Protective coating system for reflective optical elements, reflective optical element and method for the production thereof
    11.
    发明申请
    Protective coating system for reflective optical elements, reflective optical element and method for the production thereof 有权
    用于反射光学元件的保护涂层系统,反射光学元件及其制造方法

    公开(公告)号:US20050276988A1

    公开(公告)日:2005-12-15

    申请号:US11150740

    申请日:2005-06-10

    Inventor: Johann Trenkler

    CPC classification number: G02B5/0891 B82Y10/00 G03F7/70958 G21K1/062

    Abstract: A limiting factor in the operation of EUV lithographic devices is the lifetime or the reflectivity of the reflective optics that is reduced by contamination with carbon-containing substances. Protective coatings that are resistant to oxidation or are inert against water are already known. According to the invention it is proposed to deposit protective coatings on, for example, multilayers that suppress the growth of carbon-containing substances in combination with layers that are inert against residual gas atmosphere and energy input. Even with a long operating time a high reflectivity is thereby retained. The protective coatings may be deposited by electron-beam vaporization, magnetron- or ion-beam sputtering.

    Abstract translation: EUV光刻设备操作的一个限制因素是反射光学器件的寿命或反射率,其通过含碳物质的污染而减少。 耐氧化或对水是惰性的保护涂层是已知的。 根据本发明,提出了将保护涂层沉积在例如抑制含碳物质的生长与多余层的组合的多层膜上,这些层对残留气体气氛和能量输入是惰性的。 即使在较长的操作时间内也能保持较高的反射率。 保护涂层可以通过电子束蒸发,磁控管或离子束溅射沉积。

    Projection objective and method for its manufacture
    12.
    发明申请
    Projection objective and method for its manufacture 有权
    投影目的及其制造方法

    公开(公告)号:US20050134980A1

    公开(公告)日:2005-06-23

    申请号:US11014537

    申请日:2004-12-16

    Abstract: A method of manufacturing a projection objective (22) of a microlithographic projection exposure apparatus (10) is described. The projection objective (22) comprises at least one mirror (M1 to M6) that each have a mirror support (241 to 246) and a reflective coating (26) applied thereon. First imaging aberrations of a pre-assembled projection objective are measured. Before the coating (26) is applied, the mirror supports (241 to 246) are provided with a desired surface deformation (34). If the mirrors (M1 to M6) are not reflective for projection light without the coating (26), measuring light is used that has another wavelength. Alternatively, two identical mirror supports (246) may be provided. One support having a reflective coating is part of the pre-assembled projection objective whose imaging aberrations are measured. The other support is provided with surface deformations before coating and mounting the support into the objective.

    Abstract translation: 描述了制造微光刻投影曝光装置(10)的投影物镜(22)的方法。 投影物镜(22)包括至少一个镜子(M 1至M 6),每个镜子具有镜支撑件(241至246)和反射涂层(26)。 测量预组装的投影物镜的第一成像像差。 在施加涂层(26)之前,反射镜支撑件(241至246)具有期望的表面变形(34)。 如果反射镜(M 1至M 6)对于没有涂层(26)的投射光不反射,则使用具有另一波长的测量光。 或者,可以提供两个相同的反射镜支撑件(246)。 具有反射涂层的一个支撑件是预组装的投影物镜的一部分,其测量成像像差。 另一个支撑件在涂覆和将支撑件安装到物镜之前提供了表面变形。

    REFLECTIVE OPTICAL ELEMENT AND EUV LITHOGRAPHY APPLIANCE
    14.
    发明申请
    REFLECTIVE OPTICAL ELEMENT AND EUV LITHOGRAPHY APPLIANCE 有权
    反射光学元件和EUV光刻设备

    公开(公告)号:US20120293779A1

    公开(公告)日:2012-11-22

    申请号:US13530192

    申请日:2012-06-22

    Abstract: A reflective optical element and an EUV lithography appliance containing one such element are provided, the appliance displaying a low propensity to contamination. The reflective optical element has a protective layer system includes at least two layers. The optical characteristics of the protective layer system are between those of a spacer and an absorber, or correspond to those of a spacer. The selection of a material with the smallest possible imaginary part and a real part which is as close to 1 as possible in terms of the refractive index leads to a plateau-type reflectivity course according to the thickness of the protective layer system between two thicknesses d1 and d2. The thickness of the protective layer system is selected in such a way that it is less than d2.

    Abstract translation: 提供了包含一个这样的元件的反射光学元件和EUV光刻设备,该器具显示出低的污染倾向。 反射型光学元件具有包括至少两层的保护层系统。 保护层系统的光学特性在间隔物和吸收体的光学特性之间,或者对应于间隔物的光学特性。 选择具有尽可能小的虚部的材料和在折射率方面尽可能接近1的实部导致根据两个厚度之间的保护层系统的厚度d1的平台型反射率过程 和d2。 保护层系统的厚度选择为小于d2。

    Reflective optical element and EUV lithography appliance
    15.
    发明授权
    Reflective optical element and EUV lithography appliance 有权
    反光光学元件和EUV光刻设备

    公开(公告)号:US08243364B2

    公开(公告)日:2012-08-14

    申请号:US13118028

    申请日:2011-05-27

    Abstract: A reflective optical element and an EUV lithography appliance containing one such element are provided, the appliance displaying a low propensity to contamination. The reflective optical element has a protective layer system includes at least two layers. The optical characteristics of the protective layer system are between those of a spacer and an absorber, or correspond to those of a spacer. The selection of a material with the smallest possible imaginary part and a real part which is as close to 1 as possible in terms of the refractive index leads to a plateau-type reflectivity course according to the thickness of the protective layer system between two thicknesses d1 and d2. The thickness of the protective layer system is selected in such a way that it is less than d2.

    Abstract translation: 提供了包含一个这样的元件的反射光学元件和EUV光刻设备,该器具显示出低的污染倾向。 反射型光学元件具有包括至少两层的保护层系统。 保护层系统的光学特性在间隔物和吸收体的光学特性之间,或者对应于间隔物的光学特性。 选择具有尽可能小的虚部的材料和在折射率方面尽可能接近1的实部导致根据两个厚度之间的保护层系统的厚度d1的平台型反射率过程 和d2。 保护层系统的厚度选择为小于d2。

    Projection objective for microlithography, projection exposure apparatus, projection exposure method and optical correction plate
    16.
    发明授权
    Projection objective for microlithography, projection exposure apparatus, projection exposure method and optical correction plate 有权
    微光刻投影目标,投影曝光装置,投影曝光法和光学校正板

    公开(公告)号:US08228483B2

    公开(公告)日:2012-07-24

    申请号:US12698242

    申请日:2010-02-02

    CPC classification number: G03F7/70983 G03F1/62 G03F7/70308 Y10T428/24612

    Abstract: A projection objective is disclosed. The projection objective can include a plurality of optical elements arranged to image a pattern from an object field in an object surface of the projection objective to an image field in an image surface of the projection objective with electromagnetic operating radiation from a wavelength band around an operating wavelength λ. The plurality of optical elements can include an optical correction plate that includes a body comprising a material transparent to the operating radiation, the body having a first optical surface, a second optical surface, a plate normal substantially perpendicular to the first and second optical surfaces, and a thickness profile defined as a distance between the first and second optical surfaces measured parallel to the plate normal. The first optical surface can have a non-rotationally symmetric aspheric first surface profile with a first peak-to-valley value PV1>λ. The second optical surface can have a non-rotationally symmetric aspheric second surface profile with a second peak-to-valley value PV2>λ. A thickness of the optical correction plate can vary by less than 0.1*(PV1+PV2)/2 across the optical correction plate.

    Abstract translation: 公开了一种投影物镜。 投影物镜可以包括多个光学元件,其布置成将图案从投影物镜的物体表面中的物场映射到投影物镜的图像表面中的图像场,其中电磁操作辐射来自围绕操作的波长带 波长λ。 多个光学元件可以包括光学校正板,其包括主体,该主体包括对操作辐射透明的材料,该主体具有第一光学表面,第二光学表面,基本上垂直于第一和第二光学表面的板法线, 以及限定为平行于板法线测量的第一和第二光学表面之间的距离的厚度分布。 第一光学表面可以具有第一峰谷值PV1>λ的非旋转对称非球面第一表面轮廓。 第二光学表面可以具有非旋转对称的非球面第二表面轮廓,具有第二峰谷值PV2>λ。 光学校正板的厚度可以在光学校正板上变化小于0.1 *(PV1 + PV2)/ 2。

    PROJECTION OBJECTIVE AND METHOD FOR ITS MANUFACTURE
    18.
    发明申请
    PROJECTION OBJECTIVE AND METHOD FOR ITS MANUFACTURE 有权
    投影目标及其制造方法

    公开(公告)号:US20100149517A1

    公开(公告)日:2010-06-17

    申请号:US12710487

    申请日:2010-02-23

    Abstract: A method of manufacturing a projection objective (22) of a microlithographic projection exposure apparatus (10). The projection objective (22) comprises at least one mirror (M1 to M6) that each have a mirror support (241 to 246) and a reflective coating (26) applied thereon. First imaging aberrations of a pre-assembled projection objective are measured. Before the coating (26) is applied, the mirror supports (241 to 246) are provided with a desired surface deformation (34). If the mirrors (M1 to M6) are not reflective for projection light without the coating (26), measuring light is used that has another wavelength. Alternatively, two identical mirror supports (246) may be provided. One support having a reflective coating is part of the pre-assembled projection objective whose imaging aberrations are measured. The other support is provided with surface deformations before coating and mounting the support into the objective.

    Abstract translation: 一种制造微光刻投影曝光装置(10)的投影物镜(22)的方法。 投影物镜(22)包括至少一个镜子(M1至M6),每个镜子具有镜支撑件(241至246)和反射涂层(26)。 测量预组装的投影物镜的第一成像像差。 在施加涂层(26)之前,反射镜支撑件(241至246)具有期望的表面变形(34)。 如果反射镜(M1至M6)对于没有涂层(26)的投影光不反射,则使用具有另一波长的测量光。 或者,可以提供两个相同的反射镜支撑件(246)。 具有反射涂层的一个支撑件是预组装的投影物镜的一部分,其测量成像像差。 另一个支撑件在涂覆和将支撑件安装到物镜之前提供了表面变形。

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