  Denise Tran

IPC: A61B3/10 ,  A61B3/00 ,  G01J3/45

CPC classification number: A61B3/101 ,  A61B3/0025 ,  A61B3/1005 ,  G01B11/06 ,  G01J3/45

Abstract: A method for determining reflectivity of a tear film lipid layer of a patient and recommending a course of treatment based on the same. The method includes the steps of: measuring a tear film aqueous plus lipid layer relative reflectance spectrum using a wavelength-dependent optical interferometer; converting the measured tear film aqueous plus lipid layer relative reflectance spectrum to a calculated absolute reflectance spectrum; comparing the calculated absolute reflectance spectrum to a theoretical absolute lipid reflectance spectrum to determine a tear film lipid layer thickness; and determining a reflectivity value for the tear film lipid layer thickness at a first wavelength of light corresponding to ultraviolet, violet, or blue light.

公开(公告)号：US09778105B2

公开(公告)日：2017-10-03

申请号：US14518588

申请日：2014-10-20

Applicant: WAYNE STATE UNIVERSITY

Inventor： Gregory W. Auner ,  Changhe Huang ,  Christopher M. Thrush ,  Michelle Brusatori

IPC: G01J3/28 ,  G01J3/02 ,  G02B5/18 ,  G01J3/18 ,  G01J3/44 ,  G01J3/453 ,  G01J3/45

CPC classification number: G01J3/021 ,  G01J3/18 ,  G01J3/44 ,  G01J3/4412 ,  G01J3/45 ,  G01J3/4531 ,  G01J3/4532 ,  G02B5/1861

Abstract: An apparatus for performing Raman spectral analysis of a sample is described, comprising a coherent light source, an first optical chain to direct the coherent light to impinge on the sample, a second optical chain to direct the scattered light onto a diffraction grating, and a third optical chain to direct the diffracted light onto detection array. The diffraction grating is a stairstep with a metalized surface, and a plurality of metalized stripes on a flat surface is disposed in a direction orthogonal to the long dimension of the stairsteps. The region between the flat surface and the stairstep is transparent. The zeroth-order fringe is selected by a slit and directed onto camera. The resultant interferogram is Fourier transformed to produce a representation of the Raman spectrum.

公开(公告)号：US20170268866A1

公开(公告)日：2017-09-21

申请号：US15505420

申请日：2015-08-19

Applicant: Martin BERZ

Inventor： Martin BERZ

IPC: G01B9/02 ,  G01J3/453 ,  G01B11/24

CPC classification number: G01B9/02072 ,  G01B9/02097 ,  G01B11/2441 ,  G01J3/45 ,  G01J3/453 ,  G01J9/02

Abstract: An interferometer includes a first interferometer arm and a second interferometer arm. A first central beam, originating from a central image point of an image, passes through the first interferometer arm. A second central beam, originating from the central image point, passes through the second interferometer arm. The first central beam and the second central beam are superimposed and generate a kperpendicular=0 interference at a superposition point. A first light beam perpendicular to the first central beam, originating from an image point of the image, passes through the first interferometer arm. A second light beam perpendicular to the second central beam, originating from the image point, passes through the second interferometer arm. The first light beam and the second light beam overlap at the superposition point. At the superposition point, a wave vector component of the first light beam opposes a wave vector component of the second light beam.

公开(公告)号：US09766128B1

公开(公告)日：2017-09-19

申请号：US07220697

申请日：1988-07-06

Applicant: Herbert A. French ,  Philip Sutton

Inventor： Herbert A. French ,  Philip Sutton

IPC: G02B27/46 ,  G01J3/45 ,  G01J9/00

CPC classification number: G01J3/45 ,  G01J3/0229 ,  G01J3/0297 ,  G01J3/18 ,  G01J9/00 ,  G01J2003/1213 ,  G01J2003/1278

Abstract: A filter for removing coherent radiation from a source in a field of view, substantially independent of the size of the source, comprises a first reticle 22 located in the path of received light 21, a first lens 23 producing an optical transform of the first reticle 22 at a second reticle 24 located in the image plane of the first lens 23, a second lens 25 producing an optical transform of the second reticle 24 and a third reticle 26 located in the image plane of the second lens 25. The arrangement is such that the spatial transmittance of the third reticle 26 is selected to block at least part of the diffracted image of the first reticle 22 produced in the image plane of the second lens 25 and characteristic of the coherent radiation. Preferably the optical transforms are Fourier Transforms. A monochromatic coherent source in the field of view produces a pattern of diffracted energy in the image plane of the second lens which is independent of the size of the source. Thus, by providing a suitable reticle 26 in the image plane of the second lens light from a coherent source in the field of view can be blocked while polychromatic light is transmitted. The first and second reticles may be periodic picket-fence reticles or different spatial frequencies may be used for the first and third reticles so as to vary the stop-band characteristics of the filter.

公开(公告)号：US09746378B2

公开(公告)日：2017-08-29

申请号：US14311859

申请日：2014-06-23

Applicant: Anis Rahman

Inventor： Anis Rahman

IPC: G01N21/35 ,  G01J3/45 ,  G01J3/02 ,  G01J3/42 ,  G01N21/3586 ,  G02F1/35 ,  G02F1/355 ,  G01J3/26 ,  G01N21/90

CPC classification number: G01J3/45 ,  G01J3/02 ,  G01J3/0232 ,  G01J3/26 ,  G01J3/42 ,  G01N21/3586 ,  G01N21/9027 ,  G02F1/353 ,  G02F1/3558 ,  G02F2203/13

Abstract: Terahertz spectrometer having a wider range of terahertz radiation source, high temporal resolution of scanning (

公开(公告)号：US09727052B2

公开(公告)日：2017-08-08

申请号：US14414653

申请日：2014-02-14

Applicant: Halliburton Energy Services, Inc.

Inventor： James M Price ,  Aditya B. Nayak ,  David L. Perkins

IPC: G01J3/00 ,  G05B19/4099 ,  G01J3/28 ,  G01N21/31 ,  B29D11/00 ,  G01N21/84 ,  G02B5/28 ,  B32B3/26

CPC classification number: G05B19/4099 ,  B29D11/0073 ,  B32B3/266 ,  B32B2307/40 ,  B32B2307/418 ,  B32B2307/732 ,  B32B2551/00 ,  G01J3/0264 ,  G01J3/0286 ,  G01J3/08 ,  G01J3/12 ,  G01J3/28 ,  G01J3/45 ,  G01J2003/1226 ,  G01N21/31 ,  G01N21/8422 ,  G01N2021/8438 ,  G02B5/285 ,  G02B5/287 ,  G05B2219/49023

Abstract: Technologies are described for monitoring characteristics of layers of integrated computational elements (ICEs) during fabrication using an in-situ spectrometer operated in step-scan mode in combination with lock-in or time-gated detection. As part of the step-scan mode, a wavelength selecting element of the spectrometer is discretely scanned to provide spectrally different instances of probe-light, such that each of the spectrally different instances of the probe-light is provided for a finite time interval. Additionally, an instance of the probe-light interacted during the finite time interval with the ICE layers includes a modulation that is being detected by the lock-in or time-gated detection over the finite time interval.

公开(公告)号：US09658107B2

公开(公告)日：2017-05-23

申请号：US15130876

申请日：2016-04-15

Applicant: Si-Ware Systems

Inventor： Momen Anwar ,  Mostafa Medhat ,  Bassem Mortada ,  Ahmed Othman El Shater ,  Mina Gad Seif ,  Muhammed Nagy ,  Bassam A. Saadany ,  Amr N. Hafez

IPC: G01B9/02 ,  G01J3/453 ,  G02B26/08 ,  G01J3/45 ,  G01B7/06

CPC classification number: G01J3/4532 ,  G01B7/08 ,  G01B9/02068 ,  G01B9/02071 ,  G01B2290/35 ,  G01J3/45 ,  G01J3/4535 ,  G02B26/0841

Abstract: A Micro-Electro-Mechanical System (MEMS) apparatus provides for self-calibration of mirror positioning of a moveable mirror of an interferometer. At least one mirror in the MEMS apparatus includes a non-planar surface. The moveable mirror is coupled to a MEMS actuator having a variable capacitance. The MEMS apparatus includes a capacitive sensing circuit for determining the capacitance of the MEMS actuator at multiple reference positions of the moveable mirror corresponding to a center burst and one or more secondary bursts of an interferogram produced by the interferometer based on the non-planar surface. A calibration module uses the actuator capacitances at the reference positions to compensate for any drift in the capacitive sensing circuit.

公开(公告)号：US20170138790A1

公开(公告)日：2017-05-18

申请号：US15321756

申请日：2015-06-29

Applicant: Spectral Engines Oy

Inventor： Jarkko Antila ,  Uula Kantojärvi ,  Altti Akujärvi ,  Mikko Tuohiniemi ,  Jussi Mäkynen

IPC: G01J3/02 ,  G01J3/45 ,  G01J3/26

CPC classification number: G01J3/0297 ,  G01J3/0227 ,  G01J3/0264 ,  G01J3/027 ,  G01J3/0286 ,  G01J3/26 ,  G01J3/28 ,  G01J3/45 ,  G01J2003/2879 ,  G02B26/001

Abstract: A method for determining spectral calibration data (λcal(Sd), Sd,cal(λ)) of a Fabry-Perot interferometer (100) comprises: forming a plurality of filtered spectral peaks (P′1, P′2) by filtering input light (LB1) with a Fabry-Perot etalon (50) such that a first filtered peak (P′1) corresponds to a first transmittance peak (P1) of the etalon (50), and such that a second filtered peak (P′2) corresponds to a second transmittance peak (P1) of the etalon (50), using the Fabry-Perot interferometer (100) for measuring a spectral intensity distribution (M(Sd)) of the filtered spectral peaks (P′1, P′2), wherein the spectral intensity distribution (M(Sd)) is measured by varying the mirror gap (dFP) of the Fabry-Perot interferometer (100), and by providing a control signal (Sd) indicative of the mirror gap (dFP), and determining the spectral calibration data (λcal(Sd), Sd,cal(λ)) by matching the measured spectral intensity distribution (M(Sd)) with the spectral transmittance (TE(λ)) of the etalon (50).

公开(公告)号：US20170122807A1

公开(公告)日：2017-05-04

申请号：US15292477

申请日：2016-10-13

Applicant: Seiko Epson Corporation

Inventor： Hideaki KASAHARA ,  Masashi KANAI

IPC: G01J3/26 ,  G01J3/28 ,  G01J3/45 ,  G01J3/02

CPC classification number: G01J3/26 ,  G01J3/027 ,  G01J3/2823 ,  G01J3/45 ,  G01J3/51 ,  G01J3/524

Abstract: A spectroscopic camera includes a wavelength variable interference filter, and an image sensor that receives light which is transmitted through the wavelength variable interference filter. Measurement is implemented a plurality of times by causing measurement light to be incident to the wavelength variable interference filter and changing the wavelength of light that is transmitted by the wavelength variable interference filter. Reflectance based on the intensity of light when a first pixel of the image sensor receives light of a target wavelength, is predicted in the respective plurality of repetitions of measurement on the basis of a light reception central wavelength of light that the first pixel receives, and reflectance that is calculated on the basis of the intensity of light that is received by the first pixel.