Solid state imaging device using disilane
    13.
    发明授权
    Solid state imaging device using disilane 失效
    使用乙硅烷的固态成像装置

    公开(公告)号:US5574293A

    公开(公告)日:1996-11-12

    申请号:US343492

    申请日:1994-11-22

    摘要: A substrate (1) has a surface covered with an insulation layer (2), on which an active layer (3') made of non-single crystal silicon through thin film technique is provided. A gate electrode layer (5') is partially provided on said active layer through a gate insulation layer (4'). Said active layer (3') is subject to injection of P-type or N-type impurities to provide an image sensor of MOS structure. Bias potential is applied to a gate electrode so that a circuit between a source and a drain is in an On state, so that input light through said substrate or said gate electrode is applied to said active layer, and electrical output depending upon said input light is obtained from said source electrode or said drain electrode. Other MOS transistors for switching element and/or shift registers for operating said image sensor are provided on said substrate (1). Said active layer (3') is obtained by crystallizing said amorphous silicon layer through a laser anneal process or a high temperature anneal process, and hydrogenation process, and the trap density of said active layer is less than 5.times.10.sup.11 /cm.sup.2. Optical response time is short, less than 500 .mu.sec, so, high speed operation ten times as high as that of a prior image sensor is possible.

    摘要翻译: PCT No.PCT / JP94 / 00452 Sec。 371日期:1994年11月22日 102(e)日期1994年11月22日PCT 1994年3月22日PCT公布。 WO94 / 22173 PCT出版物 日期:1994年9月29日一种衬底(1)具有被绝缘层(2)覆盖的表面,其上提供由非单晶硅通过薄膜技术制成的有源层(3')。 栅极电极层(5')通过栅极绝缘层(4')部分地设置在所述有源层上。 所述有源层(3')经受注入P型或N型杂质以提供MOS结构的图像传感器。 将偏置电位施加到栅电极,使得源极和漏极之间的电路处于导通状态,使得通过所述衬底或所述栅电极的输入光被施加到所述有源层,并且根据所述输入光输出电输出 从所述源电极或所述漏电极获得。 用于操作所述图像传感器的用于开关元件和/或移位寄存器的其它MOS晶体管设置在所述基板(1)上。 所述有源层(3')是通过激光退火工艺或高温退火工艺和氢化工艺使所述非晶硅层结晶而获得的,并且所述有源层的陷阱密度小于5×10 11 / cm 2。 光学响应时间短,小于500μs,因此可以实现高于现有图像传感器的10倍的高速度运行。

    Non-single crystal semiconductor device with sub-micron grain size
    14.
    发明授权
    Non-single crystal semiconductor device with sub-micron grain size 失效
    具有亚微米粒度的非单晶半导体器件

    公开(公告)号:US5442198A

    公开(公告)日:1995-08-15

    申请号:US189498

    申请日:1994-01-31

    摘要: A MOS-FET transistor is produced on a substrate made of glass which has a non single crystal semiconductor film (2'). The average diameter of a crystal grain in said film is in the range between 0.5 times and 4 times of thickness of said film, and said average diameter is 250 .ANG.-8000 .ANG., and said film thickness is 500 .ANG.-2000 .ANG.. The density of oxygen in the semiconductor film (2') is less than 2.times.10.sup.19 /cm.sup.3. A photo sensor having PIN structure is also produced on the substrate, to provide an image sensor for a facsimile transmitter together with the transistors. Said film (2') is produced by placing amorphous silicon film on the glass substrate through CVD process using disilane gas, and effecting solid phase growth to said amorphous silicon film by heating the substrate together with said film in nitrogen gas atmosphere. The film (2') thus produced is subject to implantation of dopant for providing a transistor. The film thus produced has high mobility which provides high speed operation of a transistor, and low threshold voltage of a transistor.

    摘要翻译: 在具有非单晶半导体膜(2')的由玻璃制成的基板上制造MOS-FET晶体管。 所述膜中的晶粒的平均直径在所述膜的厚度的0.5倍至4倍的范围内,所述平均直径为250安培-8000安培,所述膜厚度为500安培-2000安。 半导体膜(2')中的氧的密度小于2×10 19 / cm 3。 具有PIN结构的光电传感器也在基板上产生,以便与晶体管一起为传真发送器提供图像传感器。 通过使用乙硅烷气体的CVD法将玻璃基板上的非晶硅膜放置在所述膜(2')上,通过在氮气气氛中与所述膜一起加热基板,对所述非晶硅膜进行固相生长。 由此产生的薄膜(2')可以注入用于提供晶体管的掺杂剂。 由此产生的膜具有提供晶体管的高速操作和晶体管的低阈值电压的高迁移率。

    Light-Emitting Device and Manufacturing Method Thereof, Lighting Device, and Display Device
    19.
    发明申请
    Light-Emitting Device and Manufacturing Method Thereof, Lighting Device, and Display Device 有权
    发光装置及其制造方法,照明装置及显示装置

    公开(公告)号:US20120205700A1

    公开(公告)日:2012-08-16

    申请号:US13367833

    申请日:2012-02-07

    IPC分类号: H01L51/52 H01L51/56

    摘要: The present invention focuses on a structure in which an auxiliary wiring for increasing the conductivity of an upper electrode is provided on the substrate side. The conductive auxiliary wiring of a light-emitting device is provided over a substrate, and an upper portion of the auxiliary wiring protrudes in a direction parallel to the substrate. Further, an EL layer formed in a region including a lower electrode layer and the auxiliary wiring is physically divided by the auxiliary wiring. An upper electrode layer formed in a manner similar to that of the lower electrode layer may be electrically connected to at least part of a side surface of the auxiliary wiring. Such an auxiliary wiring may be used in a lighting device and a display device.

    摘要翻译: 本发明的重点是在基板侧设置用于提高上部电极的导电性的辅助布线的结构。 发光装置的导电性辅助布线设置在基板上,辅助配线的上部沿与基板平行的方向突出。 此外,在包括下电极层和辅助布线的区域中形成的EL层在物理上被辅助布线分开。 以类似于下电极层的方式形成的上电极层可以电连接到辅助布线的侧表面的至少一部分。 这种辅助布线可以用在照明装置和显示装置中。