Semiconductor device
    18.
    发明授权
    Semiconductor device 有权
    半导体器件

    公开(公告)号:US09478621B2

    公开(公告)日:2016-10-25

    申请号:US14238915

    申请日:2012-09-04

    摘要: The element electrodes of a semiconductor element are disposed in a cell region, while an outermost peripheral electrode electrically connected to a semiconductor substrate is disposed in a peripheral region. In the peripheral region, a second-conductivity-type layer is disposed above a super-junction structure. A potential division region is disposed above the second-conductivity-type layer to electrically connect the element electrodes and the outermost peripheral electrode and also divide the voltage between the element electrodes and the outermost peripheral electrode into a plurality of stages. A part of the potential division region overlaps the peripheral region when viewed from the thickness direction of the semiconductor substrate.

    摘要翻译: 半导体元件的元件电极设置在单元区域中,而与半导体基板电连接的最外周电极设置在周边区域中。 在外围区域中,在超结结构上方设置第二导电型层。 电位分割区域设置在第二导电型层之上,以电连接元件电极和最外周电极,并且还将元件电极和最外周电极之间的电压分成多个级。 当从半导体衬底的厚度方向观察时,电势分割区域的一部分与周边区域重叠。

    Electron microscope
    19.
    发明授权
    Electron microscope 有权
    电子显微镜

    公开(公告)号:US08841615B2

    公开(公告)日:2014-09-23

    申请号:US13637227

    申请日:2011-02-22

    IPC分类号: H01J37/26 H01J37/073

    摘要: An electron microscope which utilizes a polarized electron beam and can obtain a high contrast image of a sample is provided. The microscope includes: a laser; a polarization apparatus that polarizes a laser beam into a circularly polarized laser beam; a semiconductor photocathode that is provided with a strained superlattice semiconductor layer and generates a polarized electron beam when irradiated with the circularly polarized laser beam; a transmission electron microscope that utilizes the polarized electron beam; an electron beam intensity distribution recording apparatus arranged at a face reached by the polarized electron beam that has transmitted through the sample. An electron beam intensity distribution recording apparatus records an intensity distribution before and after the polarization of the electron beam is reversed, and a difference acquisition apparatus calculates a difference therebetween.

    摘要翻译: 提供了利用偏振电子束并且可以获得样品的高对比度图像的电子显微镜。 显微镜包括:激光; 将激光束偏振成圆偏振激光束的偏振装置; 半导体光电阴极,其设置有应变超晶格半导体层,并且当被圆偏振激光束照射时产生偏振电子束; 利用偏振电子束的透射电子显微镜; 电子束强度分布记录装置,布置在透过样品的偏振电子束所达到的面上。 电子束强度分布记录装置记录电子束的偏振前后的强度分布,差分获取装置计算其间的差。

    Injector/ejector system for a plug-in module and apparatus using the
systems
    20.
    发明授权
    Injector/ejector system for a plug-in module and apparatus using the systems 失效
    用于插入式模块的注射器/喷射器系统和使用该系统的装置

    公开(公告)号:US5283713A

    公开(公告)日:1994-02-01

    申请号:US944878

    申请日:1992-09-14

    摘要: The grip of a plug-in module according to the present invention is rotatably supported on the upper side of a circuit board. A first end portion of the grip includes a convex portion which engages with a recessed portion in the housing to prevent the plug-in module from being dislodged from the housing by vibrations or the like. When the first and second engaging end are disengaged and the grip is rotated, a protruding end on one side of the grip abuts and applies pressure to the upper end of the housing to assist in removing the plug-in module from the housing. In addition, the above-described protruding end and an additional protruding end on the other side of the grip may be grasped by a robot to allow insertion or removal of the plug-in module by a robot.

    摘要翻译: 根据本发明的插入式模块的把手可旋转地支撑在电路板的上侧。 手柄的第一端部包括与壳体中的凹部接合的凸部,以防止插入式模块通过振动等从壳体移出。 当第一和第二接合端脱离并且把手被旋转时,把手的一侧上的突出端邻接并向壳体的上端施加压力,以帮助将插件模块从壳体移除。 此外,上述突出端和在手柄的另一侧上的另外的突出端可以由机器人掌握,以允许机器人插入或移除插件模块。