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公开(公告)号：US20180174802A1
公开(公告)日：2018-06-21
申请号：US15804304
申请日：2017-11-06
Applicant: Samsung Electronics Co., Ltd.
Inventor： Seungkyu LIM , DOUGYONG SUNG , Myoung Soo PARK , Jaehoon KIM , Eunyoung LEE , Seiwon CHUNG , YOSHIHISA HIRANO
CPC classification number: H01J37/32119 , H01J37/3211 , H01J37/32183 , H01J37/32642 , H01J2237/334 , H01L21/67069 , H01L21/6831
Abstract: A dielectric window, a plasma system including the same, a method of fabricating the same, and a method of manufacturing a semiconductor device are provided. The method of manufacturing the semiconductor device may include steps of providing a substrate in a plasma chamber, performing a plasma treatment on a surface of the substrate, and removing the substrate from the plasma chamber, wherein the plasma chamber comprises the dielectric window. The dielectric window may include a dielectric material disk with at least one void, a filler filled in the void to allow the dielectric material disk to have a flat surface, and a passivation layer provided on the filler and the dielectric material disk.
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公开(公告)号：US20250132500A1
公开(公告)日：2025-04-24
申请号：US18925642
申请日：2024-10-24
Inventor： Jungi JEONG , Jungsuek OH , Jaehoon KIM , Seungwoo BANG
Abstract: The present disclosure relates to a 5G communication system or a 6G communication system for supporting higher data rates beyond a 4G communication system such as long term evolution (LTE). A spatial filter is provided. The spatial filter includes a first substrate having a first parasitic element configured to provide a filtering function and disposed on the spatial filter device, a second substrate having a second parasitic element configured to provide a filtering function and disposed under the spatial filter device, and a dipole antenna configured to transmit and receive radio waves in free space, coupled to each of the first parasitic element and the second parasitic element so as not to be aligned therewith, and disposed between the first substrate and the second substrate.
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公开(公告)号：US20240318374A1
公开(公告)日：2024-09-26
申请号：US18734192
申请日：2024-06-05
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Songjae LEE , Jungyoon HAHM , Jaehoon KIM , Minhee KANG , Daehwan KIM , Donggeun PARK , Incheol JANG
Abstract: A washing machine having a drying function may include: a cabinet; a tub inside the cabinet and having an air outlet; a drying device configured to supply heated air into the tub to be discharged through the air outlet; a duct connecting the air outlet to the drying device to guide the heated air from the tub to the drying device; and a water feed pipe configured to supply water into an upper portion of the duct to cool the heated air so that moisture in the heated air condenses, wherein the duct includes a middle protrusion on a middle of an inner surface of a side of the duct to scatter water supplied into the duct and flowing along the inner surface; and a lower protrusion on the inner surface below the middle protrusion to scatter water flowing along the inner surface downward past the middle protrusion.
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公开(公告)号：US20230186963A1
公开(公告)日：2023-06-15
申请号：US17970788
申请日：2022-10-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Younghyun KIM , Sechung OH , Heeju SHIN , Jaehoon KIM , Sanghwan PARK , Junghwan PARK
CPC classification number: G11C11/1673 , G11C11/1653 , H01L27/228 , H01L43/02 , H01L43/08 , H01L43/10
Abstract: A magnetoresistive random access memory device includes a pinned layer; a tunnel barrier layer on the pinned layer; a free layer structure on the tunnel barrier layer, the free layer structure including a plurality of magnetic layers and a plurality of metal insertion layers between the magnetic layers; and an upper oxide layer on the free layer structure, wherein each of the metal insertion layers includes a non-magnetic metal material doped with a magnetic material, and the metal insertion layers are spaced apart from each other.
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15.发明申请公开(公告)号：US20230069493A1
公开(公告)日：2023-03-02
申请号：US17856130
申请日：2022-07-01
Applicant: Samsung Electronics Co., Ltd.
Inventor： Do-Nyun KIM , Min-Cheol KANG , Kihyun KIM , Jaehoon KIM , Jaekyung LIM
Abstract: Disclosed is an operating method of an electronic device for manufacture of a semiconductor device. The method includes receiving, at the electronic device, a computer-aided design (CAD) image for a lithography process of the semiconductor device, and generating, at the electronic device, a first scanning electron microscope (SEM) image and a first segment (SEG) image from the CAD image by using a machine learning-based module, and the first SEG image includes information about a location of a defect.
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Patent Agency Ranking
公开(公告)号：US20220359530A1
公开(公告)日：2022-11-10
申请号：US17874512
申请日：2022-07-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Hyunji SONG , Jaehoon KIM , Kwangho PARK , Yonghoon SON , Gyeonghee LEE , Seungjae JUNG
IPC: H01L27/108
Abstract: An integrated circuit device includes a plurality of semiconductor layers stacked on a substrate to overlap each other in a vertical direction and longitudinally extending along a first horizontal direction. The plurality of semiconductor layers may have different thicknesses in the vertical direction.
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公开(公告)号：US20220108436A1
公开(公告)日：2022-04-07
申请号：US17465179
申请日：2021-09-02
Applicant: Samsung Electronics Co., Ltd.
Inventor： Min-Cheol KANG , Do-Nyun KIM , Jaehoon KIM , Woojoo SIM
IPC: G06T7/00
Abstract: Disclosed is a wafer defect inference system, which includes a test equipment that receives a first image obtained by imaging circuit patterns formed on a semiconductor wafer by using a scanning electron microscope and a second image obtained by imaging a layout image of a mask for implementing the circuit pattern on the semiconductor wafer and combines the first image and the second image to generate a combination image, and at least one computing device that is capable of communicating with the test equipment and infers a defect associated with the circuit pattern formed on the semiconductor wafer. The computing device receives the combination image, performs machine learning for inferring the defect based on the combination image, and generates an output image including information about the defect based on the machine learning.
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公开(公告)号：US20210143156A1
公开(公告)日：2021-05-13
申请号：US16916366
申请日：2020-06-30
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Hyunji SONG , Jaehoon KIM , Kwangho PARK , Yonghoon SON , Gyeonghee LEE , Seungjae JUNG
IPC: H01L27/108
Abstract: An integrated circuit device includes a plurality of semiconductor layers stacked on a substrate to overlap each other in a vertical direction and longitudinally extending along a first horizontal direction. The plurality of semiconductor layers may have different thicknesses in the vertical direction.
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公开(公告)号：US20240411494A1
公开(公告)日：2024-12-12
申请号：US18808679
申请日：2024-08-19
Applicant: Samsung Electronics Co., Ltd.
Inventor： Sungjae BAE , Jaehoon KIM , Jamin GOO , Hyelin KIM , Hanseung JUNG , Jinhwan HONG
IPC: G06F3/14 , G06F3/0485
Abstract: An electronic device is provided. The electronic device includes a touch display, memory storing one or more computer programs, and one or more processors communicatively coupled to the touch display and the memory, wherein the one or more computer programs include computer-executable instructions that, when executed by the one or more processors individually or collectively, cause the electronic device to display, in a first area in the touch display, a first image corresponding to the first thumbnail image corresponding to a first object among a plurality of objects, in response to a first user input to the first thumbnail image, display, in a second area in the touch display, a plurality of thumbnail images corresponding to the first object, in response to a second user input to the first thumbnail image, and display a second image corresponding to the second object among the plurality of objects at a position where the first image of the first area is displayed and continuously display the plurality of thumbnail images corresponding to the first object in the second area, in response to a third user input to the second thumbnail image.
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公开(公告)号：US20240143463A1
公开(公告)日：2024-05-02
申请号：US18339303
申请日：2023-06-22
Inventor： Uiseok SONG , Seoung Bum KIM , Jaehoon KIM , Byungwoo BANG , Junyeon LEE , Jiyoon LEE , Yoon Sang CHO , Hansam CHO , Minkyu KIM , Hun Seong CHOI
IPC: G06F11/22
CPC classification number: G06F11/2263
Abstract: An apparatus includes a processor configured to execute instructions, and a memory storing the instructions, which when executed by the processor configure the processor to generate system error prediction data using an error prediction neural network provided with one of a plurality of log data sequences generated by pre-processing a plurality of log data pieces of component log data of a system. The system error prediction data comprises information of a plurality of system errors occurring at a plurality of respective timepoints.
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