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公开(公告)号：US11977213B2
公开(公告)日：2024-05-07
申请号：US17339587
申请日：2021-06-04
Applicant: ILLUMINA, INC.
Inventor： Ashkan Arianpour , John Bailey , Dustin Blair , Xiangling (Steve) Chen , Stanley S. Hong , Simon Prince , Merek C. Siu , Chunhong (Allen) Zhou , Danilo Condello
CPC classification number: G02B21/002 , G02B7/09 , G02B7/102 , G02B21/006 , G02B21/245 , G02B27/16
Abstract: An imaging system may include a sample stage comprising a surface to support a sample container, the sample container including a sample having a plurality of sample locations; an optical stage to image the sample at the plurality of sample locations; one or more actuators physically coupled to at least one of the sample stage and the optical stage to move the sample stage relative to the optical stage to focus the optical stage onto a current sample location of the plurality of sample locations; a first light source to illuminate the current sample location; a second light source to project a pair of spots on a next sample location of the plurality of sample locations; and a controller to determine, based on an image of the pair of spots projected on the next sample location, a focus setting for the next sample location.
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公开(公告)号：US20240033738A1
公开(公告)日：2024-02-01
申请号：US18357006
申请日：2023-07-21
Applicant: ILLUMINA, INC.
Inventor： Michael Burek , Gregory Holst , Danilo Condello , Dustin Blair
IPC: B01L3/00
CPC classification number: B01L3/502761 , B01L2200/0652 , B01L2300/0654 , B01L2200/16 , B01L2200/12 , B01L2300/0893
Abstract: The presently described techniques relate generally to providing motion feedback (e.g., motion system calibration and/or sample alignment) in the context of an imaging system (such as a time delay and integration (TDI) based imaging system). The architecture and techniques discussed may achieve nanoscale control and calibration of a movement feedback system without a high-resolution encoder subsystem or, in the alternative embodiments, with a lower resolution (and correspondingly less expensive) encoder subsystem than might otherwise be employed. By way of example, certain embodiments described herein relate to ascertaining or calibrating linear motion of a sample holder surface using nanoscale features (e.g., sample sites or nanowells or lithographically patterned features) provided on a surface of the sample holder.
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公开(公告)号：US11815458B2
公开(公告)日：2023-11-14
申请号：US17247777
申请日：2020-12-22
Applicant: Illumina, Inc.
Inventor： Simon Prince , Danilo Condello , Vincent Hsieh , Krysada Phounsiri , John O'Shaughnessy
CPC classification number: G01N21/6458 , G01N2021/058 , G01N2021/6463 , G01N2021/6482
Abstract: A method comprises: directing, using an objective and a first reflective surface, first autofocus light toward a sensor, the first autofocus light reflected from a first surface of a substrate; preventing second autofocus light from reaching the sensor, the second autofocus light reflected from a second surface of the substrate; and directing, using the objective and a second reflective surface, emission light toward the sensor, the emission light originating from a sample at the substrate.
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公开(公告)号：US20210199587A1
公开(公告)日：2021-07-01
申请号：US17247777
申请日：2020-12-22
Applicant: Illumina, Inc.
Inventor： Simon Prince , Danilo Condello , Vincent Hsieh , Krysada Phounsiri , John O'Shaughnessy
IPC: G01N21/64
Abstract: A method comprises: directing, using an objective and a first reflective surface, first autofocus light toward a sensor, the first autofocus light reflected from a first surface of a substrate; preventing second autofocus light from reaching the sensor, the second autofocus light reflected from a second surface of the substrate; and directing, using the objective and a second reflective surface, emission light toward the sensor, the emission light originating from a sample at the substrate.
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公开(公告)号：US20200259988A1
公开(公告)日：2020-08-13
申请号：US16859948
申请日：2020-04-27
Applicant: Illumina, Inc.
Inventor： Danilo Condello , Simon Prince , David Hargis , Jeffrey Bendick , Christophe Sigel
Abstract: Systems and methods disclosed herein include an imaging system that may include a laser diode source; an objective lens positioned to direct a focus tracking beam from the light source onto a location in a sample container and to receive the focus tracking beam reflected from the sample; and an image sensor that may include a plurality of pixel locations to receive focus tracking beam that is reflected off of the location in the sample container, where the reflected focus tracking beam may create a spot on the image sensor. Some examples may further include a laser diode light source that may be operated at a power level that is above a power level for operation at an Amplified Spontaneous Emission (“ASE”) mode, but below a power level for single mode operation.
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Patent Agency Ranking
公开(公告)号：US20200218050A1
公开(公告)日：2020-07-09
申请号：US16626113
申请日：2019-01-14
Applicant: ILLUMINA, INC.
Inventor： Peter Clarke Newman , Danilo Condello , Shaoping Lu , Simon Prince , Merek C. Siu , Stanley S. Hong , Aaron Liu
Abstract: The disclosure provides for structured illumination microscopy (SIM) imaging systems. In one set of implementations, a SIM imaging system may be implemented as a multi-arm SIM imaging system, whereby each arm of the system includes a light emitter and a beam splitter (e.g., a transmissive diffraction grating) having a specific, fixed orientation with respect to the system's optical axis. In a second set of implementations, a SIM imaging system may be implemented as a multiple beam splitter slide SIM imaging system, where one linear motion stage is mounted with multiple beam splitters having a corresponding, fixed orientation with respect to the system's optical axis. In a third set of implementations, a SIM imaging system may be implemented as a pattern angle spatial selection SIM imaging system, whereby a fixed two-dimensional diffraction grating is used in combination with a spatial filter wheel to project one-dimensional fringe patterns on a sample.
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公开(公告)号：US12287490B2
公开(公告)日：2025-04-29
申请号：US17981206
申请日：2022-11-04
Applicant: ILLUMINA, INC.
Inventor： Danilo Condello , Dakota Watson , Andrew Carson , Vincent Hsieh , Steven Boege , Changqin Ding , Stanley Hong
Abstract: Apparatus and methods for controlling heating of an objective in a linescanning sequencing system to improve resolution are disclosed. In accordance with a first implementation, an apparatus includes or comprises a beam source for providing input radiation and a beam shaping group including or comprising one or more optical elements positioned to receive the input radiation from the beam source, and to perform beam shaping on the input radiation to form a shaped beam. The apparatus further including or comprising an objective positioned to receive the shaped beam and to transform the shaped beam into a probe beam and configured to provide the probe beam to a focal plane of the objective for optically probing a sample. The beam shaping group is configured to adjust one or more properties of the shaped beam over time to generally uniformly heat the objective over a region of incidence for the shaped beam.
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公开(公告)号：US12276806B2
公开(公告)日：2025-04-15
申请号：US17704485
申请日：2022-03-25
Applicant: ILLUMINA, INC.
Inventor： Steven Boege , Simon Prince , Danilo Condello
Abstract: Apparatus and methods for transmitting light are disclosed. In an implementation, an apparatus includes a collimator at an input end positioned to receive an input beam from a fiber beam source and to produce a collimated beam. The apparatus further includes a beam shaping group having one or more optical elements and positioned to receive the collimated beam from the collimator and format the collimated beam into a shaped propagation beam having a substantially rectangular cross-section in a far field. The apparatus further includes an objective stage for optically probing a sample, such as a flow cell, using substantially rectangular cross-section sampling beam, where fluorescence from the sample is captured by a line sensor for detecting properties of the sample, such as chemical reactions therein.
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公开(公告)号：US20230228984A1
公开(公告)日：2023-07-20
申请号：US18097947
申请日：2023-01-17
Applicant: ILLUMINA, INC.
Inventor： Dakota Watson , Merek Siu , Dustin Blair , Danilo Condello , John Earney , Paul Sangiorgio
CPC classification number: G02B21/245 , G02B21/26 , G02B21/0036 , G02B21/0032 , H04N23/56 , G02B21/0076 , G02B21/362
Abstract: Some implementations of the disclosure relate to an imaging system, including: a sample holder to support a sample container having multiple sample locations; an optical stage having; an assembly comprising one or more actuators physically coupled to the sample holder to tilt the sample holder relative to the optical stage during imaging of the multiple sample locations to focus the optical stage onto a current sample location; a first light source to project a first pair of spots on the sample container; and a controller to control, based on a sample tilt determined from a first separation measurement of the first pair of spots from one or more images taken by an image sensor at one or more of the sample locations, the one or more actuators to tilt the sample holder along a first direction of the imaging or a second direction substantially perpendicular to the first direction.
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20.发明公开公开(公告)号：US20230143682A1
公开(公告)日：2023-05-11
申请号：US17981206
申请日：2022-11-04
Applicant: ILLUMINA, INC.
Inventor： Danilo Condello , Dakota Watson , Andrew Carson , Vincent Hsieh , Steven Boege , Changqin Ding , Stanley Hong
CPC classification number: G02B27/0927 , G02B26/101 , G02B27/0916 , G02B27/0955 , G02B27/0994 , G01N21/6428 , G01N21/6456 , G01N2021/6439
Abstract: Apparatus and methods for controlling heating of an objective in a linescanning sequencing system to improve resolution are disclosed. In accordance with a first implementation, an apparatus includes or comprises a beam source for providing input radiation and a beam shaping group including or comprising one or more optical elements positioned to receive the input radiation from the beam source, and to perform beam shaping on the input radiation to form a shaped beam. The apparatus further including or comprising an objective positioned to receive the shaped beam and to transform the shaped beam into a probe beam and configured to provide the probe beam to a focal plane of the objective for optically probing a sample. The beam shaping group is configured to adjust one or more properties of the shaped beam over time to generally uniformly heat the objective over a region of incidence for the shaped beam.
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