Methods of forming layers comprising epitaxial silicon
    11.
    发明申请
    Methods of forming layers comprising epitaxial silicon 有权
    形成包含外延硅的层的方法

    公开(公告)号:US20070166962A1

    公开(公告)日:2007-07-19

    申请号:US11712151

    申请日:2007-02-28

    IPC分类号: H01L21/20

    摘要: The invention includes methods of forming layers comprising epitaxial silicon. In one implementation, an opening is formed within a first material received over a monocrystalline material. Opposing sidewalls of the opening are lined with a second material, with monocrystalline material being exposed at a base of the second material-lined opening. A silicon-comprising layer is epitaxially grown from the exposed monocrystalline material within the second material-lined opening. At least a portion of the second material lining is in situ removed. Other aspects and implementations are contemplated.

    摘要翻译: 本发明包括形成包含外延硅的层的方法。 在一个实施方案中,在通过单晶材料接收的第一材料内形成开口。 开口的相对侧壁衬有第二材料,其中单晶材料暴露在第二材料衬里开口的基部处。 在第二材料衬里的开口内从暴露的单晶材料外延生长含硅层。 第二材料衬里的至少一部分被原位去除。 考虑了其他方面和实现。

    Semiconductor constructions
    12.
    发明申请
    Semiconductor constructions 失效
    半导体结构

    公开(公告)号:US20070075349A1

    公开(公告)日:2007-04-05

    申请号:US11591254

    申请日:2006-10-31

    IPC分类号: H01L29/94

    摘要: The invention includes a method of depositing a noble metal. A substrate is provided. The substrate has a first region and a second region. The first and second regions are exposed to a mixture comprising a precursor of a noble metal and an oxidant. During the exposure, a layer containing the noble metal is selectively deposited onto the first region relative to the second region. In particular applications, the first region can comprise borophosphosilicate glass, and the second region can comprise either aluminum oxide or doped non-oxidized silicon. The invention also includes capacitor constructions and methods of forming capacitor constructions.

    摘要翻译: 本发明包括沉积贵金属的方法。 提供基板。 衬底具有第一区域和第二区域。 第一和第二区域暴露于包含贵金属和氧化剂的前体的混合物中。 在曝光期间,包含贵金属的层相对于第二区域选择性地沉积在第一区域上。 在具体应用中,第一区域可以包括硼磷硅酸盐玻璃,并且第二区域可以包括氧化铝或掺杂的非氧化硅。 本发明还包括电容器结构和形成电容器结构的方法。

    DRAM constructions, memory arrays and semiconductor constructions
    14.
    发明申请
    DRAM constructions, memory arrays and semiconductor constructions 有权
    DRAM结构,存储器阵列和半导体结构

    公开(公告)号:US20050104111A1

    公开(公告)日:2005-05-19

    申请号:US11015689

    申请日:2004-12-17

    摘要: The invention includes a method of depositing a noble metal. A substrate is provided. The substrate has a first region and a second region. The first and second regions are exposed to a mixture comprising a precursor of a noble metal and an oxidant. During the exposure, a layer containing the noble metal is selectively deposited onto the first region relative to the second region. In particular applications, the first region can comprise borophosphosilicate glass, and the second region can comprise either aluminum oxide or doped non-oxidized silicon. The invention also includes capacitor constructions and methods of forming capacitor constructions.

    摘要翻译: 本发明包括沉积贵金属的方法。 提供基板。 衬底具有第一区域和第二区域。 第一和第二区域暴露于包含贵金属和氧化剂的前体的混合物中。 在曝光期间,包含贵金属的层相对于第二区域选择性地沉积在第一区域上。 在具体应用中,第一区域可以包括硼磷硅酸盐玻璃,并且第二区域可以包括氧化铝或掺杂的非氧化硅。 本发明还包括电容器结构和形成电容器结构的方法。

    Method of forming a capacitor
    16.
    发明申请
    Method of forming a capacitor 审中-公开
    形成电容器的方法

    公开(公告)号:US20060120019A1

    公开(公告)日:2006-06-08

    申请号:US11326018

    申请日:2006-01-05

    IPC分类号: H01G4/228

    摘要: Methods of forming a capacitor are disclosed. The methods may comprise the steps of forming a substrate assembly and forming a first electrode on the substrate assembly. The first electrode may be formed to include at least one non-smooth surface and may be formed from a material selected from the group consisting of transition metals, conductive oxides, alloys thereof, and combinations thereof. The methods may also comprise the step of forming a dielectric on the first electrode and an uppermost surface of the substrate assembly, and forming a second electrode on the dielectric. The second electrode may be formed to include at least one non-smooth surface. Also, the dielectric and the second electrode may be formed only within the first electrode.

    摘要翻译: 公开了形成电容器的方法。 该方法可以包括形成衬底组件并在衬底组件上形成第一电极的步骤。 第一电极可以形成为包括至少一个非光滑表面,并且可以由选自过渡金属,导电氧化物,其合金及其组合的材料形成。 所述方法还可以包括在所述第一电极和所述基板组件的最上表面上形成电介质的步骤,以及在所述电介质上形成第二电极。 第二电极可以形成为包括至少一个非光滑表面。 此外,电介质和第二电极可以仅形成在第一电极内。

    Structures having an electrode formed from a transition metal or a conductive metal-oxide
    17.
    发明申请
    Structures having an electrode formed from a transition metal or a conductive metal-oxide 审中-公开
    具有由过渡金属或导电金属氧化物形成的电极的结构

    公开(公告)号:US20060097348A1

    公开(公告)日:2006-05-11

    申请号:US11315638

    申请日:2005-12-22

    IPC分类号: H01L29/00 H01L29/94

    摘要: Structures having an electrode formed from a transition metal or a conductive metal oxide are disclosed. The structures may comprise a first electrode made of a material selected from the group consisting of transition metals, conductive metal-oxides, alloys thereof, and combinations thereof The first electrode may comprise a first non-smooth surface, and the first non-smooth surface may comprise a concave hemispherical grain. The structures may also comprise a dielectric in contact with the first electrode and a surface of a substrate assembly.

    摘要翻译: 公开了具有由过渡金属或导电金属氧化物形成的电极的结构。 所述结构可以包括由选自过渡金属,导电金属氧化物,其合金及其组合的材料制成的第一电极。第一电极可以包括第一非光滑表面,并且第一非光滑表面 可以包括凹的半球形颗粒。 该结构还可以包括与第一电极和衬底组件的表面接触的电介质。

    Methods of forming material over substrates
    18.
    发明申请
    Methods of forming material over substrates 审中-公开
    在基材上形成材料的方法

    公开(公告)号:US20050227003A1

    公开(公告)日:2005-10-13

    申请号:US10822016

    申请日:2004-04-08

    IPC分类号: B05D5/12 C23C16/00 C23C16/40

    CPC分类号: C23C16/45531 C23C16/40

    摘要: The invention includes ALD-type methods in which two or more different precursors are provided within a chamber at different and substantially non-overlapping times relative to one another to form a material, and the material is thereafter exposed to one or more reactants to change a composition of the material. In particular aspects, the precursors utilized to form the material are metal-containing precursors, and the reactant utilized to change the composition of the material comprises oxygen, silicon, and/or nitrogen.

    摘要翻译: 本发明包括ALD型方法,其中两个或多个不同的前体在腔室内以相对于彼此的不同和基本上不重叠的时间提供以形成材料,然后将材料暴露于一种或多种反应物以改变 材料的组成。 在特定方面,用于形成材料的前体是含金属的前体,用于改变材料组成的反应物包括氧,硅和/或氮。

    METHODS OF FORMING CAPACITORS
    19.
    发明申请
    METHODS OF FORMING CAPACITORS 失效
    形成电容器的方法

    公开(公告)号:US20050032302A1

    公开(公告)日:2005-02-10

    申请号:US10636035

    申请日:2003-08-06

    摘要: A method of forming a capacitor includes forming a conductive metal first electrode layer over a substrate, with the conductive metal being oxidizable to a higher degree at and above an oxidation temperature as compared to any degree of oxidation below the oxidation temperature. At least one oxygen containing vapor precursor is fed to the conductive metal first electrode layer below the oxidation temperature under conditions effective to form a first portion oxide material of a capacitor dielectric region over the conductive metal first electrode layer. At least one vapor precursor is fed over the first portion at a temperature above the oxidation temperature effective to form a second portion oxide material of the capacitor dielectric region over the first portion. The oxide material of the first portion and the oxide material of the second portion are common in chemical composition. A conductive second electrode layer is formed over the second portion oxide material of the capacitor dielectric region.

    摘要翻译: 形成电容器的方法包括在衬底上形成导电金属第一电极层,与在氧化温度以下的任何氧化度相比,导电金属可以在氧化温度以上高于可氧化的程度。 在导电金属第一电极层上有效形成电容器电介质区域的第一部分氧化物材料的条件下,在氧化温度以下将至少一种含氧气体前体供给到导电金属第一电极层。 至少一种蒸气前体在高于氧化温度的温度下在第一部分上进料,有效地在第一部分上形成电容器电介质区域的第二部分氧化物材料。 第一部分的氧化物材料和第二部分的氧化物材料在化学组成中是常见的。 在电容器电介质区域的第二部分氧化物材料上形成导电的第二电极层。

    Methods of forming material over substrates
    20.
    发明申请
    Methods of forming material over substrates 有权
    在基材上形成材料的方法

    公开(公告)号:US20060251813A1

    公开(公告)日:2006-11-09

    申请号:US11485658

    申请日:2006-07-12

    IPC分类号: C23C16/00

    CPC分类号: C23C16/45531 C23C16/40

    摘要: The invention includes ALD-type methods in which two or more different precursors are provided within a chamber at different and substantially non-overlapping times relative to one another to form a material, and the material is thereafter exposed to one or more reactants to change a composition of the material. In particular aspects, the precursors utilized to form the material are metal-containing precursors, and the reactant utilized to change the composition of the material comprises oxygen, silicon, and/or nitrogen.

    摘要翻译: 本发明包括ALD型方法,其中两个或多个不同的前体在腔室内以相对于彼此的不同和基本上不重叠的时间提供以形成材料,然后将材料暴露于一种或多种反应物以改变 材料的组成。 在特定方面,用于形成材料的前体是含金属的前体,用于改变材料组成的反应物包括氧,硅和/或氮。