-
公开(公告)号:US11355191B2
公开(公告)日:2022-06-07
申请号:US17072887
申请日:2020-10-16
Applicant: STMicroelectronics S.r.l.
Inventor: Fabio Enrico Carlo Disegni , Maurizio Francesco Perroni , Cesare Torti
Abstract: An embodiment method for programming a differential type phase-change memory device comprises, in a first time interval, programming a direct memory cell or the respective complementary one pertaining to a first programming driver by means of a current between SET and RESET; and, in the same first time interval, simultaneously programming a direct memory cell or the respective complementary one pertaining to a second programming driver by means of the same current between SET and RESET. The method further comprises, in a second time interval, programming the other direct memory cell or the respective complementary one pertaining to the first programming driver by means of the other current between SET and RESET; and, in the same second time interval, simultaneously programming the other direct memory cell or the respective complementary one pertaining to the second programming driver by means of the same other current between SET and RESET.
-
公开(公告)号:US11107525B2
公开(公告)日:2021-08-31
申请号:US16924760
申请日:2020-07-09
Applicant: STMicroelectronics S.r.l.
Inventor: Michele La Placa , Fabio Enrico Carlo Disegni , Federico Goller
Abstract: A voltage regulator and a phase change memory are disclosed. In an embodiment a phase-change memory includes an array of a plurality of phase-change memory cells, an address decoder configured for receiving an address signal and selecting a sub-area in the array of the plurality of memory cells, the selected sub-area having a given number of bits of a data signal and a writing circuit including a control circuit configured for receiving the data signal and determining, for each memory cell in the selected sub-area, whether a respective bit of the data signal indicates that the memory cell is to be changed from the amorphous state to the polycrystalline state and one or more driving circuits supplied via a regulated voltage and configured for applying the set current for the first interval to the memory cells that are to be changed from the amorphous state to the polycrystalline state.
-
公开(公告)号:US20190317902A1
公开(公告)日:2019-10-17
申请号:US16455155
申请日:2019-06-27
Applicant: STMicroelectronics S.r.l.
Inventor: Fabio Enrico Carlo Disegni , Federico Goller , Michele Febbrarino
Abstract: A circuit, for managing operations for accessing a flash memory on the basis of requests received from a main CPU and from an auxiliary CPU, may be configured to: associate with the main CPU, a higher access priority to the flash memory than the access priority of the auxiliary CPU; command, in the absence of further requests for accessing the flash memory, the access to the flash memory for the main or auxiliary CPU which has initiated a first access request; verify, following a receipt of a second access request, the access priority associated with this second access request; suspend one of the first or the second access request having lower priority; and authorize the other of the first or the second access request having higher priority.
-
14.
公开(公告)号:US20190214079A1
公开(公告)日:2019-07-11
申请号:US16227438
申请日:2018-12-20
Applicant: STMicroelectronics S.r.l.
Inventor: Fabio Enrico Carlo Disegni , Cesare Torti , Davide Manfré
Abstract: A memory device including a first memory sector and a second memory sector, each of which includes a respective plurality of local bit lines, which may be selectively coupled to a plurality of main bit lines. The memory device further includes a first amplifier and a second amplifier, and a routing circuit, arranged between the main bit lines and the first and second amplifiers. The routing circuit includes: a first lower switch, arranged between a first lower main bit line and a first input of the first amplifier; a second lower switch, arranged between the first lower main bit line and a first input of the second amplifier; a first upper switch, arranged between a first upper main bit line and the first input of the first amplifier; and a second upper switch, arranged between the first upper main bit line and the first input of the second amplifier. The second inputs of the first and second amplifiers are coupled to a second lower main bit line and to a second upper main bit line, respectively.
-
公开(公告)号:US20190043574A1
公开(公告)日:2019-02-07
申请号:US16155659
申请日:2018-10-09
Applicant: STMicroelectronics S.r.l.
Inventor: Cesare Torti , Fabio Enrico Carlo Disegni , Davide Manfré , Massimo Fidone
Abstract: A memory device includes an array of phase-change memory cells and a word line. The memory device includes a control circuit, a first pull-up MOSFET and a second pull-up MOSFET connected in series between a first power-supply node set at a first supply voltage and the word line, a first pull-down MOSFET and a second pull-down MOSFET connected in series between the word line and a second power-supply node set at a reference potential, and a biasing MOSFET connected between the word line and a third power-supply node set at a second supply voltage higher than the first supply voltage. The first and second pull-up MOSFETs and the first and second pull-down MOSFETs have breakdown voltages lower than the breakdown voltage of the biasing MOSFET.
-
公开(公告)号:US20180285284A1
公开(公告)日:2018-10-04
申请号:US15797940
申请日:2017-10-30
Applicant: STMicroelectronics S.r.l.
Inventor: Fabio Enrico Carlo Disegni , Federico Goller , Michele Febbrarino
CPC classification number: G06F12/1425 , G06F12/0246 , G06F13/1663 , G06F2212/1052 , G06F2212/7207
Abstract: A circuit, for managing operations for accessing a flash memory on the basis of requests received from a main CPU and from an auxiliary CPU, may be configured to: associate with the main CPU, a higher access priority to the flash memory than the access priority of the auxiliary CPU; command, in the absence of further requests for accessing the flash memory, the access to the flash memory for the main or auxiliary CPU which has initiated a first access request; verify, following a receipt of a second access request, the access priority associated with this second access request; suspend one of the first or the second access request having lower priority; and authorize the other of the first or the second access request having higher priority.
-
公开(公告)号:US09990245B2
公开(公告)日:2018-06-05
申请号:US14951639
申请日:2015-11-25
Inventor: Om Ranjan , Fabio Enrico Carlo Disegni
IPC: G06F11/00 , G06F11/07 , G06F11/08 , G06F11/16 , G11C29/42 , G11C29/02 , G11B20/18 , G06F11/10 , G11C29/04
CPC classification number: G06F11/079 , G06F11/073 , G06F11/0751 , G06F11/076 , G06F11/0772 , G06F11/08 , G06F11/1004 , G06F11/16 , G11B2020/1843 , G11C29/02 , G11C29/04 , G11C29/42
Abstract: An electronic device includes a memory having memory locations being subject to transient faults and permanent faults, and a fault detection circuit coupled to the memory. The fault detection circuit is configured to read the memory locations at a first time, and determine a first fault count and fault map signature including the transient and permanent faults at the first time based upon reading the plurality of memory locations, and to store the first fault count and fault map signature. The fault detection circuit is configured to read the memory locations at a second time and determine a second fault count and fault map signature including the transient and permanent faults at the second time based upon reading the memory locations, and compare the stored first fault count and fault map signature with the second fault count and fault map signature to determine a permanent fault count.
-
公开(公告)号:US20180061499A1
公开(公告)日:2018-03-01
申请号:US15804790
申请日:2017-11-06
Applicant: STMicroelectronics S.r.l.
IPC: G11C16/28 , G11C5/14 , G11C16/24 , G11C16/14 , G11C16/10 , G11C16/30 , G05F3/24 , G11C7/14 , G11C7/12 , G11C16/08 , G11C7/04 , G11C8/10
CPC classification number: G11C16/28 , G05F3/245 , G11C5/147 , G11C7/04 , G11C7/12 , G11C7/14 , G11C8/10 , G11C16/08 , G11C16/10 , G11C16/14 , G11C16/24 , G11C16/30
Abstract: A circuit for biasing non-volatile memory cells includes a dummy decoding path between a global bias line and a biasing node, a reference current generator coupled to the dummy decoding path and configured to supply a reference current, a biasing stage configured to set a cell bias voltage on the biasing node, and a compensation stage configured to compensate a current absorption of the biasing stage at the biasing node so that the reference current will flow through the dummy decoding path.
-
公开(公告)号:US09830995B2
公开(公告)日:2017-11-28
申请号:US15140796
申请日:2016-04-28
Applicant: STMicroelectronics S.r.l.
IPC: G11C16/28 , G05F3/24 , G11C5/14 , G11C7/12 , G11C7/14 , G11C16/24 , G11C16/30 , G11C16/08 , G11C16/10 , G11C16/14 , G11C7/04 , G11C8/10
CPC classification number: G11C16/28 , G05F3/245 , G11C5/147 , G11C7/04 , G11C7/12 , G11C7/14 , G11C8/10 , G11C16/08 , G11C16/10 , G11C16/14 , G11C16/24 , G11C16/30
Abstract: A circuit for biasing non-volatile memory cells includes a dummy decoding path between a global bias line and a biasing node, a reference current generator coupled to the dummy decoding path and configured to supply a reference current, a biasing stage configured to set a cell bias voltage on the biasing node, and a compensation stage configured to compensate a current absorption of the biasing stage at the biasing node so that the reference current will flow through the dummy decoding path.
-
20.
公开(公告)号:US20170062064A1
公开(公告)日:2017-03-02
申请号:US15140796
申请日:2016-04-28
Applicant: STMicroelectronics S.r.l
CPC classification number: G11C16/28 , G05F3/245 , G11C5/147 , G11C7/04 , G11C7/12 , G11C7/14 , G11C8/10 , G11C16/08 , G11C16/10 , G11C16/14 , G11C16/24 , G11C16/30
Abstract: A circuit for biasing non-volatile memory cells includes a dummy decoding path between a global bias line and a biasing node, a reference current generator coupled to the dummy decoding path and configured to supply a reference current, a biasing stage configured to set a cell bias voltage on the biasing node, and a compensation stage configured to compensate a current absorption of the biasing stage at the biasing node so that the reference current will flow through the dummy decoding path.
Abstract translation: 用于偏置非易失性存储单元的电路包括全局偏置线和偏置节点之间的虚拟解码路径,耦合到虚拟解码路径并被配置为提供参考电流的参考电流发生器,被配置为设置单元 偏置节点上的偏置电压,以及补偿级,被配置为补偿偏置节点处的偏置级的电流吸收,使得参考电流将流过虚拟解码路径。
-
-
-
-
-
-
-
-
-